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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 24699–24700
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Light trapping limits in plasmonic solar cells: an analytical investigation: errata

Xing Sheng, Juejun Hu, Jurgen Michel, and Lionel C. Kimerling  »View Author Affiliations


Optics Express, Vol. 20, Issue 22, pp. 24699-24700 (2012)
http://dx.doi.org/10.1364/OE.20.024699


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Abstract

An error was made in Fig. 2 in the article [X. Sheng, et. al. Opt. Express 20, A496, 2012]. We have corrected this error and modified the figure.

© 2012 OSA

In the article [1

X. Sheng, J. Hu, J. Michel, and L. C. Kimerling, “Light trapping limits in plasmonic solar cells: an analytical investigation,” Opt. Express 20(S4 Suppl 4), A496–A501 (2012), doi:. [CrossRef] [PubMed]

], Fig. 2 was incorrectly presented. The modified Fig. 2 is illustrated below. The corresponding peak wavelengths in Fig. 2(b) should be 0.592 μm, 0.685 μm and 0.663 μm for Ag, Au and Cu, respectively. We regret this error, which do not affect any theoretical analysis showed in Eq. (1)–5.

Fig. 2 (a) Schematic device geometry illustrating the SPP mode at the Si/metal interface; (b) Absorption enhancement FSPP as a function of wavelength in the thin Si region (d ≈0); (c) Peak value of FSPP as a function of the layer thickness d. The traditional 4n2 limit is also indicated.

Acknowledgments

We would like to thank Dr. Inho Kim at Korea Institute of Science and Technology for pointing out this mistake.

References and links

1.

X. Sheng, J. Hu, J. Michel, and L. C. Kimerling, “Light trapping limits in plasmonic solar cells: an analytical investigation,” Opt. Express 20(S4 Suppl 4), A496–A501 (2012), doi:. [CrossRef] [PubMed]

OCIS Codes
(040.5350) Detectors : Photovoltaic
(250.5403) Optoelectronics : Plasmonics

ToC Category:
Photovoltaics

History
Original Manuscript: October 8, 2012
Published: October 12, 2012

Citation
Xing Sheng, Juejun Hu, Jurgen Michel, and Lionel C. Kimerling, "Light trapping limits in plasmonic solar cells: an analytical investigation: errata," Opt. Express 20, 24699-24700 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-22-24699


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