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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 3 — Feb. 10, 2014
  • pp: 2745–2760

A robust tool for photon source geometry measurements using the fractional Talbot effect

Goran Lovric, Peter Oberta, Istvan Mohacsi, Marco Stampanoni, and Rajmund Mokso  »View Author Affiliations


Optics Express, Vol. 22, Issue 3, pp. 2745-2760 (2014)
http://dx.doi.org/10.1364/OE.22.002745


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Abstract

A reliable measurement of beam coherence is important for optimal performance of a number of coherence methods being utilized at third-generation synchrotrons and free-electron lasers. Various approaches have been proposed in the past for determining the source size, and hence the degree of coherence; however they often require complex setups with perfect optics and suffer from undefined uncertainties. We present a robust tool for X-ray source characterization with a full quantitative uncertainty analysis for fast on-the-fly coherence measurements. The influence of three multilayer monochromator crystals on the apparent source size is evaluated using the proposed method.

© 2014 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation
(340.7440) X-ray optics : X-ray imaging
(070.7345) Fourier optics and signal processing : Wave propagation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 3, 2013
Revised Manuscript: January 16, 2014
Manuscript Accepted: January 17, 2014
Published: January 30, 2014

Citation
Goran Lovric, Peter Oberta, Istvan Mohacsi, Marco Stampanoni, and Rajmund Mokso, "A robust tool for photon source geometry measurements using the fractional Talbot effect," Opt. Express 22, 2745-2760 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-3-2745


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