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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 20 — Sep. 27, 2010
  • pp: 20552–21510

Optics InfoBase > Optics Express > Volume 18 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Adaptive Optics
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Detectors
  • Fiber Optics and Optical Communications
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optoelectronics
  • Photonic Crystals
  • Physical Optics
  • Remote Sensing
  • Scattering
  • Sensors
  • Slow and Fast Light
  • Thin Films
  • Ultrafast Optics
  • Vision, Color, and Visual Optics
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Adaptive Optics

  • Optics Express Vol. 18, Iss. 20, pp. 21356–21369 (2010)
  • Dani Guzmán, Francisco Javier de Cos Juez, Richard Myers, Andrés Guesalaga, and Fernando Sánchez Lasheras

Atmospheric and Oceanic Optics

  • Optics Express Vol. 18, Iss. 20, pp. 21147–21154 (2010)
  • ChingSeong Tan, Gerald Seet, Andrzej Sluzek, Xin Wang, Chai Tong Yuen, Chen Yep Fam, and Hin Yong Wong

  • Optics Express Vol. 18, Iss. 20, pp. 21269–21283 (2010)
  • Cui Lin-yan, Xue Bin-dang, Cao Xiao-guang, Dong Jian-kang, and Wang Jie-ning

Atomic and Molecular Physics

  • Optics Express Vol. 18, Iss. 20, pp. 21062–21073 (2010)
  • Zhenzhong Lu, Deying Chen, Yuanqin Xia, Rongwei Fan, and Hongying Zhang

Coherence and Statistical Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20746–20758 (2010)
  • Deva K. Borah and David G. Voelz

Detectors

  • Optics Express Vol. 18, Iss. 20, pp. 20960–20967 (2010)
  • Brian A. Slovick, Jeffrey A. Bean, Peter M. Krenz, and Glenn D. Boreman

Fiber Optics and Optical Communications

  • Optics Express Vol. 18, Iss. 20, pp. 20552–20557 (2010)
  • Devang Parekh, Bo Zhang, Xiaoxue Zhao, Yang Yue, Werner Hofmann, Markus C. Amann, Alan Willner, and Connie J. Chang-Hasnain

  • Optics Express Vol. 18, Iss. 20, pp. 20565–20571 (2010)
  • Tatsushi Nakahara, Hirokazu Takenouchi, Ryohei Urata, Hiroshi Yamazaki, and Ryo Takahashi

  • Optics Express Vol. 18, Iss. 20, pp. 20595–20609 (2010)
  • Li Yang, Lin-Lin Xue, Yu-Chun Lu, and Wei-Ping Huang

  • Optics Express Vol. 18, Iss. 20, pp. 20651–20660 (2010)
  • Mohammad E. Mousa-Pasandi and David V. Plant

  • Optics Express Vol. 18, Iss. 20, pp. 20661–20666 (2010)
  • R. Peretti, A.M. Jurdyc, B. Jacquier, E. Burov, and A. Pastouret

  • Optics Express Vol. 18, Iss. 20, pp. 20732–20745 (2010)
  • J. L. Wei, C. Sánchez, R. P. Giddings, E. Hugues-Salas, and J. M. Tang

  • Optics Express Vol. 18, Iss. 20, pp. 20774–20785 (2010)
  • Chia Chien Wei and Jason (Jyehong) Chen

  • Optics Express Vol. 18, Iss. 20, pp. 20918–20925 (2010)
  • Woosung Ha, Sejin Lee, Jongki Kim, Yoonseob Jeong, Kyunghwan Oh, Jens Kobelke, Kay Schuster, Sonja Unger, Anka Schwuchow, and Jun Ki Kim

  • Optics Express Vol. 18, Iss. 20, pp. 21100–21110 (2010)
  • X. Q. Jin, R. P. Giddings, E. Hugues-Salas, and J. M. Tang

  • Optics Express Vol. 18, Iss. 20, pp. 21121–21130 (2010)
  • Yunhong Ding, Christophe Peucheret, Minhao Pu, Beata Zsigri, Jorge Seoane, Liu Liu, Jing Xu, Haiyan Ou, Xinliang Zhang, and Dexiu Huang

