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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 22 — Oct. 27, 2008
  • pp: 17138–18556

Optics InfoBase > Optics Express > Volume 16 > Issue 22 > Table of Contents

Topics in this Issue

 
  • Adaptive Optics
  • Atmospheric and oceanic optics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier optics and signal processing
  • Geometric optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Micromachining
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optics in computing
  • Optoelectronics
  • Photonic Crystal Fibers
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Scattering
  • Slow Light
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
  • Vision, color, and visual optics
  • X-ray Optics
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FOCUS ISSUE: INTERACTIVE SCIENCE PUBLISHING

Medical Optics and Biotechnology

  • Optics Express Vol. 16, Iss. 22, pp. 17521–17529 (2008)
  • Robert A. McLaughlin, Jonathan P. Williamson, Martin J. Phillips, Julian J. Armstrong, Sven Becker, David R. Hillman, Peter R. Eastwood, and David D. Sampson
  • Full-Text PDF contains links to datasets. See ISP homepage for software requirements and other information.

  • Optics Express Vol. 16, Iss. 22, pp. 17903–17914 (2008)
  • Colin M. Carpenter, Subhadra Srinivasan, Brian W. Pogue, and Keith D. Paulsen
  • Full-Text PDF contains links to datasets. See ISP homepage for software requirements and other information.

  • Optics Express Vol. 16, Iss. 22, pp. 18082–18101 (2008)
  • Hyun Keol Kim, Uwe J. Netz, Jürgen Beuthan, and Andreas H. Hielscher
  • Full-Text PDF contains links to datasets. See ISP homepage for software requirements and other information.

Microscopy

  • Optics Express Vol. 16, Iss. 22, pp. 17530–17541 (2008)
  • Qianqian Fang, Sava Sakadzic, Lana Ruvinskaya, Anna Devor, Anders M. Dale, and David A. Boas
  • Full-Text PDF contains links to datasets. See ISP homepage for software requirements and other information.

REGULAR PAPERS

Adaptive Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17348–17357 (2008)
  • Eric Logean, Eugénie Dalimier, and Chris Dainty

  • Optics Express Vol. 16, Iss. 22, pp. 18406–18416 (2008)
  • L. M. Mugnier, J.-F. Sauvage, T. Fusco, A. Cornia, and S. Dandy

Atmospheric and oceanic optics

  • Optics Express Vol. 16, Iss. 22, pp. 17366–17382 (2008)
  • Agustin Ifarraguerri and Avishai Ben-David

  • Optics Express Vol. 16, Iss. 22, pp. 17468–17483 (2008)
  • J. Zhou, A. Gilerson, I. Ioannou, S. Hlaing, J. Schalles, B. Gross, F. Moshary, and S. Ahmed

  • Optics Express Vol. 16, Iss. 22, pp. 18288–18295 (2008)
  • René Skov Hansen and Christian Pedersen

  • Optics Express Vol. 16, Iss. 22, pp. 18437–18442 (2008)
  • Yingbin Zhu, Daomu Zhao, and Xinyue Du

Coherence and Statistical Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17171–17185 (2008)
  • Antonio Picozzi

  • Optics Express Vol. 16, Iss. 22, pp. 18397–18405 (2008)
  • Carlos R. Fernández-Pousa, Haroldo Maestre, Adrian J. Torregrosa, and Juan Capmany

Detectors

  • Optics Express Vol. 16, Iss. 22, pp. 18443–18450 (2008)
  • B. Pradarutti, R. Müller, W. Freese, G. Matthäus, S. Riehemann, G. Notni, S. Nolte, and A. Tünnermann

Diffraction and Gratings

  • Optics Express Vol. 16, Iss. 22, pp. 17282–17287 (2008)
  • Ye Zhou, Michael Moewe, Johannes Kern, Michael C. Huang, and Connie J. Chang-Hasnain

  • Optics Express Vol. 16, Iss. 22, pp. 17295–17301 (2008)
  • Peter Götz, Thomas Schuster, Karsten Frenner, Stephan Rafler, and Wolfgang Osten

  • Optics Express Vol. 16, Iss. 22, pp. 18249–18263 (2008)
  • Mehrdad Shokooh-Saremi and Robert Magnusson

