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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 20 — Sep. 28, 2009
  • pp: 17206–18393

Optics InfoBase > Optics Express > Volume 17 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Adaptive Optics
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Diffraction
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optoelectronics
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Remote Sensing and Sensors
  • Scattering
  • Slow and Fast Light
  • Spectroscopy
  • Ultrafast Optics
  • X-ray Optics
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Adaptive Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17279–17292 (2009)
  • James Osborn, Richard M. Myers, and Gordon D. Love

  • Optics Express Vol. 17, Iss. 20, pp. 17590–17595 (2009)
  • Su Xu, Hongwen Ren, Yeong-Jyh Lin, M. G. Jim Moharam, Shin-Tson Wu, and Nelson Tabiryan

  • Optics Express Vol. 17, Iss. 20, pp. 17715–17722 (2009)
  • Zhaoliang Cao, Quanquan Mu, Lifa Hu, Xinghai Lu, and Li Xuan

  • Optics Express Vol. 17, Iss. 20, pp. 18229–18240 (2009)
  • Karen M. Hampson, Sem Sem Chin, and Edward A. Mallen

Atmospheric and Oceanic Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17344–17356 (2009)
  • Yangsheng Yuan, Yangjian Cai, Jun Qu, Halil T. Eyyuboğlu, Yahya Baykal, and Olga Korotkova

  • Optics Express Vol. 17, Iss. 20, pp. 17772–17783 (2009)
  • Wei Li, Kecheng Yang, Min Xia, Jionghui Rao, and Wei Zhang

  • Optics Express Vol. 17, Iss. 20, pp. 17829–17836 (2009)
  • Wen Cheng, Joseph W. Haus, and Qiwen Zhan

  • Optics Express Vol. 17, Iss. 20, pp. 18250–18262 (2009)
  • Ivan B. Djordjevic and Goran T. Djordjevic

Atomic and Molecular Physics

  • Optics Express Vol. 17, Iss. 20, pp. 17792–17800 (2009)
  • Tadashi Nishikawa, Akira Ozawa, Yoshiki Nishida, Masaki Asobe, Feng-Lei Hong, and Theodor W. Hänsch

Coherence and Statistical Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17888–17894 (2009)
  • XinHui Zhao, Yong Yao, Yunxu Sun, and Chao Liu

Diffraction

  • Optics Express Vol. 17, Iss. 20, pp. 17412–17425 (2009)
  • L. Guestin, A. J. L. Adam, J. R. Knab, M. Nagel, and P. C. M. Planken

Diffraction and Gratings

  • Optics Express Vol. 17, Iss. 20, pp. 18219–18228 (2009)
  • David Pietroy, Olivier Parriaux, and Jean-Louis Stehle

Fiber Optics and Optical Communications

  • Optics Express Vol. 17, Iss. 20, pp. 17214–17226 (2009)
  • Dong Yang and Shiva Kumar

  • Optics Express Vol. 17, Iss. 20, pp. 17242–17252 (2009)
  • Z. Várallyay and J. C. Jasapara

  • Optics Express Vol. 17, Iss. 20, pp. 17536–17546 (2009)
  • Woosung Ha, Sejin Lee, Yongmin Jung, Jun Ki Kim, and Kyunghwan Oh

  • Optics Express Vol. 17, Iss. 20, pp. 17596–17602 (2009)
  • M. Malmström, Z. Yu, W. Margulis, O. Tarasenko, and F. Laurell

  • Optics Express Vol. 17, Iss. 20, pp. 17645–17651 (2009)
  • S. J. Madden and K. T. Vu

  • Optics Express Vol. 17, Iss. 20, pp. 17658–17668 (2009)
  • Yannis Benlachtar, Philip M. Watts, Rachid Bouziane, Peter Milder, Deepak Rangaraj, Anthony Cartolano, Robert Koutsoyannis, James C. Hoe, Markus Püschel, Madeleine Glick, and Robert I. Killey

