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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 4, Iss. 11 — May. 24, 1999
  • pp: 443–448

Ruby films as surface temperature and pressure sensors

Ursula J. Gibson and Maxim Chernuschenko  »View Author Affiliations


Optics Express, Vol. 4, Issue 11, pp. 443-448 (1999)
http://dx.doi.org/10.1364/OE.4.000443


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Abstract

Epitaxial films of chromium doped alumina, 0.3 microns in thickness, were grown on single crystal sapphire substrates for use as surface thermometers. Curve fitting was performed on the R1 and R2 fluorescence peaks, and the line widths and peak shifts were used to determine the temperature of the surface during sliding contact with a variety of plastic bearings. Temperatures could be determined with a repeatability of 2 degrees C, and adequate signal for temperature determination could be obtained in 30-100 msec. in dots that were 200 microns in diameter, using a 0.25 watt argon laser. Both average (nominal) and local temperature increases were measured. Pressure-induced shifts could be treated as an error to the temperature determination.

© Optical Society of America

OCIS Codes
(120.6780) Instrumentation, measurement, and metrology : Temperature
(160.1890) Materials : Detector materials

ToC Category:
Focus Issue: Sensing

History
Original Manuscript: March 29, 1999
Published: May 24, 1999

Citation
Ursula Gibson and Maxim Chernuschenko, "Ruby films as surface temperature and pressure sensors," Opt. Express 4, 443-448 (1999)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-4-11-443


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References

  1. K. T. V. Grattan and Z. Y. Zhang, Fiber Optic Thermometry (Chapman and Hall, London, 1995).
  2. J. D. Barnett, S. Block, G. J. Piermarini, "An optical fluorescence system for quantitative pressure measurement in the diamond-anvil cell," Rev. Sci. Instrum. 44, 1 (1973). [CrossRef]
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  7. Q. Wen, D. R. Clarke, Ning Yu, M. Nastasi "Epitaxial regrowth of ruby on sapphire for an integrated thin film stress sensor," Appl. Phys. Lett. 66, 293 (1995). [CrossRef]

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