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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 7, Iss. 13 — Dec. 18, 2000
  • pp: 519–532

Experimental and image-inversion optimization aspects of thermal-wave diffraction tomographic microscopy

Lena Nicolaides and Andreas Mandelis  »View Author Affiliations

Optics Express, Vol. 7, Issue 13, pp. 519-532 (2000)

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Thermal-wave Slice Diffraction Tomography (TSDT) is a photothermal imaging technique for non-destructive detection of subsurface cross-sectional defects in opaque solids in the very-near-surface region (µm-mm). Conventional reconstructions of the well-posed propagating wave-field tomographies cannot be applied to the ill-posed thermal wave problem. Photothermal tomographic microscopy is used to collect experimental data that are numerically inverted with the Tikhonov regularization method to produce thermal diffusivity cross-sectional images in materials. Multiplicity of solutions, which is inherent to ill-posed problems, is resolved by adopting the L-curve method for optimization. For tomographic imaging of sub-surface defects, a new high-resolution radiometric setup is constructed, which reduces the broadening of images associated with previous low-resolution setups.

© Optical Society of America

OCIS Codes
(100.6950) Image processing : Tomographic image processing
(290.3200) Scattering : Inverse scattering

ToC Category:
Focus Issue: Diffuse optical tomography

Original Manuscript: October 27, 2000
Published: December 18, 2000

Lena Nicolaides and Andreas Mandelis, "Experimental and image-inversion optimization aspects of thermal-wave diffraction tomographic microscopy," Opt. Express 7, 519-532 (2000)

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