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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 9 — May. 5, 2014
  • pp: 10728–10734

TIRF microscopy with ultra-short penetration depth

Hao Shen, Eric Huang, Tapaswini Das, Hongxing Xu, Mark Ellisman, and Zhaowei Liu  »View Author Affiliations


Optics Express, Vol. 22, Issue 9, pp. 10728-10734 (2014)
http://dx.doi.org/10.1364/OE.22.010728


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Abstract

Total internal reflection fluorescence microscopy (TIRF), in both commercial and custom-built configurations, is widely used for high signal-noise ratio imaging. The imaging depth of traditional TIRF is sensitive to the incident angle of the laser, and normally limited to around 100 nm. In our paper, using a high refractive index material and the evanescent waves of various waveguide modes, we propose a compact and tunable ultra-short decay length TIRF system, which can reach decay lengths as short as 19 nm, and demonstrate its application for imaging fluorescent dye-labeled F-actin in HeLa cells.

© 2014 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(240.6690) Optics at surfaces : Surface waves

ToC Category:
Microscopy

History
Original Manuscript: March 13, 2014
Revised Manuscript: April 17, 2014
Manuscript Accepted: April 17, 2014
Published: April 25, 2014

Virtual Issues
Vol. 9, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Hao Shen, Eric Huang, Tapaswini Das, Hongxing Xu, Mark Ellisman, and Zhaowei Liu, "TIRF microscopy with ultra-short penetration depth," Opt. Express 22, 10728-10734 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-9-10728


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