  • Optics Express Vol. 18, Iss. 20, pp. 21162–21168 (2010)
  • Guiling Wu, Siqi Li, Xinwan Li, and Jianping Chen

  • Optics Express Vol. 18, Iss. 20, pp. 21261–21268 (2010)
  • M. Liu and K. S. Chiang

  • Optics Express Vol. 18, Iss. 20, pp. 21308–21314 (2010)
  • Wonzoo Chung

  • Optics Express Vol. 18, Iss. 20, pp. 21315–21321 (2010)
  • Kazi S. Abedin and Masataka Nakazawa

  • Optics Express Vol. 18, Iss. 20, pp. 21342–21349 (2010)
  • Fatih Yaman, Neng Bai, Y. K. Huang, M. F. Huang, B. Zhu, Ting Wang, and Guifang Li

  • Optics Express Vol. 18, Iss. 20, pp. 21376–21385 (2010)
  • Takahiro Kodama, Nobuyuki Kataoka, Naoya Wada, Gabriella Cincotti, Xu Wang, Tetsuya Miyazaki, and Ken-ichi Kitayama

  • Optics Express Vol. 18, Iss. 20, pp. 21404–21409 (2010)
  • L.-S. Yan, A.-L. Yi, W. Pan, B. Luo, and J. Ye

  • Optics Express Vol. 18, Iss. 20, pp. 21477–21483 (2010)
  • A. Pape, O. Terra, J. Friebe, M. Riedmann, T. Wübbena, E. M. Rasel, K. Predehl, T. Legero, B. Lipphardt, H. Schnatz, and G. Grosche

Image Processing

  • Optics Express Vol. 18, Iss. 20, pp. 20699–20711 (2010)
  • Anna Burvall, Harrison H. Barrett, Kyle J. Myers, and Christopher Dainty

  • Optics Express Vol. 18, Iss. 20, pp. 21003–21012 (2010)
  • Evgeniy Lebed, Paul J. Mackenzie, Marinko V. Sarunic, and Faisal M. Beg

Imaging Systems

  • Optics Express Vol. 18, Iss. 20, pp. 20628–20637 (2010)
  • Jisoo Hong, Youngmin Kim, Soon-gi Park, Jong-Ho Hong, Sung-Wook Min, Sin-Doo Lee, and Byoungho Lee

  • Optics Express Vol. 18, Iss. 20, pp. 20723–20731 (2010)
  • Chia-Lung Hsieh, Ye Pu, Rachel Grange, Grégoire Laporte, and Demetri Psaltis

  • Optics Express Vol. 18, Iss. 20, pp. 21238–21251 (2010)
  • David R. Smith, Yaroslav Urzhumov, Nathan B. Kundtz, and Nathan I. Landy

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 18, Iss. 20, pp. 20572–20584 (2010)
  • Giorgio Brida, Ivo Pietro Degiovanni, Marco Genovese, Maria Luisa Rastello, and Ivano Ruo Berchera

  • Optics Express Vol. 18, Iss. 20, pp. 20585–20594 (2010)
  • Luděk Lovicar, Jiří Komrska, and Radim Chmelík

  • Optics Express Vol. 18, Iss. 20, pp. 20620–20627 (2010)
  • Jiancheng Xu, Qiao Xu, Liqun Chai, Yong Li, and Hui Wang

  • Optics Express Vol. 18, Iss. 20, pp. 20759–20773 (2010)
  • Andrew Sutton, Kirk McKenzie, Brent Ware, and Daniel A. Shaddock

  • Optics Express Vol. 18, Iss. 20, pp. 20827–20838 (2010)
  • Norimasa Yoshimizu, Amit Lal, and Clifford R. Pollock

  • Optics Express Vol. 18, Iss. 20, pp. 21131–21137 (2010)
  • Maximino Avendaño-Alejo, Dulce González-Utrera, Naser Qureshi, Luis Castañeda, and César Ordóñez-Romero

  • Optics Express Vol. 18, Iss. 20, pp. 21169–21182 (2010)
  • Tsung-Chih Yu, Yu-Lung Lo, and Rei-Rong Huang

