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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 5 — Mar. 10, 2014
  • pp: 5512–5521

Non-null testing for aspheric surfaces using elliptical sub-aperture stitching technique

Zixin Zhao, Hong Zhao, Feifei Gu, Hubing Du, and Kaixing Li  »View Author Affiliations

Optics Express, Vol. 22, Issue 5, pp. 5512-5521 (2014)

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We propose an elliptical sub-aperture stitching (ESAS) method to measure the aspheric surfaces. In our method, the non-null configuration is used to overcome the disadvantages of the null testing. By adding the dynamic tilt, the different local nearly null fringe patterns are obtained and the corresponding phase data in the elliptical masks is extracted with negligible retrace errors. In order to obtain the full aperture result, a stitching algorithm is developed to stitch all the phase data together. We firstly show the principle of our method. Then the performance of the proposed method is analyzed by simulation experiments. In the end, practical examples are given to demonstrate the correctness of the proposed method. The stitching result shows a good agreement with the full-aperture null testing result.

© 2014 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(220.1250) Optical design and fabrication : Aspherics
(220.4840) Optical design and fabrication : Testing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 16, 2013
Revised Manuscript: January 18, 2014
Manuscript Accepted: January 21, 2014
Published: March 3, 2014

Zixin Zhao, Hong Zhao, Feifei Gu, Hubing Du, and Kaixing Li, "Non-null testing for aspheric surfaces using elliptical sub-aperture stitching technique," Opt. Express 22, 5512-5521 (2014)

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