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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 2 — Jan. 27, 2014
  • pp: 1963–1970

Maximal light-energy transfer through a dielectric/metal-layered electrode on a photoactive device

Kyoung-Ho Kim and Q-Han Park  »View Author Affiliations


Optics Express, Vol. 22, Issue 2, pp. 1963-1970 (2014)
http://dx.doi.org/10.1364/OE.22.001963


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Abstract

We report the fabrication of an optimized low reflective dielectric/metal-layered electrode that provides significant electrical conductivity and light transparency in the near-infrared wavelength regime. By making the metal film thickness thick enough and choosing a proper dielectric layer with a certain thickness, we show that our suggested electrode significantly reduces the light reflection while preserving high electrical conductivity. We demonstrate our optimized electrodes present a highly conductive surface with a sheet resistance of 5.2 Ω/sq and a high light transmittance of near 85% in the near-infrared regime. We also apply our optimized electrode to thin-film organic photovoltaic devices and show the electrode helps in absorbing light energy inside an active layer. We believe that this simple but powerful layered electrode will pave the way for designing transparent electrodes on photoactive devices.

© 2014 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.4165) Thin films : Multilayer design
(310.6845) Thin films : Thin film devices and applications
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Thin Films

History
Original Manuscript: November 25, 2013
Revised Manuscript: December 22, 2013
Manuscript Accepted: December 23, 2013
Published: January 23, 2014

Citation
Kyoung-Ho Kim and Q-Han Park, "Maximal light-energy transfer through a dielectric/metal-layered electrode on a photoactive device," Opt. Express 22, 1963-1970 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-2-1963


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