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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 9 — May. 5, 2014
  • pp: 10914–10922

High-resolution low-noise 360-degree digital solid reconstruction using phase-stepping profilometry

Manuel Servin, Guillermo Garnica, Julio C. Estrada, and J. M. Padilla  »View Author Affiliations

Optics Express, Vol. 22, Issue 9, pp. 10914-10922 (2014)

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In this paper we describe a high-resolution, low-noise phase-shifting algorithm applied to 360 degree digitizing of solids with diffuse light scattering surface. A 360 degree profilometer needs to rotate the object a full revolution to digitize a three-dimensional (3D) solid. Although 360 degree profilometry is not new, we are proposing however a new experimental set-up which permits full phase-bandwidth phase-measuring algorithms. The first advantage of our solid profilometer is: it uses base-band, phase-stepping algorithms providing full data phase-bandwidth. This contrasts with band-pass, spatial-carrier Fourier profilometry which typically uses 1/3 of the fringe data-bandwidth. In addition phase-measuring is generally more accurate than single line-projection, non-coherent, intensity-based line detection algorithms. Second advantage: new fringe-projection set-up which avoids self-occluding fringe-shadows for convex solids. Previous 360 degree fringe-projection profilometers generate self-occluding shadows because of the elevation illumination angles. Third advantage: trivial line-by-line fringe-data assembling based on a single cylindrical coordinate system shared by all 360-degree perspectives. This contrasts with multi-view overlapping fringe-projection systems which use iterative closest point (ICP) algorithms to fusion the 3D-data cloud within a single coordinate system (e.g. Geomagic). Finally we used a 400 steps/rotation turntable, and a 640x480 pixels CCD camera. Higher 3D digitized surface resolutions and less-noisy phase measurements are trivial by increasing the angular-spatial resolution and phase-steps number without any substantial change on our 360 degree profilometer.

© 2014 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 26, 2014
Revised Manuscript: April 10, 2014
Manuscript Accepted: April 15, 2014
Published: April 29, 2014

Manuel Servin, Guillermo Garnica, Julio C. Estrada, and J. M. Padilla, "High-resolution low-noise 360-degree digital solid reconstruction using phase-stepping profilometry," Opt. Express 22, 10914-10922 (2014)

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