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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 28 — Dec. 31, 2012
  • pp: 29308–29308

Optics InfoBase > Optics Express > Volume 20 > Issue 28 > Page 29308

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Correction to article “Ellipsometry with randomly varying polarization states”

Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, and Fred Bijkerk  »View Author Affiliations


Optics Express, Vol. 20, Issue 28, pp. 29308-29308 (2012)
http://dx.doi.org/10.1364/OE.20.029308


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Abstract

We show that, under the right conditions, one can make highly accurate polarization-based measurements without knowing the absolute polarization state of the probing light field. It is shown that light, passed through a randomly varying birefringent material has a well-defined orbit on the Poincare′ sphere, which we term a generalized polarization state, that is preserved. Changes to the generalized polarization state can then be used in place of the absolute polarization states that make up the generalized state, to measure the change in polarization due to a sample under investigation. We illustrate the usefulness of this analysis approach by demonstrating fiber-based ellipsometry, where the polarization state of the probe light is unknown, and, yet, the ellipsometric angles of the investigated sample (Ψ and Δ) are obtained with an accuracy comparable to that of conventional ellipsometry instruments by measuring changes to the generalized polarization state.

© 2012 OSA

1. Correction

We recently discovered several sign-errors in our paper, published in [1

F. Liu, C. J. Lee, J. Chen, E. Louis, P. J. M. van der Slot, K. J. Boller, and F. Bijkerk, “Ellipsometry with randomly varying polarization states,” Opt. Express 20(2), 870–878 (2012). [CrossRef] [PubMed]

]. Affected are Eqs. (1), (6), and (7). These equations, with the errors corrected, are reproduced below as Eqs. (1)–(3), respectively. Due to the nature of our fitting program, these sign errors have not had an effect on our experimental results.
M=A⋅ [ 1 −cos2Ψ 0 0 −cos2Ψ 1 0 0 0 0 sin2ΨcosΔ sin2ΨsinΔ 0 0 −sin2ΨsinΔ sin2ΨcosΔ]
(1)
R3=Asin ( 2Ψ) ( I3cosΔ+ I4sinΔ)
(2)
R4=Asin ( 2Ψ) ( I4cosΔ− I3sinΔ)
(3)

References and links

1.

F. Liu, C. J. Lee, J. Chen, E. Louis, P. J. M. van der Slot, K. J. Boller, and F. Bijkerk, “Ellipsometry with randomly varying polarization states,” Opt. Express 20(2), 870–878 (2012). [CrossRef] [PubMed]

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2420) Fiber optics and optical communications : Fibers, polarization-maintaining
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(340.7470) X-ray optics : X-ray mirrors

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 10, 2012
Published: December 17, 2012

Citation
Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, and Fred Bijkerk, "Correction to article “Ellipsometry with randomly varying polarization states”," Opt. Express 20, 29308-29308 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-28-29308


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