Fiber Optics and Optical Communications

  • Optics Express Vol. 16, Iss. 22, pp. 17249–17259 (2008)
  • Gabriela Statkiewicz-Barabach, Alicja Anuszkiewicz, Waclaw Urbanczyk, and Jan Wojcik

  • Optics Express Vol. 16, Iss. 22, pp. 17714–17728 (2008)
  • Taras I. Lakoba and Michael Vasilyev

  • Optics Express Vol. 16, Iss. 22, pp. 17882–17890 (2008)
  • Christophe Caucheteur, Marc Wuilpart, Chengkun Chen, Patrice Mégret, and Jacques Albert

  • Optics Express Vol. 16, Iss. 22, pp. 17935–17951 (2008)
  • Kristopher J. Rowland, Shahraam Afshar V., and Tanya M. Monro

  • Optics Express Vol. 16, Iss. 22, pp. 18040–18049 (2008)
  • Salvatore Di Girolamo, Roman V. Romashko, Yuri N. Kulchin, Jean Claude-Launay, and Alexei A. Kamshilin

  • Optics Express Vol. 16, Iss. 22, pp. 18050–18056 (2008)
  • Jay E. Sharping, Jeremy R. Sanborn, Mark A. Foster, Daniel Broaddus, and Alexander L. Gaeta

  • Optics Express Vol. 16, Iss. 22, pp. 18514–18523 (2008)
  • Yinlan Ruan, Tze Cheung Foo, Stephen Warren-Smith, Peter Hoffmann, Roger C. Moore, Heike Ebendorff-Heidepriem, and Tanya M. Monro

Fourier optics and signal processing

  • Optics Express Vol. 16, Iss. 22, pp. 17148–17153 (2008)
  • Natan T. Shaked, Gideon Segev, and Joseph Rosen

  • Optics Express Vol. 16, Iss. 22, pp. 17817–17825 (2008)
  • Yongwoo Park, Tae-Jung Ahn, Yitang Dai, Jianping Yao, and José Azaña

  • Optics Express Vol. 16, Iss. 22, pp. 18202–18214 (2008)
  • Radan Slavík, Yongwoo Park, Nicolas Ayotte, Serge Doucet, Tae-Jung Ahn, Sophie LaRochelle, and José Azaña

Geometric optics

  • Optics Express Vol. 16, Iss. 22, pp. 17768–17773 (2008)
  • Jingbo Sun, Ji Zhou, and Lei Kang

Holography

  • Optics Express Vol. 16, Iss. 22, pp. 17215–17226 (2008)
  • Xin Zhang, Edmund Y. Lam, and Ting-Chung Poon

Image Processing

  • Optics Express Vol. 16, Iss. 22, pp. 17154–17160 (2008)
  • G. Saavedra, R. Martinez-Cuenca, M. Martinez-Corral, H. Navarro, M. Daneshpanah, and B. Javidi

Imaging Systems

  • Optics Express Vol. 16, Iss. 22, pp. 17870–17881 (2008)
  • Edouard Berrocal, Elias Kristensson, Mattias Richter, Mark Linne, and Marcus Aldén

  • Optics Express Vol. 16, Iss. 22, pp. 18118–18130 (2008)
  • Nishant Mohan, Olga Minaeva, Gregory N. Gol’tsman, Magued B. Nasr, Bahaa E. Saleh, Alexander V. Sergienko, and Malvin C. Teich

  • Optics Express Vol. 16, Iss. 22, pp. 18371–18378 (2008)
  • J. Ares García, S. Bará, M. Gomez García, Z. Jaroszewicz, A. Kolodziejczyk, and K. Petelczyc

  • Optics Express Vol. 16, Iss. 22, pp. 18551–18556 (2008)
  • R. J. Zemp, L. Song, R. Bitton, K. K. Shung, and L. V. Wang

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 16, Iss. 22, pp. 17138–17147 (2008)
  • Sung Y. Ryu, Jang-Woo You, Yoon K. Kwak, and Soohyun Kim

  • Optics Express Vol. 16, Iss. 22, pp. 17854–17863 (2008)
  • X. Steve Yao, Bo Zhang, Xiaojun Chen, and Alan E. Willner

Integrated Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17237–17242 (2008)
  • Laurent Vivien, Delphine Marris-Morini, Amadeu Griol, Kristinn B. Gylfason, Daniel Hill, Jesús Alvarez, Hans Sohlström, Juan Hurtado, David Bouville, and Eric Cassan