  • Optics Express Vol. 17, Iss. 20, pp. 17739–17746 (2009)
  • Gong-Ru Lin, Tzu-Kang Cheng, Yu-Chieh Chi, Gong-Cheng Lin, Hai-Lin Wang, and Yi-Hong Lin

  • Optics Express Vol. 17, Iss. 20, pp. 17747–17757 (2009)
  • Thanh Nam Nguyen, Thierry Chartier, Laurent Bramerie, Mathilde Gay, Quang Trung Le, Sebastien Lobo, Michel Joindot, Jean-Claude Simon, Julien Fatome, and Christophe Finot

  • Optics Express Vol. 17, Iss. 20, pp. 17758–17763 (2009)
  • P. Martelli, P. Boffi, M. Ferrario, L. Marazzi, P. Parolari, R. Siano, V. Pusino, P. Minzioni, I. Cristiani, C. Langrock, M. M. Fejer, M. Martinelli, and V. Degiorgio

  • Optics Express Vol. 17, Iss. 20, pp. 17764–17771 (2009)
  • Ming Li, Guiling Wu, Pan Guo, Xinwan Li, and Jianping Chen

  • Optics Express Vol. 17, Iss. 20, pp. 17849–17854 (2009)
  • Yongbin Lin, Junpeng Guo, and Robert G. Lindquist

  • Optics Express Vol. 17, Iss. 20, pp. 17855–17861 (2009)
  • Kent E. Mattsson

  • Optics Express Vol. 17, Iss. 20, pp. 17928–17933 (2009)
  • Jianjun Yu, Xiang Zhou, Ming-Fang Huang, Dayou Qian, Philip N. Ji, Ting Wang, and Peter Magill

  • Optics Express Vol. 17, Iss. 20, pp. 17950–17962 (2009)
  • Michael H. Frosz

  • Optics Express Vol. 17, Iss. 20, pp. 17976–17982 (2009)
  • Meng Jiang, A. Ping Zhang, Yang-Chun Wang, Hwa-Yaw Tam, and Sailing He

  • Optics Express Vol. 17, Iss. 20, pp. 18003–18013 (2009)
  • Wei-Ching Chuang, An-Chen Lee, Ching-Kong Chao, and Chi-Ting Ho

  • Optics Express Vol. 17, Iss. 20, pp. 18076–18082 (2009)
  • N. Healy, J. R. Sparks, M. N. Petrovich, P. J. A. Sazio, J. V. Badding, and A. C. Peacock

  • Optics Express Vol. 17, Iss. 20, pp. 18142–18147 (2009)
  • Yu Wu, Yun-Jiang Rao, Yi-huai Chen, and Yuan Gong

  • Optics Express Vol. 17, Iss. 20, pp. 18171–18177 (2009)
  • Jeng-Yuan Yang, Lin Zhang, Yang Yue, Janet Jackel, Anjali Agarwal, Loukas Paraschis, and Alan E. Willner

  • Optics Express Vol. 17, Iss. 20, pp. 18364–18370 (2009)
  • Ken Kashiwagi and Shinji Yamashita

  • Optics Express Vol. 17, Iss. 20, pp. 17563–17569 (2009)
  • Murali K Kilaru, Jia Yang, and Jason Heikenfeld

  • Optics Express Vol. 17, Iss. 20, pp. 17916–17927 (2009)
  • Byungwook Kim, Minseok Choi, Hokwan Kim, Jiseok Lim, and Shinill Kang

Image Processing

  • Optics Express Vol. 17, Iss. 20, pp. 18026–18037 (2009)
  • Joon-Jae Lee, Dong-Hak Shin, and Byung-Gook Lee

Imaging Systems

  • Optics Express Vol. 17, Iss. 20, pp. 17253–17268 (2009)
  • Richard H. Vollmerhausen

  • Optics Express Vol. 17, Iss. 20, pp. 17812–17817 (2009)
  • Zhuopeng Zhang and Takashi Buma

