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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 16 — Aug. 11, 2014
  • pp: 18914–18923

Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy

T. Del Rosso, J. Edicson Hernández Sánchez, R. Dos Santos Carvalho, O. Pandoli, and M. Cremona  »View Author Affiliations


Optics Express, Vol. 22, Issue 16, pp. 18914-18923 (2014)
http://dx.doi.org/10.1364/OE.22.018914


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Abstract

We demonstrate that Surface Plasmon Resonance spectroscopy can be used for the accurate and simultaneous determination of the thickness and refractive index of transparent thin thermally deposited organic films. The experimental approach is based on a two-metal deposition or a two-thickness method. These methods have been applied to an encapsulated sample containing a thin film of commercial tris(8-hydroxyquinoline) (Alq3). The accuracy of the measurement depends on the control of the film deposition process and suggests the use of SPR spectroscopy as inexpensive and valuable metrology tool for small molecule organic thin films.

© 2014 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(160.4890) Materials : Organic materials
(240.6680) Optics at surfaces : Surface plasmons
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 11, 2014
Revised Manuscript: July 11, 2014
Manuscript Accepted: July 21, 2014
Published: July 29, 2014

Citation
T. Del Rosso, J. Edicson Hernández Sánchez, R. Dos Santos Carvalho, O. Pandoli, and M. Cremona, "Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy," Opt. Express 22, 18914-18923 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-16-18914


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