  • Optics Express Vol. 16, Iss. 22, pp. 17599–17608 (2008)
  • S. Massenot, J.-C. Weeber, A. Bouhelier, G. Colas des Francs, J. Grandidier, L. Markey, and A. Dereux

  • Optics Express Vol. 16, Iss. 22, pp. 17616–17625 (2008)
  • Przemek J. Bock, Pavel Cheben, André Delâge, Jens H. Schmid, Dan-Xia Xu, Siegfried Janz, and Trevor J. Hall

  • Optics Express Vol. 16, Iss. 22, pp. 17689–17694 (2008)
  • Alexander Gondarenko and Michal Lipson

  • Optics Express Vol. 16, Iss. 22, pp. 17915–17934 (2008)
  • Chia-Chien Huang

  • Optics Express Vol. 16, Iss. 22, pp. 18152–18163 (2008)
  • Jianwei Mu and Wei-Ping Huang

  • Optics Express Vol. 16, Iss. 22, pp. 18164–18172 (2008)
  • Patrick Dumais, Claire L. Callender, Julian P. Noad, and Christopher J. Ledderhof

  • Optics Express Vol. 16, Iss. 22, pp. 18326–18333 (2008)
  • Bruce A. Block, Todd R. Younkin, Paul S. Davids, Miriam R. Reshotko, Peter Chang, Brent M. Polishak, Su Huang, Jingdong Luo, and Alex K. Y. Jen

  • Optics Express Vol. 16, Iss. 22, pp. 18340–18344 (2008)
  • Jong-Bum You, Miran Park, Jeong-Woo Park, and Gyungock Kim

  • Optics Express Vol. 16, Iss. 22, pp. 18426–18436 (2008)
  • Jörg Frischeisen, Christian Mayr, Nils A. Reinke, Stefan Nowy, and Wolfgang Brütting

Laser Micromachining

  • Optics Express Vol. 16, Iss. 22, pp. 17288–17294 (2008)
  • Hiroaki Nishiyama, Mizue Mizoshiri, Toshio Kawahara, Junji Nishii, and Yoshinori Hirata

Lasers and Laser Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17243–17248 (2008)
  • Jianhua Huang, Yujin Chen, Yanfu Lin, Xinghong Gong, Zundu Luo, and Yidong Huang

  • Optics Express Vol. 16, Iss. 22, pp. 17310–17318 (2008)
  • Fabian Roeser, Cesar Jauregui, Jens Limpert, and Andreas Tünnermann

  • Optics Express Vol. 16, Iss. 22, pp. 17342–17347 (2008)
  • Ling Lu, Adam Mock, Mahmood Bagheri, Eui Hyun Hwang, John O'Brien, and P. Daniel Dapkus

  • Optics Express Vol. 16, Iss. 22, pp. 17554–17559 (2008)
  • Muhan Choi, Susumu Shinohara, and Takahisa Harayama

  • Optics Express Vol. 16, Iss. 22, pp. 17637–17646 (2008)
  • Damian N. Schimpf, Clemens Ruchert, Dirk Nodop, Jens Limpert, Andreas Tünnermann, and Francois Salin

  • Optics Express Vol. 16, Iss. 22, pp. 17706–17713 (2008)
  • J. P. Tourrenc, A. Akrout, K. Merghem, A. Martinez, F. Lelarge, A. Shen, G. H. Duan, and A. Ramdane

  • Optics Express Vol. 16, Iss. 22, pp. 17729–17734 (2008)
  • Junhai Liu, Huaijin Zhang, Xavier Mateos, Wenjuan Han, Valentin Petrov, and Jiyang Wang

  • Optics Express Vol. 16, Iss. 22, pp. 17752–17758 (2008)
  • H. Yokoyama, A. Sato, H. -C. Guo, K. Sato, M. Mure, and H. Tsubokawa

  • Optics Express Vol. 16, Iss. 22, pp. 17864–17869 (2008)
  • Shupeng Yin, Ping Yan, and Mali Gong

  • Optics Express Vol. 16, Iss. 22, pp. 17891–17902 (2008)
  • Johan Boullet, Yoann Zaouter, Rudy Desmarchelier, Matthieu Cazaux, François Salin, Julien Saby, Ramatou Bello-Doua, and Eric Cormier

