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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 4 — Feb. 24, 2014
  • pp: 4000–4005

Variation of exciton emissions of ZnO whiskers reversibly tuned by axial tensile strain

Bin Wei, Yuan Ji, Xiao-Dong Han, Ze Zhang, and Jin Zou  »View Author Affiliations

Optics Express, Vol. 22, Issue 4, pp. 4000-4005 (2014)

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Applying strain on semiconductors is a powerful method to modulate its electronic structures and optical properties. In this study, the behavior of liquid-nitrogen exciton emissions and the longitudinal optical phonon–exciton interactions of tensile strained [0001]-orientated ZnO whiskers were investigated using in situ cathodoluminescence spectroscopy. It has been found that, under the axial tensile strain, various exciton emissions shift to the long wavelength and their shifts have a linear relationship with the applied strain. This linear relationship and reversible shift suggest that the strain plays a dominating role in manipulating light emissions of axially strained ZnO whiskers.

© 2014 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(160.6000) Materials : Semiconductor materials
(250.1500) Optoelectronics : Cathodoluminescence
(160.4236) Materials : Nanomaterials

ToC Category:

Original Manuscript: October 30, 2013
Revised Manuscript: January 31, 2014
Manuscript Accepted: February 4, 2014
Published: February 13, 2014

Bin Wei, Yuan Ji, Xiao-Dong Han, Ze Zhang, and Jin Zou, "Variation of exciton emissions of ZnO whiskers reversibly tuned by axial tensile strain," Opt. Express 22, 4000-4005 (2014)

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