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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 6 — Mar. 24, 2014
  • pp: 6239–6248

Short pulse carrier-envelope phase absolute single-shot measurement by photoionization of gases with a guided laser beam

V. V. Strelkov, E. Mével, and E. Constant  »View Author Affiliations

Optics Express, Vol. 22, Issue 6, pp. 6239-6248 (2014)

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We present an all optical approach to measure the value of the carrier-envelope phase (CEP) of a short intense laser pulse. This method relies on photo-ionization of gases with a guided laser beam. This approach that provides the absolute value of the CEP, is compatible with single shot characterization, is scalable in wavelength, does not suffer from bandwidth limitation and is largely intensity independent. It has also the potential to provide a full characterization of the pulse profile via high order autocorrelation on a single shot basis.

© 2014 Optical Society of America

OCIS Codes
(190.4180) Nonlinear optics : Multiphoton processes
(320.0320) Ultrafast optics : Ultrafast optics
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Ultrafast Optics

Original Manuscript: November 12, 2013
Revised Manuscript: January 8, 2014
Manuscript Accepted: March 3, 2014
Published: March 10, 2014

V. V. Strelkov, E. Mével, and E. Constant, "Short pulse carrier-envelope phase absolute single-shot measurement by photoionization of gases with a guided laser beam," Opt. Express 22, 6239-6248 (2014)

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