  • Optics Express Vol. 16, Iss. 22, pp. 18194–18201 (2008)
  • Young-Ouk Noh, Hyung-Jong Lee, Jung Jin Ju, Min-su Kim, Su Hwan Oh, and Min-Cheol Oh

  • Optics Express Vol. 16, Iss. 22, pp. 18485–18494 (2008)
  • Yoshitaka Kurosaka, Kyosuke Sakai, Eiji Miyai, and Susumu Noda

Materials

  • Optics Express Vol. 16, Iss. 22, pp. 17329–17341 (2008)
  • Eun Ju Kim, Hye Ri Yang, Sang Jo Lee, Gun Yeup Kim, and Chong Hoon Kwak

  • Optics Express Vol. 16, Iss. 22, pp. 17591–17598 (2008)
  • Yi-Hsin Lin, Hongwen Ren, Yung-Hsun Wu, Shin-Tson Wu, Yue Zhao, Jiyu Fang, and Hung-Chun Lin

  • Optics Express Vol. 16, Iss. 22, pp. 17735–17744 (2008)
  • Ke Xu, Pascal Loiseau, Gerard Aka, Regine Maillard, Alain Maillard, and Takunori Taira

  • Optics Express Vol. 16, Iss. 22, pp. 18028–18033 (2008)
  • Zhang-Kai Zhou, Xiong-Rui Su, Xiao-Niu Peng, and Li Zhou

  • Optics Express Vol. 16, Iss. 22, pp. 18230–18240 (2008)
  • Kenta Shinkawa and Kazuhiko Ogusu

  • Optics Express Vol. 16, Iss. 22, pp. 18320–18325 (2008)
  • Dong Jun Kang, Dong Hee Han, Dong Pil Kang, Jae Won Yoo, and Byeong Uk Kim

  • Optics Express Vol. 16, Iss. 22, pp. 18354–18361 (2008)
  • B. Poumellec, M. Lancry, J.-C. Poulin, and S. Ani-Joseph

Medical Optics and Biotechnology

  • Optics Express Vol. 16, Iss. 22, pp. 17457–17467 (2008)
  • Eun Joo Jung, Jae-Seok Park, Myung Yung Jeong, Chang-Seok Kim, Tae Joong Eom, Bong-Ahn Yu, Sangyoun Gee, Jongmin Lee, and Moon Ki Kim

  • Optics Express Vol. 16, Iss. 22, pp. 17484–17504 (2008)
  • Guan Xu, Daqing Piao, Cameron H. Musgrove, Charles F. Bunting, and Hamid Dehghani

  • Optics Express Vol. 16, Iss. 22, pp. 17505–17520 (2008)
  • Zhen Jiang, Daqing Piao, Guan Xu, Jerry W. Ritchey, G. R. Holyoak, Kenneth E. Bartels, Charles F. Bunting, Gennady Slobodov, and Jerzy S. Krasinski

  • Optics Express Vol. 16, Iss. 22, pp. 17780–17791 (2008)
  • Matthew E. Eames and Hamid Dehghani

  • Optics Express Vol. 16, Iss. 22, pp. 17792–17807 (2008)
  • Chintha C. Handapangoda, Malin Premaratne, David M. Paganin, and Priyantha R. D. S. Hendahewa

  • Optics Express Vol. 16, Iss. 22, pp. 18173–18187 (2008)
  • Khai Jun Kek, Ryuta Kibe, Masatsugu Niwayama, Nobuki Kudo, and Katsuyuki Yamamoto

  • Optics Express Vol. 16, Iss. 22, pp. 18215–18229 (2008)
  • Yulia M. Serebrennikova, Jennifer M. Smith, Debra E. Huffman, German F. Leparc, and Luis H. García-Rubio

Metamaterials

  • Optics Express Vol. 16, Iss. 22, pp. 17269–17275 (2008)
  • Lei Kang, Qian Zhao, Hongjie Zhao, and Ji Zhou

  • Optics Express Vol. 16, Iss. 22, pp. 18057–18066 (2008)
  • Junming Zhao, Yijun Feng, Bo Zhu, and Tian Jiang

  • Optics Express Vol. 16, Iss. 22, pp. 18131–18144 (2008)
  • R. S. Penciu, K. Aydin, M. Kafesaki, Th. Koschny, E. Ozbay, E. N. Economou, and C. M. Soukoulis

