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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 9 — May. 5, 2014
  • pp: 10294–10303

Observations of artefacts in the x-ray ptychography method

Nicolas Burdet, Graeme R. Morrison, Xiaojing Huang, Xiaowen Shi, Jesse N. Clark, Fucai Zhang, Maria Civita, Ross Harder, and Ian K. Robinson  »View Author Affiliations

Optics Express, Vol. 22, Issue 9, pp. 10294-10303 (2014)

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X-ray ptychography, a scanning coherent diffraction imaging method, was used to reconstruct images of a “Siemens star” test pattern with amplitude and phase contrast. While studying how the use of illumination with an increased bandwidth results in clear improvements in the quality of image reconstructions, we found that an artificial change in the overall distance scale factor of the algorithm leads to a systematic response in the image, which is reproduced with an incorrect number of spokes. This pathology is explained by the conflict between the length scales set by the scan and by the diffraction patterns on the detector.

© 2014 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(170.3010) Medical optics and biotechnology : Image reconstruction techniques
(340.7440) X-ray optics : X-ray imaging

ToC Category:
X-ray Optics

Original Manuscript: October 22, 2013
Revised Manuscript: January 13, 2014
Manuscript Accepted: February 19, 2014
Published: April 22, 2014

Virtual Issues
Vol. 9, Iss. 7 Virtual Journal for Biomedical Optics

Nicolas Burdet, Graeme R. Morrison, Xiaojing Huang, Xiaowen Shi, Jesse N. Clark, Fucai Zhang, Maria Civita, Ross Harder, and Ian K. Robinson, "Observations of artefacts in the x-ray ptychography method," Opt. Express 22, 10294-10303 (2014)

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