  • Optics Express Vol. 17, Iss. 20, pp. 17895–17908 (2009)
  • Gilbae Park, Jae-Hyun Jung, Keehoon Hong, Yunhee Kim, Young-Hoon Kim, Sung-Wook Min, and Byoungho Lee

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 17, Iss. 20, pp. 17324–17337 (2009)
  • Shuko Yokoyama, Toshiyuki Yokoyama, Yuki Hagihara, Tsutomu Araki, and Takeshi Yasui

  • Optics Express Vol. 17, Iss. 20, pp. 17441–17449 (2009)
  • Koichi Maru and Yusaku Fujii

  • Optics Express Vol. 17, Iss. 20, pp. 17784–17791 (2009)
  • Sai Siva Gorthi and Pramod Rastogi

  • Optics Express Vol. 17, Iss. 20, pp. 17996–18002 (2009)
  • Sergio Calixto, Francisco J. Sánchez-Marin, and M. E. Sánchez-Morales

  • Optics Express Vol. 17, Iss. 20, pp. 18014–18025 (2009)
  • Cristina Trillo, Ángel F. Doval, Fernando Mendoza-Santoyo, Carlos Pérez-López, Manuel de la Torre-Ibarra, and J. Luis Deán

Integrated Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17369–17375 (2009)
  • E. Epp, N. Ponnampalam, J. N. McMullin, and R. G. DeCorby

  • Optics Express Vol. 17, Iss. 20, pp. 17614–17629 (2009)
  • Michaël Ménard and Andrew G. Kirk

  • Optics Express Vol. 17, Iss. 20, pp. 17818–17828 (2009)
  • Jing Ma and Michelle L. Povinelli

  • Optics Express Vol. 17, Iss. 20, pp. 17868–17873 (2009)
  • Davide Castaldini, Paolo Bassi, Pierre Aschieri, Sorin Tascu, Marc De Micheli, and Pascal A. Baldi

  • Optics Express Vol. 17, Iss. 20, pp. 18371–18380 (2009)
  • J. H. Schmid, W. Sinclair, J. García, S. Janz, J. Lapointe, D. Poitras, Y. Li, T. Mischki, G. Lopinski, P. Cheben, A. Delâge, A. Densmore, P. Waldron, and D.-X. Xu

Lasers and Laser Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17303–17316 (2009)
  • M. Wohlmuth, C. Pflaum, K. Altmann, M. Paster, and C. Hahn

  • Optics Express Vol. 17, Iss. 20, pp. 17384–17390 (2009)
  • Hans-Christoph Eckstein and Uwe Detlef Zeitner

  • Optics Express Vol. 17, Iss. 20, pp. 17547–17554 (2009)
  • Werner Hofmann, Michael Müller, Alexey Nadtochiy, Christian Meltzer, Alex Mutig, Gerhard Böhm, Jürgen Rosskopf, Dieter Bimberg, Markus-Christian Amann, and Connie Chang-Hasnain

  • Optics Express Vol. 17, Iss. 20, pp. 17630–17635 (2009)
  • H. Zhang, D. Y. Tang, L. M. Zhao, Q. L. Bao, and K. P. Loh

  • Optics Express Vol. 17, Iss. 20, pp. 17694–17699 (2009)
  • Sandrine Auroux, Vincent Kermène, Agnès Desfarges-Berthelemot, and Alain Barthélémy

  • Optics Express Vol. 17, Iss. 20, pp. 17734–17738 (2009)
  • Qiang Hao, Wenxue Li, Haifeng Pan, Xiaoyi Zhang, Benxue Jiang, Yubai Pan, and Heping Zeng

  • Optics Express Vol. 17, Iss. 20, pp. 18136–18141 (2009)
  • Nils Hempler, John-Mark Hopkins, Benno Rösener, Marcel Rattunde, Joachim Wagner, Vladimir V. Fedorov, Igor S. Moskalev, Sergey B. Mirov, and David Burns