  • Optics Express Vol. 16, Iss. 22, pp. 18312–18319 (2008)
  • M. Aznabet, M. Navarro-Cia, S. A. Kuznetsov, A. V. Gelfand, N. I. Fedorinina, Yu. G. Goncharov, M. Beruete, O. El Mrabet, and M. Sorolla

  • Optics Express Vol. 16, Iss. 22, pp. 18479–18484 (2008)
  • Zhaoyun Duan, Bae-Ian Wu, Jie Lu, Jin Au Kong, and Min Chen

  • Optics Express Vol. 16, Iss. 22, pp. 18505–18513 (2008)
  • Kihong Kim, D.-H. Lee, and H. Lim

Microscopy

  • Optics Express Vol. 16, Iss. 22, pp. 17186–17195 (2008)
  • S. M. R. Motaghian Nezam, C. Joo, G. J. Tearney, and J. F. de Boer

  • Optics Express Vol. 16, Iss. 22, pp. 17574–17584 (2008)
  • Kraig E. Sheetz, Erich E. Hoover, Ramn Carriles, David Kleinfeld, and Jeff A. Squier

  • Optics Express Vol. 16, Iss. 22, pp. 17826–17841 (2008)
  • Marcus Schmelzeisen, Jacqueline Austermann, and Maximilian Kreiter

  • Optics Express Vol. 16, Iss. 22, pp. 17982–18003 (2008)
  • Chin Ho Chuang and Yu-Lung Lo

  • Optics Express Vol. 16, Iss. 22, pp. 18495–18504 (2008)
  • Marcel van 't Hoff, Vincent de Sars, and Martin Oheim

Nonlinear Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17161–17170 (2008)
  • Wen-Xing Yang and Ray-Kuang Lee

  • Optics Express Vol. 16, Iss. 22, pp. 17196–17208 (2008)
  • Sami Kujala, Brian K. Canfield, Martti Kauranen, Yuri Svirko, and Jari Turunen

  • Optics Express Vol. 16, Iss. 22, pp. 17441–17450 (2008)
  • T. N. Dey, S. Dutta Gupta, and G. S. Agarwal

  • Optics Express Vol. 16, Iss. 22, pp. 17585–17590 (2008)
  • B. V. Zhdanov, Yalin Lu, M. K. Shaffer, W. Miller, D. Wright, and R. J. Knize

  • Optics Express Vol. 16, Iss. 22, pp. 17682–17688 (2008)
  • J. O’ Dowd, W. H. Guo, E. Flood, M. Lynch, A. L. Bradley, L. P. Barry, and J. F. Donegan

  • Optics Express Vol. 16, Iss. 22, pp. 17745–17751 (2008)
  • Bing Gu, Yan Sun, and Wei Ji

  • Optics Express Vol. 16, Iss. 22, pp. 17759–17767 (2008)
  • Rongcao Yang and Xiaoling Wu

  • Optics Express Vol. 16, Iss. 22, pp. 17774–17779 (2008)
  • I. Babushkin and J. Herrmann

  • Optics Express Vol. 16, Iss. 22, pp. 17952–17961 (2008)
  • Preben Buchhave and Peter Tidemand-Lichtenberg

  • Optics Express Vol. 16, Iss. 22, pp. 18034–18039 (2008)
  • R. Sai Santosh Kumar, Suneel Singh, and D. Narayana Rao

  • Optics Express Vol. 16, Iss. 22, pp. 18109–18117 (2008)
  • Carolina Romero, Javier R. Vázquez de Aldana, Cruz Méndez, and Luis Roso

  • Optics Express Vol. 16, Iss. 22, pp. 18296–18311 (2008)
  • Kyriakos Hizanidis, Yannis Kominis, and Nikolaos K. Efremidis

  • Optics Express Vol. 16, Iss. 22, pp. 18345–18353 (2008)
  • K. Yamane, T. Tanigawa, T. Sekikawa, and M. Yamashita

  • Optics Express Vol. 16, Iss. 22, pp. 18379–18389 (2008)
  • Dimitrii N. Kozlov, Markus C. Weikl, Johannes Kiefer, Thomas Seeger, and Alfred Leipertz

