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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 4, Iss. 11 — May. 24, 1999
  • pp: 467–474

Extended depth of field and aberration control for inexpensive digital microscope systems

Sara C. Tucker, W. Thomas Cathey, and Edward R. Dowski, Jr.  »View Author Affiliations

Optics Express, Vol. 4, Issue 11, pp. 467-474 (1999)

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We present a new application and current results for extending depth of field using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chromatic aberration control. A review of the theory behind cubic phase plate extended depth of field systems is given along with the challenges that are face when applying the theory to microscopy. Current results from the new extended depth of field microscope systems are shown

© Optical Society of America

OCIS Codes
(100.3020) Image processing : Image reconstruction-restoration
(180.0180) Microscopy : Microscopy

ToC Category:
Focus Issue: Sensing

Original Manuscript: March 31, 1999
Published: May 24, 1999

Sara Tucker, W. Thomas Cathey, and Edward Dowski, Jr., "Extended depth of field and aberration control for inexpensive digital microscope systems," Opt. Express 4, 467-474 (1999)

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  1. S. Bradburn, E. R. Dowski, Jr. and W. Thomas Cathey, "Realizations of focus invariance in optical-digital systems with wave-front coding," Appl. Opt. 36, 9157-9166 (1997). [CrossRef]
  2. E. R. Dowski, Jr. and W. Thomas Cathey, "Extended depth of field through wave-front coding," Appl. Opt. 34, 1859-1866 (1995). [CrossRef] [PubMed]
  3. Imaging Systems Laboratory, www.colorado.edu/isl
  4. H. B. Wach, E. R. Dowski, Jr., and W. Thomas Cathey, Control of chromatic focal shift through wavefront coding," Appl. Opt. 37, 5359-5367 (1998). [CrossRef]

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