  • Optics Express Vol. 17, Iss. 20, pp. 18178–18183 (2009)
  • Kirill A. Atlasov, Milan Calic, Karl Fredrik Karlsson, Pascal Gallo, Alok Rudra, Benjamin Dwir, and Eli Kapon

  • Optics Express Vol. 17, Iss. 20, pp. 18241–18249 (2009)
  • X. J. lv, L. N. Zhao, J. Lu, G. Zhao, H. Liu, Y. Q. Qin, and S. N. Zhu

  • Optics Express Vol. 17, Iss. 20, pp. 18263–18270 (2009)
  • Anne Hildenbrand, Frank R. Wagner, Jean-Yves Natoli, and Mireille Commandré

  • Optics Express Vol. 17, Iss. 20, pp. 18304–18311 (2009)
  • Vincent Kuhn, Peter Weßels, Jörg Neumann, and Dietmar Kracht

  • Optics Express Vol. 17, Iss. 20, pp. 18312–18319 (2009)
  • Angela Pirri, Daniele Alderighi, Guido Toci, Matteo Vannini, Martin Nikl, and Hiroki Sato

  • Optics Express Vol. 17, Iss. 20, pp. 18320–18329 (2009)
  • Matthew O. Williams and J. Nathan Kutz

  • Optics Express Vol. 17, Iss. 20, pp. 18387–18393 (2009)
  • J. Lloyd-Hughes, G. Scalari, A. van Kolck, M. Fischer, M. Beck, and J. Faist

Materials

  • Optics Express Vol. 17, Iss. 20, pp. 17227–17233 (2009)
  • Chi-Chang Hong, Hyeyoung Ahn, Chen-Ying Wu, and Shangjr Gwo

  • Optics Express Vol. 17, Iss. 20, pp. 18054–18062 (2009)
  • Kenichiro Iwasaki, Yoshihiro Takahashi, Hirokazu Masai, and Takumi Fujiwara

  • Optics Express Vol. 17, Iss. 20, pp. 18103–18109 (2009)
  • Wei-Ren Liu, Chun Che Lin, Yi-Chen Chiu, Yao-Tsung Yeh, Shyue-Ming Jang, Ru-Shi Liu, and Bing-Ming Cheng

  • Optics Express Vol. 17, Iss. 20, pp. 18165–18170 (2009)
  • HaiZheng Tao, ZhiYong Yang, and Pierre Lucas

  • Optics Express Vol. 17, Iss. 20, pp. 18279–18291 (2009)
  • Sergi Gallego, Andrés Márquez, Stephan Marini, Elena Fernández, Manuel Ortuño, and Inmaculada Pascual

Medical Optics and Biotechnology

  • Optics Express Vol. 17, Iss. 20, pp. 17426–17440 (2009)
  • Arata Miyazawa, Masahiro Yamanari, Shuichi Makita, Masahiro Miura, Keisuke Kawana, Keiichi Iwaya, Hiroshi Goto, and Yoshiaki Yasuno

  • Optics Express Vol. 17, Iss. 20, pp. 17502–17516 (2009)
  • Robert H. Wilson, Malavika Chandra, James Scheiman, Diane Simeone, Barbara McKenna, Julianne Purdy, and Mary-Ann Mycek

  • Optics Express Vol. 17, Iss. 20, pp. 18211–18218 (2009)
  • M. Lesaffre, S. Farahi, M. Gross, P. Delaye, C. Boccara, and F. Ramaz

Metamaterials

  • Optics Express Vol. 17, Iss. 20, pp. 17652–17657 (2009)
  • David J. Cho, Wei Wu, Ekaterina Ponizovskaya, Pratik Chaturvedi, Alexander M. Bratkovsky, Shih-Yuan Wang, Xiang Zhang, Feng Wang, and Y. Ron Shen