  • Optics Express Vol. 16, Iss. 22, pp. 18390–18396 (2008)
  • C. Torres-Torres, A. López-Suárez, L. Tamayo-Rivera, R. Rangel-Rojo, A. Crespo-Sosa, J. C. Alonso, and A. Oliver

  • Optics Express Vol. 16, Iss. 22, pp. 18457–18478 (2008)
  • Myriam Raybaut, Antoine Godard, Alexis Toulouse, Clement Lubin, and Emmanuel Rosencher

  • Optics Express Vol. 16, Iss. 22, pp. 18524–18534 (2008)
  • A. Tuniz, G. Brawley, D. J. Moss, and B. J. Eggleton

Optical Devices

  • Optics Express Vol. 16, Iss. 22, pp. 17400–17409 (2008)
  • Yinan Zhang and Marko Loncar

  • Optics Express Vol. 16, Iss. 22, pp. 18102–18108 (2008)
  • Jin Seog Gwag, You-Jin Lee, Jae-Hoon Kim, Hyeok Jin Lee, and Mi Hie Yi

  • Optics Express Vol. 16, Iss. 22, pp. 18275–18287 (2008)
  • David Engström, Jörgen Bengtsson, Emma Eriksson, and Mattias Goksör

  • Optics Express Vol. 16, Iss. 22, pp. 18334–18339 (2008)
  • Chun-Ta Wang and Tsung-Hsien Lin

  • Optics Express Vol. 16, Iss. 22, pp. 18535–18544 (2008)
  • C. L. Chang, Y. H. Chen, C. H. Lin, and J. Y. Chang

Optical Trapping and Manipulation

  • Optics Express Vol. 16, Iss. 22, pp. 17276–17281 (2008)
  • Benjamin K. Wilson, Mike Hegg, Xiaoyu Miao, Guozhong Cao, and Lih Y. Lin

  • Optics Express Vol. 16, Iss. 22, pp. 17647–17653 (2008)
  • F. Bragheri, P. Minzioni, C. Liberale, E. Di Fabrizio, and I. Cristiani

Optics at Surfaces

  • Optics Express Vol. 16, Iss. 22, pp. 17302–17309 (2008)
  • Jonas Beermann, Sergey M. Novikov, Thomas Søndergaard, Alexandra Boltasseva, and Sergey I. Bozhevolnyi

  • Optics Express Vol. 16, Iss. 22, pp. 17429–17440 (2008)
  • Andrey B. Evlyukhin and Sergey I. Bozhevolnyi

  • Optics Express Vol. 16, Iss. 22, pp. 17842–17847 (2008)
  • Nikolai Berkovitch, Meir Orenstein, and Stephen G. Lipson

  • Optics Express Vol. 16, Iss. 22, pp. 18241–18248 (2008)
  • Huawei Liang, Shuangchen Ruan, and Min Zhang

  • Optics Express Vol. 16, Iss. 22, pp. 18417–18425 (2008)
  • Shy-Hauh Guo, Julia J. Heetderks, Hung-Chih Kan, and Raymond J. Phaneuf

  • Optics Express Vol. 16, Iss. 22, pp. 18451–18456 (2008)
  • P. S. Tan, X.-C. Yuan, J. Lin, Q. Wang, and R. E. Burge

Optics in computing

  • Optics Express Vol. 16, Iss. 22, pp. 18264–18274 (2008)
  • Woon-Kyung Choi and Young-Wan Choi

  • Optics Express Vol. 16, Iss. 22, pp. 18362–18370 (2008)
  • David M. Lai, C. H. Kwok, and Kenneth K. Wong

Optoelectronics

  • Optics Express Vol. 16, Iss. 22, pp. 17848–17853 (2008)
  • J. Zamora-Munt and C. Masoller

Photonic Crystal Fibers

  • Optics Express Vol. 16, Iss. 22, pp. 17227–17236 (2008)
  • H. K. Tyagi, M. A. Schmidt, L. Prill Sempere, and P. S. Russell

  • Optics Express Vol. 16, Iss. 22, pp. 17972–17981 (2008)
  • T. G. Euser, G. Whyte, M. Scharrer, J. S. Y. Chen, A. Abdolvand, J. Nold, C. F. Kaminski, and P. St. J. Russell

Photonic Crystals

  • Optics Express Vol. 16, Iss. 22, pp. 17209–17214 (2008)
  • Damien Bernier, Xavier Le Roux, Anatole Lupu, Delphine Marris-Morini, Laurent Vivien, and Eric Cassan

