Magnetooptic ellipsometry in multilayers at arbitrary magnetization
Optics Express, Vol. 9, Issue 3, pp. 121-135 (2001)
http://dx.doi.org/10.1364/OE.9.000121
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Abstract
The Yeh’s 4×4 matrix formalism is applied to determine the electromagnetic wave response in multilayers with arbitrary magnetization. With restriction to magneto–optic (MO) effects linear in the off–diagonal permittivity tensor elements, a simplified characteristic matrix for a magnetic layer is obtained. For a magnetic film–substrate system analytical representations of the MO response expressed in terms of the Jones reflection matrix are provided. These are numerically evaluated for cases when the magnetization develops in three mutually perpendicular planes.
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OCIS Codes
(210.3820) Optical data storage : Magneto-optical materials
(240.0310) Optics at surfaces : Thin films
(260.2130) Physical optics : Ellipsometry and polarimetry
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Research Papers
History
Original Manuscript: May 14, 2001
Published: July 30, 2001
Citation
Stefan Visnovsky, Radek Lopusnik, M. Bauer, J. Bok, J. Fassbender, and B. Hillebrands, "Magnetooptic ellipsometry in multilayers at arbitrary magnetization," Opt. Express 9, 121-135 (2001)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-9-3-121
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References
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