  • Optics Express Vol. 17, Iss. 20, pp. 18330–18339 (2009)
  • Matthew J. Dicken, Koray Aydin, Imogen M. Pryce, Luke A. Sweatlock, Elizabeth M. Boyd, Sameer Walavalkar, James Ma, and Harry A. Atwater

  • Optics Express Vol. 17, Iss. 20, pp. 18354–18363 (2009)
  • Zhong Lei Mei and Tie Jun Cui

Nonlinear Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17357–17368 (2009)
  • Thomas Vallaitis, Siegwart Bogatscher, Luca Alloatti, Pieter Dumon, Roel Baets, Michelle L. Scimeca, Ivan Biaggio, François Diederich, Christian Koos, Wolfgang Freude, and Juerg Leuthold

  • Optics Express Vol. 17, Iss. 20, pp. 17582–17589 (2009)
  • Markus Henriksson, Lars Sjöqvist, Valdas Pasiskevicius, and Fredrik Laurell

  • Optics Express Vol. 17, Iss. 20, pp. 17711–17714 (2009)
  • Baozhen Zhao, Yongliang Jiang, Keiich Sueda, Noriaki Miyanaga, and Takayoshi Kobayashi

  • Optics Express Vol. 17, Iss. 20, pp. 17862–17867 (2009)
  • Krishnamoorthy Pandiyan, Yeon Sook Kang, Hwan Hong Lim, Byoung Joo Kim, and Myoungsik Cha

  • Optics Express Vol. 17, Iss. 20, pp. 17874–17887 (2009)
  • Julien Le Gouët, Dheera Venkatraman, Franco N. C. Wong, and Jeffrey H. Shapiro

  • Optics Express Vol. 17, Iss. 20, pp. 17934–17949 (2009)
  • Truong X. Tran and Fabio Biancalana

  • Optics Express Vol. 17, Iss. 20, pp. 17983–17988 (2009)
  • Haohua Tu and Stephen A. Boppart

  • Optics Express Vol. 17, Iss. 20, pp. 18292–18303 (2009)
  • Lei Xu, Guoquan Zhang, Ningning Xu, Fang Bo, Feng Gao, Wande Fan, Jingjun Xu, Kar Pong Lor, and Kin Seng Chiang

  • Optics Express Vol. 17, Iss. 20, pp. 18340–18353 (2009)
  • M. Ebnali-Heidari, C. Monat, C. Grillet, and M. K Moravvej-Farshi

Optical Design and Fabrication

  • Optics Express Vol. 17, Iss. 20, pp. 18083–18092 (2009)
  • Shih-Jung Liu and Yu-Chin Huang

Optical Devices

  • Optics Express Vol. 17, Iss. 20, pp. 17206–17213 (2009)
  • Tianrui Zhai, Ying Zhou, Jing Zhou, and Dahe Liu

  • Optics Express Vol. 17, Iss. 20, pp. 17269–17278 (2009)
  • Qiang Wang, Zhaoqi Deng, and Dongge Ma

  • Optics Express Vol. 17, Iss. 20, pp. 17293–17302 (2009)
  • Dennis Corell, Haiyan Ou, Carsten Dam-Hansen, Paul-Michael Petersen, and Dan Friis

  • Optics Express Vol. 17, Iss. 20, pp. 17457–17470 (2009)
  • M. C. Moolman, W. D. Koek, and H. P. Urbach

  • Optics Express Vol. 17, Iss. 20, pp. 17963–17969 (2009)
  • Levente J. Klein, Snorri Ingvarsson, and Hendrik F. Hamann

Optical Trapping and Manipulation

  • Optics Express Vol. 17, Iss. 20, pp. 17491–17501 (2009)
  • Song-Woo Lee, Gunho Jo, Takhee Lee, and Yong-Gu Lee