  • Optics Express Vol. 16, Iss. 22, pp. 17383–17399 (2008)
  • Zhen Hu and Ya Yan Lu

  • Optics Express Vol. 16, Iss. 22, pp. 17962–17971 (2008)
  • Lina Shi, Pierre Pottier, Yves-Alain Peter, and Maksim Skorobogatiy

  • Optics Express Vol. 16, Iss. 22, pp. 18188–18193 (2008)
  • Christopher Kang and Sharon M. Weiss

Physical Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17560–17573 (2008)
  • Jeffrey S. McGuirk and Peter J. Collins

  • Optics Express Vol. 16, Iss. 22, pp. 17654–17666 (2008)
  • G. Colas des Francs, A. Bouhelier, E. Finot, J. C. Weeber, A. Dereux, C. Girard, and E. Dujardin

  • Optics Express Vol. 16, Iss. 22, pp. 17808–17816 (2008)
  • J. Goldwin and E. A. Hinds

Quantum Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17609–17615 (2008)
  • Nicoló Spagnolo, Chiara Vitelli, Sandro Giacomini, Fabio Sciarrino, and Francesco De Martini

  • Optics Express Vol. 16, Iss. 22, pp. 18067–18081 (2008)
  • Makoto Yamaguchi, Takashi Asano, and Susumu Noda

  • Optics Express Vol. 16, Iss. 22, pp. 18145–18151 (2008)
  • F. Wolfgramm, X. Xing, A. Cerè, A. Predojević, A. M. Steinberg, and M. W. Mitchell

Scattering

  • Optics Express Vol. 16, Iss. 22, pp. 17667–17681 (2008)
  • Rosario Esposito, Sergio De Nicola, Marco Brambilla, Antonio Pifferi, Lorenzo Spinelli, and Maria Lepore

  • Optics Express Vol. 16, Iss. 22, pp. 18545–18550 (2008)
  • Tao Yang, Huanyang Chen, Xudong Luo, and Hongru Ma

Slow Light

  • Optics Express Vol. 16, Iss. 22, pp. 17451–17456 (2008)
  • Kwang Yong Song, Sung Hoon Choi, Kwanil Lee, and Sang Bae Lee

Spectroscopy

  • Optics Express Vol. 16, Iss. 22, pp. 17358–17365 (2008)
  • G. Wrigge, J. Hwang, I. Gehardt, G. Zumofen, and V. Sandoghdar

  • Optics Express Vol. 16, Iss. 22, pp. 17420–17428 (2008)
  • Jeffrey A. Myers, Kristin L. Lewis, Patrick F. Tekavec, and Jennifer P. Ogilvie

  • Optics Express Vol. 16, Iss. 22, pp. 18017–18027 (2008)
  • Alan D. Bristow, Denis Karaiskaj, Xingcan Dai, and Steven T. Cundiff

Thin Films

  • Optics Express Vol. 16, Iss. 22, pp. 17258–17267 (2008)
  • Ian R. Hooper and J. R. Sambles

Ultrafast Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17410–17419 (2008)
  • Stefan Rausch, Thomas Binhammer, Anne Harth, Franz X. Krtner, and Uwe Morgner

  • Optics Express Vol. 16, Iss. 22, pp. 17542–17553 (2008)
  • Pengfei Lan, Peixiang Lu, Fang Li, Qianguang Li, Weiyi Hong, Qingbin Zhang, Zhenyu Yang, and Xinbin Wang

  • Optics Express Vol. 16, Iss. 22, pp. 17626–17636 (2008)
  • Selcuk Akturk, Arnaud Couairon, Michel Franco, and Andre Mysyrowicz

  • Optics Express Vol. 16, Iss. 22, pp. 18004–18016 (2008)
  • Charles G. Durfee, Jeff A. Squier, and Steve Kane

Vision, color, and visual optics

  • Optics Express Vol. 16, Iss. 22, pp. 17319–17328 (2008)
  • Jun Ki Kim, H. R. Kim, Andreas Tünnermann, and K. Oh

X-ray Optics

  • Optics Express Vol. 16, Iss. 22, pp. 17695–17705 (2008)
  • Bixue Hou, James Easter, Aghapi Mordovanakis, Karl Krushelnick, and John A. Nees
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