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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 11 — May. 26, 2008
  • pp: 8054–8054
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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

Aurele Adam, Janne Brok, Min Ah Seo, Kwang Jun Ahn, Dai Sik Kim, Ji-Hun Kang, Q-Han Park, M. Nagel, and Paul C. M. Nagel  »View Author Affiliations


Optics Express, Vol. 16, Issue 11, pp. 8054-8054 (2008)
http://dx.doi.org/10.1364/OE.16.008054


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Abstract

An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407–7417 (2008)] and to add a relevant reference on earlier work.

© 2008 Optical Society of America

On page 4716 of ref. [1

A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken, “Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures,” Opt. Express 16, 7407–7417 (2008) [CrossRef] [PubMed]

], the ω 6 dependence of the hole power transmission mentioned in the discussion should be ω 4. The power transmission depends on the aperture diameter a as a 6 as observed in references [26–28] in our paper. In addition, we have recently learned that a similar correspondence as the one that we observe between the time-derivative of the incident field and the near-field component Ez at the hole edge, was also observed in an earlier THz nearfield experiment by Mitrofanov et al.[2

O. Mitrofanov, L. N. Pfeiffer, and K.W West, “Generation of low-frequency components due to phase-amplitude modulation of sub-cycle far-infrared pulses in the near-field diffraction,” Appl. Phys. Lett. 81, 1579–1581 (2002) [CrossRef]

] This experiment measured the in-plane electric field, at a fixed position directly behind a small aperture, using a dipole antenna integrated with the structure, and should have been included as a reference for completeness.

References and links

1.

A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken, “Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures,” Opt. Express 16, 7407–7417 (2008) [CrossRef] [PubMed]

2.

O. Mitrofanov, L. N. Pfeiffer, and K.W West, “Generation of low-frequency components due to phase-amplitude modulation of sub-cycle far-infrared pulses in the near-field diffraction,” Appl. Phys. Lett. 81, 1579–1581 (2002) [CrossRef]

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(180.4243) Microscopy : Near-field microscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Diffraction and Gratings

History
Original Manuscript: May 16, 2008
Published: May 19, 2008

Citation
Aurele Adam, Janne Brok, Min Ah Seo, Kwang Jun Ahn, Dai Sik Kim, Ji-Hun Kang, Q-Han Park, M. Nagel, and Paul C. M. Nagel, "Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum," Opt. Express 16, 8054-8054 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-11-8054


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References

  1. A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken, "Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures," Opt. Express 16, 7407-7417 (2008). [CrossRef] [PubMed]
  2. O. Mitrofanov, L. N. Pfeiffer, and K.W. West, "Generation of low-frequency components due to phase-amplitude modulation of sub-cycle far-infrared pulses in the near-field diffraction," Appl. Phys. Lett. 81, 1579-1581 (2002). [CrossRef]

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