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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 16 — Aug. 11, 2014
  • pp: 19314–19326

Stability in computed optical interferometric tomography (Part II): in vivo stability assessment

Nathan D. Shemonski, Adeel Ahmad, Steven G. Adie, Yuan-Zhi Liu, Fredrick A. South, P. Scott Carney, and Stephen A. Boppart  »View Author Affiliations


Optics Express, Vol. 22, Issue 16, pp. 19314-19326 (2014)
http://dx.doi.org/10.1364/OE.22.019314


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Abstract

Stability is of utmost importance to a wide range of phase-sensitive processing techniques. In Doppler optical coherence tomography and optical coherence elastography, in addition to defocus and aberration correction techniques such as interferometric synthetic aperture microscopy and computational/digital adaptive optics, a precise understanding of the system and sample stability helps to guide the system design and choice of imaging parameters. This article focuses on methods to accurately and quantitatively measure the stability of an imaging configuration in vivo. These methods are capable of partially decoupling axial from transverse motion and are compared against the stability requirements for computed optical interferometric tomography laid out in the first part of this article.

© 2014 Optical Society of America

OCIS Codes
(100.5090) Image processing : Phase-only filters
(110.4280) Imaging systems : Noise in imaging systems
(110.4500) Imaging systems : Optical coherence tomography
(110.3175) Imaging systems : Interferometric imaging
(110.3010) Imaging systems : Image reconstruction techniques
(110.3200) Imaging systems : Inverse scattering

ToC Category:
Image Processing

History
Original Manuscript: June 2, 2014
Revised Manuscript: July 21, 2014
Manuscript Accepted: July 21, 2014
Published: August 4, 2014

Citation
Nathan D. Shemonski, Adeel Ahmad, Steven G. Adie, Yuan-Zhi Liu, Fredrick A. South, P. Scott Carney, and Stephen A. Boppart, "Stability in computed optical interferometric tomography (Part II): in vivo stability assessment," Opt. Express 22, 19314-19326 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-16-19314


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