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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 3 — Feb. 10, 2014
  • pp: 2745–2760

A robust tool for photon source geometry measurements using the fractional Talbot effect

Goran Lovric, Peter Oberta, Istvan Mohacsi, Marco Stampanoni, and Rajmund Mokso  »View Author Affiliations

Optics Express, Vol. 22, Issue 3, pp. 2745-2760 (2014)

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A reliable measurement of beam coherence is important for optimal performance of a number of coherence methods being utilized at third-generation synchrotrons and free-electron lasers. Various approaches have been proposed in the past for determining the source size, and hence the degree of coherence; however they often require complex setups with perfect optics and suffer from undefined uncertainties. We present a robust tool for X-ray source characterization with a full quantitative uncertainty analysis for fast on-the-fly coherence measurements. The influence of three multilayer monochromator crystals on the apparent source size is evaluated using the proposed method.

© 2014 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation
(340.7440) X-ray optics : X-ray imaging
(070.7345) Fourier optics and signal processing : Wave propagation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 3, 2013
Revised Manuscript: January 16, 2014
Manuscript Accepted: January 17, 2014
Published: January 30, 2014

Goran Lovric, Peter Oberta, Istvan Mohacsi, Marco Stampanoni, and Rajmund Mokso, "A robust tool for photon source geometry measurements using the fractional Talbot effect," Opt. Express 22, 2745-2760 (2014)

