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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 9 — May. 5, 2014
  • pp: 11215–11227

Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution cost

Christiaan H. Righolt, Sabine Mai, Lucas J. van Vliet, and Sjoerd Stallinga  »View Author Affiliations


Optics Express, Vol. 22, Issue 9, pp. 11215-11227 (2014)
http://dx.doi.org/10.1364/OE.22.011215


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Abstract

The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We compare the use of the Lukosz-bound as apodization filter to triangular apodization and find a tenfold reduction in the most negative pixel value with a minimal resolution loss. We test this algorithm on experimental SIM images of tubulin filaments and DAPI stained DNA structure in cancer cells and find a substantial reduction in the most negative pixel value and the percentage of pixels with a negative value. This means that there is no longer a need to clip the final image to avoid these negative pixel values.

© 2014 Optical Society of America

OCIS Codes
(100.1830) Image processing : Deconvolution
(100.6640) Image processing : Superresolution
(110.4280) Imaging systems : Noise in imaging systems
(180.2520) Microscopy : Fluorescence microscopy
(070.2615) Fourier optics and signal processing : Frequency filtering

ToC Category:
Microscopy

History
Original Manuscript: January 24, 2014
Revised Manuscript: March 20, 2014
Manuscript Accepted: March 23, 2014
Published: May 1, 2014

Virtual Issues
Vol. 9, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Christiaan H. Righolt, Sabine Mai, Lucas J. van Vliet, and Sjoerd Stallinga, "Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution cost," Opt. Express 22, 11215-11227 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-9-11215


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