  • Optics Express Vol. 17, Iss. 20, pp. 17603–17613 (2009)
  • Wei Wang, Yen-Heng Lin, Ruei-Syuan Guan, Ten-Chin Wen, Tzung-Fang Guo, and Gwo-Bin Lee

  • Optics Express Vol. 17, Iss. 20, pp. 18116–18135 (2009)
  • Peter T. Rakich, Miloš A. Popovic, and Zheng Wang

Optics at Surfaces

  • Optics Express Vol. 17, Iss. 20, pp. 17234–17241 (2009)
  • Hyun Chul Kim and Xing Cheng

  • Optics Express Vol. 17, Iss. 20, pp. 17471–17482 (2009)
  • Yu-Ju Tsai, Aloyse Degiron, Nan M. Jokerst, and David R. Smith

  • Optics Express Vol. 17, Iss. 20, pp. 17483–17490 (2009)
  • T. V. Teperik, A. Archambault, F. Marquier, and J. J. Greffet

  • Optics Express Vol. 17, Iss. 20, pp. 17570–17581 (2009)
  • Ivan D. Rukhlenko, Dayan Handapangoda, Malin Premaratne, Anatoly V. Fedorov, Alexander V. Baranov, and Chennupati Jagadish

  • Optics Express Vol. 17, Iss. 20, pp. 17837–17848 (2009)
  • John S. Q. Liu, Justin S. White, Shanhui Fan, and Mark L. Brongersma

  • Optics Express Vol. 17, Iss. 20, pp. 18184–18195 (2009)
  • Miguel Navarro-Cía, Miguel Beruete, Spyros Agrafiotis, Francisco Falcone, Mario Sorolla, and Stefan A. Maier

Optoelectronics

  • Optics Express Vol. 17, Iss. 20, pp. 18063–18075 (2009)
  • Martijn J.R. Heck, Edcel J. Salumbides, Amandine Renault, Erwin A.J.M. Bente, Yok-Siang Oei, Meint K. Smit, René van Veldhoven, Richard Nötzel, Kjeld S.E. Eikema, and Wim Ubachs

Photonic Crystals

  • Optics Express Vol. 17, Iss. 20, pp. 18038–18043 (2009)
  • Yeheng Wu, Kenneth D. Singer, Rolfe G. Petschek, Hyunmin Song, Eric Baer, and Anne Hiltner

  • Optics Express Vol. 17, Iss. 20, pp. 18093–18102 (2009)
  • Yasushi Takahashi, Yoshinori Tanaka, Hiroyuki Hagino, Tomoyuki Sugiya, Yoshiya Sato, Takashi Asano, and Susumu Noda

  • Optics Express Vol. 17, Iss. 20, pp. 18381–18386 (2009)
  • Ahmet Cicek and Bulent Ulug

Physical Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17517–17529 (2009)
  • N. Mattiucci, G. D’Aguanno, M. Scalora, M. J. Bloemer, and C. Sibilia

  • Optics Express Vol. 17, Iss. 20, pp. 17555–17562 (2009)
  • Gavin D. M. Jeffries, Graham Milne, Yiqiong Zhao, Carlos Lopez-Mariscal, and Daniel T. Chiu

  • Optics Express Vol. 17, Iss. 20, pp. 17970–17975 (2009)
  • Guangyong Zhou, Alexander Jesacher, Martin Booth, Tony Wilson, Airán Ródenas, Daniel Jaque, and Min Gu

  • Optics Express Vol. 17, Iss. 20, pp. 18196–18208 (2009)
  • Yana Izdebskaya, Etienne Brasselet, Vladlen Shvedov, Anton Desyatnikov, Wieslaw Krolikowski, and Yuri Kivshar

Quantum Optics

  • Optics Express Vol. 17, Iss. 20, pp. 18044–18053 (2009)
  • L. A. Stewart, Y. Zhai, J. M. Dawes, M. J. Steel, J. R. Rabeau, and M. J. Withford

