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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 24 — Nov. 21, 2011
  • pp: 24782–24782
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Improved sample characterization in terahertz reflection imaging and spectroscopy: erratum

Shengyang Huang, Philip C. Ashworth, Kanis Wai Chi Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, and Emma Pickwell-MacPherson  »View Author Affiliations


Optics Express, Vol. 19, Issue 24, pp. 24782-24782 (2011)
http://dx.doi.org/10.1364/OE.19.024782


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Abstract

The project codes of the grants supporting our research were omitted in the acknowledgment section of the paper. Here the project codes are given alongside the funding bodies.

© 2011 OSA

The corrected acknowledgments to include the project codes of the grants supporting our published paper [1

1. S. Y. Huang, P. C. Ashworth, K. W. C. Kan, Y. Chen, V. P. Wallace, Y. T. Zhang, and E. Pickwell-MacPherson, “Improved sample characterization in terahertz reflection imaging and spectroscopy,” Opt. Express 17(5), 3848–3854 (2009). [CrossRef] [PubMed]

] entitled “Improved sample characterization in terahertz reflection imaging and spectroscopy” are given below.

Acknowledgments

This work was partially funded by the Research Grants Council of the Hong Kong Government (project 410607) and the Shun Hing Institute of Advanced Engineering, Hong Kong (project BME-p4/07).

References and links

1.

S. Y. Huang, P. C. Ashworth, K. W. C. Kan, Y. Chen, V. P. Wallace, Y. T. Zhang, and E. Pickwell-MacPherson, “Improved sample characterization in terahertz reflection imaging and spectroscopy,” Opt. Express 17(5), 3848–3854 (2009). [CrossRef] [PubMed]

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(300.6495) Spectroscopy : Spectroscopy, teraherz
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Spectroscopy

History
Original Manuscript: November 14, 2011
Published: November 17, 2011

Citation
Shengyang Huang, Philip C. Ashworth, Kanis Wai Chi Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, and Emma Pickwell-MacPherson, "Improved sample characterization in terahertz reflection imaging and spectroscopy: erratum," Opt. Express 19, 24782-24782 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-24-24782


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