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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 3 — Feb. 11, 2013
  • pp: 2847–2847
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Universal scaling of plasmonic refractive index sensors: erratum

Yen-Kai Chang, Zong-Xing Lou, Kao-Der Chang, and Chih-Wei Chang  »View Author Affiliations


Optics Express, Vol. 21, Issue 3, pp. 2847-2847 (2013)
http://dx.doi.org/10.1364/OE.21.002847


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Abstract

Corrections to the author affiliations and Eq. (3) in the paper [Opt. Express 21(2), 1804-1811 (2013)].

© 2013 OSA

1. The first author’s affiliations of Ref. [1

1. Y. K. Chang, Z. X. Lou, K. D. Chang, and C. W. Chang, “Universal scaling of plasmonic refractive index sensors,” Opt. Express 21(2), 1804–1811 (2013). [CrossRef]

] should be corrected to: Yen-Kai Chang,1,2 Zong-Xing Lou,1,2 Kao-Der Chang,3 and Chih-Wei Chang1,*

1Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan

2Department of Physics, National Taiwan University, Taipei 10608, Taiwan

3Nanotechnology Research Center, Industrial Technology Research Institute, Hsinchu 31040 Taiwan

2. Equation (3) in the Ref [1

1. Y. K. Chang, Z. X. Lou, K. D. Chang, and C. W. Chang, “Universal scaling of plasmonic refractive index sensors,” Opt. Express 21(2), 1804–1811 (2013). [CrossRef]

]. should be corrected to:

ω=ωa+Meε+μMm
(3)

References and links

1.

Y. K. Chang, Z. X. Lou, K. D. Chang, and C. W. Chang, “Universal scaling of plasmonic refractive index sensors,” Opt. Express 21(2), 1804–1811 (2013). [CrossRef]

OCIS Codes
(250.5403) Optoelectronics : Plasmonics
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Sensors

History
Original Manuscript: January 22, 2013
Published: January 29, 2013

Citation
Yen-Kai Chang, Zong-Xing Lou, Kao-Der Chang, and Chih-Wei Chang, "Universal scaling of plasmonic refractive index sensors: erratum," Opt. Express 21, 2847-2847 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-3-2847

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