Remote Sensing and Sensors

  • Optics Express Vol. 17, Iss. 20, pp. 17391–17411 (2009)
  • Bernard R. Foy, James Theiler, and Andrew M. Fraser

Scattering

  • Optics Express Vol. 17, Iss. 20, pp. 17801–17811 (2009)
  • A. G. Curto, A. Manjavacas, and F. J. García de Abajo

  • Optics Express Vol. 17, Iss. 20, pp. 18110–18115 (2009)
  • M. Ferrario, Lucia Marazzi, Pierpaolo Boffi, Aldo Righetti, and Mario Martinelli

Slow and Fast Light

  • Optics Express Vol. 17, Iss. 20, pp. 17317–17323 (2009)
  • V. I. Kovalev, N. E. Kotova, and R. G. Harrison

  • Optics Express Vol. 17, Iss. 20, pp. 17338–17343 (2009)
  • C. Martijn de Sterke, K. B. Dossou, T. P. White, L. C. Botten, and R. C. McPhedran

  • Optics Express Vol. 17, Iss. 20, pp. 17530–17535 (2009)
  • Yuval Yifat and Jacob Scheuer

Spectroscopy

  • Optics Express Vol. 17, Iss. 20, pp. 17450–17456 (2009)
  • Stefan Funk, Guillermo Acuna, Matthias Handloser, and Roland Kersting

  • Optics Express Vol. 17, Iss. 20, pp. 17723–17733 (2009)
  • Maik Scheller and Martin Koch

Ultrafast Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17376–17383 (2009)
  • M.-C. Chen, M. R. Gerrity, S. Backus, T. Popmintchev, X. Zhou, P. Arpin, X. Zhang, H. C. Kapteyn, and M. M. Murnane

  • Optics Express Vol. 17, Iss. 20, pp. 17636–17644 (2009)
  • A. Husakou and J. Herrmann

  • Optics Express Vol. 17, Iss. 20, pp. 17678–17693 (2009)
  • Justin Gagnon and Vladislav S. Yakovlev

  • Optics Express Vol. 17, Iss. 20, pp. 17700–17710 (2009)
  • Valer Tosa, Katalin Kovacs, Carlo Altucci, and Raffaele Velotta

  • Optics Express Vol. 17, Iss. 20, pp. 17909–17915 (2009)
  • Atalla E. El-Taher, Juan D. Ania-Castañón, Vassilis Karalekas, and Paul Harper

  • Optics Express Vol. 17, Iss. 20, pp. 17989–17995 (2009)
  • Rodislav Driben, Anton Husakou, and Joachim Herrmann

  • Optics Express Vol. 17, Iss. 20, pp. 18148–18164 (2009)
  • Michaël Dallaire, Nathalie McCarthy, and Michel Piché

X-ray Optics

  • Optics Express Vol. 17, Iss. 20, pp. 17669–17677 (2009)
  • Weilun Chao, Jihoon Kim, Senajith Rekawa, Peter Fischer, and Erik H. Anderson

  • Optics Express Vol. 17, Iss. 20, pp. 18271–18278 (2009)
  • A. J. Nelson, S. Toleikis, H. Chapman, S. Bajt, J. Krzywinski, J. Chalupsky, L. Juha, J. Cihelka, V. Hajkova, L. Vysin, T. Burian, M. Kozlova, R.R. Fäustlin, B. Nagler, S.M. Vinko, T. Whitcher, T. Dzelzainis, O. Renner, K. Saksl, A. R. Khorsand, P. A. Heimann, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, B. Iwan, J. Andreasson, N. Timneanu, M. Fajardo, J.S. Wark, D. Riley, T. Tschentscher, J. Hajdu, and R. W. Lee

Errata

Optical Devices

  • Optics Express Vol. 17, Iss. 20, pp. 18209–18210 (2009)
  • Minming Geng, Lianxi Jia, Lei Zhang, Lin Yang, Ping Chen, Tong Wang, and Yuliang Liu
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