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  1. I. A. Vartanyants, A. Singer, “Coherence properties of hard X-ray synchrotron sources and X-ray free-electron lasers,” New J. Phys. 12, 035004 (2010). [CrossRef]
  2. S. Dierker, R. Pindak, R. Fleming, I. Robinson, L. Berman, “X-ray photon correlation spectroscopy study of brownian motion of gold colloids in Glycerol,” Phys. Rev. Lett. 75, 449–452 (1995). [CrossRef] [PubMed]
  3. I. Robinson, J. Libbert, I. Vartanyants, J. Pitney, D. Smilgies, D. Abernathy, G. Grübel, “Coherent X-ray diffraction imaging of silicon oxide growth,” Phys. Rev. A 60, 9965–9972 (1999).
  4. S. Roy, D. Parks, K. A. Seu, R. Su, J. J. Turner, W. Chao, E. H. Anderson, S. Cabrini, S. D. Kevan, “Lensless X-ray imaging in reflection geometry,” Nat. Photonics 5, 243–245 (2011). [CrossRef]
  5. A. Momose, T. Takeda, Y. Itai, K. Hirano, “Phasecontrast X-ray computed tomography for observing biological soft tissues,” Nat. Med. 2, 473–475 (1996). [CrossRef] [PubMed]
  6. K. Nugent, T. Gureyev, D. Cookson, D. Paganin, Z. Barnea, “Quantitative phase imaging using hard X-rays,” Phys. Rev. Lett. 77, 2961–2964 (1996). [CrossRef] [PubMed]
  7. P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. Guigay, M. Schlenker, “Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999). [CrossRef]
  8. C. David, B. Nohammer, H. H. Solak, E. Ziegler, “Differential phase contrast imaging using a shearing interferometer,” Appl. Phys. Lett. 81, 3287 (2002). [CrossRef]
  9. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010). [CrossRef] [PubMed]
  10. B. Abbey, L. W. Whitehead, H. M. Quiney, D. J. Vine, G. A. Cadenazzi, C. A. Henderson, K. A. Nugent, E. Balaur, C. T. Putkunz, A. G. Peele, G. J. Williams, I. McNulty, “Lensless imaging using broadband X-ray sources,” Nat. Photonics 5, 420–424 (2011). [CrossRef]
  11. P. Modregger, F. Scattarella, B. Pinzer, C. David, R. Bellotti, M. Stampanoni, “Imaging the ultrasmall-angle X-ray scattering distribution with grating interferometry,” Phys. Rev. Lett. 108, 2–5 (2012). [CrossRef]
  12. M. Born, E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge University, 1999). [CrossRef]
  13. V. Kohn, I. Snigireva, A. Snigirev, “Direct measurement of transverse coherence length of hard X-rays from interference fringes,” Phys. Rev. Lett. 85, 2745–2748 (2000). [CrossRef] [PubMed]
  14. D. Paterson, B. Allman, P. McMahon, J. Lin, N. Moldovan, K. Nugent, I. McNulty, C. Chantler, C. Retsch, T. Irving, “Spatial coherence measurement of X-ray undulator radiation,” Opt. Commun. 195, 79–84 (2001). [CrossRef]
  15. B. J. Thompson, E. Wolf, “Two-beam interference with partially coherent light,” J. Opt. Soc. Am. 47, 895 (1957). [CrossRef]
  16. C. Chang, P. Naulleau, E. Anderson, D. Attwood, “Spatial coherence characterization of undulator radiation,” Opt. Commun. 182, 25–34 (2000). [CrossRef]
  17. W. Leitenberger, S. Kuznetsov, A. Snigirev, “Interferometric measurements with hard X-rays using a double slit,” Opt. Commun. 191, 91–96 (2001). [CrossRef]
  18. T. Panzner, W. Leitenberger, J. Grenzer, Y. Bodenthin, T. Geue, U. Pietsch, H. Möhwald, “Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II,” J. Phys. D: Appl. Phys. 36, A93–A97 (2003). [CrossRef]
  19. W. Leitenberger, H. Wendrock, L. Bischoff, T. Weitkamp, “Pinhole interferometry with coherent hard X-rays,” J. Synchrotron Radiat. 11, 190–197 (2004). [CrossRef] [PubMed]
  20. M. Yabashi, K. Tamasaku, T. Ishikawa, “Characterization of the transverse coherence of hard synchrotron radiation by intensity interferometry,” Phys. Rev. Lett. 87, 140801 (2001). [CrossRef] [PubMed]
  21. F. Pfeiffer, O. Bunk, C. Schulze-Briese, A. Diaz, T. Weitkamp, C. David, J. F. van der Veen, I. Vartanyants, I. Robinson, “Shearing interferometer for quantifying the coherence of hard X-ray beams,” Phys. Rev. Lett. 94, 1–4 (2005). [CrossRef]
  22. K. S. Morgan, S. C. Irvine, Y. Suzuki, K. Uesugi, A. Takeuchi, D. M. Paganin, K. K. Siu, “Measurement of hard X-ray coherence in the presence of a rotating random-phase-screen diffuser,” Opt. Commun. 283, 216–225 (2010). [CrossRef]
  23. J. Lin, D. Paterson, A. Peele, P. McMahon, C. Chantler, K. Nugent, B. Lai, N. Moldovan, Z. Cai, D. Mancini, I. McNulty, “Measurement of the spatial coherence function of undulator radiation using a phase mask,” Phys. Rev. Lett. 90, 1–4 (2003). [CrossRef]
  24. I. Vartanyants, A. Singer, A. Mancuso, O. Yefanov, A. Sakdinawat, Y. Liu, E. Bang, G. Williams, G. Cadenazzi, B. Abbey, H. Sinn, D. Attwood, K. Nugent, E. Weckert, T. Wang, D. Zhu, B. Wu, C. Graves, A. Scherz, J. Turner, W. Schlotter, M. Messerschmidt, J. Lüning, Y. Acremann, P. Heimann, D. Mancini, V. Joshi, J. Krzywinski, R. Soufli, M. Fernandez-Perea, S. Hau-Riege, A. Peele, Y. Feng, O. Krupin, S. Moeller, W. Wurth, “Coherence properties of individual femtosecond pulses of an X-ray free-electron laser,” Phys. Rev. Lett. 107, 1–5 (2011). [CrossRef]
  25. P. Cloetens, J. P. Guigay, C. De Martino, J. Baruchel, M. Schlenker, “Fractional Talbot imaging of phase gratings with hard X-rays,” Opt. Lett. 22, 1059–1061 (1997). [CrossRef] [PubMed]
  26. J.-P. Guigay, S. Zabler, P. Cloetens, C. David, R. Mokso, M. Schlenker, “The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays,” J. Synchrotron Radiat. 11, 476–482 (2004). [CrossRef] [PubMed]
  27. T. Weitkamp, B. Nohammer, A. Diaz, C. David, E. Ziegler, “X-ray wavefront analysis and optics characterization with a grating interferometer,” Appl. Phys. Lett. 86, 054101 (2005). [CrossRef]
  28. A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010). [CrossRef] [PubMed]
  29. A. Rack, T. Weitkamp, M. Riotte, D. Grigoriev, T. Rack, L. Helfen, T. Baumbach, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, P. Cloetens, E. Ziegler, “Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging,” J. Synchrotron Radiat. 17, 496–510 (2010). [CrossRef] [PubMed]
  30. A. Yaroshenko, M. Bech, G. Potdevin, A. Malecki, T. Biernath, J. Wolf, A. Tapfer, M. Schüttler, J. Meiser, D. Kunka, M. Amberger, J. Mohr, F. Pfeiffer, “Non-binary phase gratings for X-ray imaging with a compact Talbot interferometer,” Opt. Express 22, 547 (2014). [CrossRef]
  31. M. Stampanoni, A. Groso, A. Isenegger, G. Mikuljan, Q. Chen, A. Bertrand, S. Henein, R. Betemps, U. Frommherz, P. Böhler, D. Meister, M. Lange, R. Abela, “Trends in synchrotron-based tomographic imaging: the SLS experience,” Proc. SPIE 6318, 63180M (2006). [CrossRef]
  32. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill Companies, 1996).
  33. P. Cloetens, “Contribution to phase contrast imaging, reconstruction and tomography with hard synchrotron radiation: principles, implementation and applications,” Phd thesis, Vrije Universiteit Brussel (1999).
  34. T. Weitkamp, C. David, C. Kottler, O. Bunk, F. Pfeiffer, “Tomography with grating interferometers at low-brilliance sources,” Proc. SPIE 6318, 63180S (2006). [CrossRef]
  35. R. Kluender, F. Masiello, P. van Vaerenbergh, J. Härtwig, “Measurement of the spatial coherence of synchrotron beams using the Talbot effect,” Phys. Status Solidi A 206, 1842–1845 (2009). [CrossRef]
  36. W. H. Southwell, “Validity of the Fresnel approximation in the near field,” J. Opt. Soc. Am. 71, 7 (1981). [CrossRef]
  37. G. Lovric, “Source size calculator,” http://www.psi.ch/sls/tomcat/ (2013).
  38. S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, C. David, “High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011). [CrossRef] [PubMed]
  39. S. Yasin, D. Hasko, H. Ahmed, “Comparison of MIBK/IPA and water/IPA as PMMA developers for electron beam nanolithography,” Microelectron. Eng. 61–62, 745–753 (2002). [CrossRef]

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