  • Optics Express Vol. 18, Iss. 20, pp. 21410–21418 (2010)
  • R. Petkovšek, Jaka Petelin, J. Možina, and F. Bammer

Integrated Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20690–20698 (2010)
  • Chi Xiong, Wolfram H.P. Pernice, Mo Li, and Hong X. Tang

  • Optics Express Vol. 18, Iss. 20, pp. 20839–20844 (2010)
  • Sara Mas, José Caraquitena, José V. Galán, Pablo Sanchis, and Javier Martí

Laser Microfabrication

  • Optics Express Vol. 18, Iss. 20, pp. 21090–21099 (2010)
  • Alexander Jesacher and Martin J. Booth

  • Optics Express Vol. 18, Iss. 20, pp. 21198–21203 (2010)
  • A. I. Kuznetsov, R. Kiyan, and B. N. Chichkov

  • Optics Express Vol. 18, Iss. 20, pp. 21490–21497 (2010)
  • Sheeba Rajesh and Yves Bellouard

Lasers and Laser Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20712–20722 (2010)
  • Kolja Beil, Susanne T. Fredrich-Thornton, Friedjof Tellkamp, Rigo Peters, Christian Kränkel, Klaus Petermann, and Günter Huber

  • Optics Express Vol. 18, Iss. 20, pp. 20793–20798 (2010)
  • Xavier Mateos, Venkatesan Jambunathan, Maria Cinta Pujol, Joan Josep Carvajal, Francesc Díaz, Magdalena Aguiló, Uwe Griebner, and Valentin Petrov

  • Optics Express Vol. 18, Iss. 20, pp. 20799–20816 (2010)
  • Pierre Gellie, Stefano Barbieri, Jean-François Lampin, Pascal Filloux, Christophe Manquest, Carlo Sirtori, Isabelle Sagnes, Suraj P. Khanna, Edmund H. Linfield, A. Giles Davies, Harvey Beere, and David Ritchie

  • Optics Express Vol. 18, Iss. 20, pp. 20887–20893 (2010)
  • Weijian Yang, Peng Guo, Devang Parekh, and Connie J. Chang-Hasnain

  • Optics Express Vol. 18, Iss. 20, pp. 20979–20987 (2010)
  • Zhiyun Huang, Gaoming Li, and Yishen Qiu

  • Optics Express Vol. 18, Iss. 20, pp. 21047–21052 (2010)
  • Xing Fu, Qiang Liu, Xingpeng Yan, Qi Wang, and Mali Gong

  • Optics Express Vol. 18, Iss. 20, pp. 21330–21341 (2010)
  • M. E. Barnes, Z. Mihoubi, K. G. Wilcox, A. H. Quarterman, I. Farrer, D. A. Ritchie, A. Garnache, S. Hoogland, V. Apostolopoulos, and A. C. Tropper

  • Optics Express Vol. 18, Iss. 20, pp. 21370–21375 (2010)
  • Xiaodong Xu, Shishu Cheng, Junqing Meng, Dongzhen Li, Dahua Zhou, Lihe Zheng, Jun Xu, Witold Ryba-Romanowski, and Radosław Lisiecki

Materials

  • Optics Express Vol. 18, Iss. 20, pp. 20852–20861 (2010)
  • J. Villarroel, J. Carnicero, F. Luedtke, M. Carrascosa, A. García-Cabañes, J. M. Cabrera, A. Alcazar, and B. Ramiro

  • Optics Express Vol. 18, Iss. 20, pp. 21138–21146 (2010)
  • Zijun Liu, Nengli Dai, Huaixun Luan, Yubang Sheng, Jinggang Peng, Zuowen Jiang, Haiqing Li, Luyun Yang, and Jinyan Li

Medical Optics and Biotechnology

  • Optics Express Vol. 18, Iss. 20, pp. 20988–21002 (2010)
  • Jie Tian, Kai Liu, Yujie Lu, Chenghu Qin, Xin Yang, Shouping Zhu, Dong Han, Jinchao Feng, Xibo Ma, and Zhijun Chang

  • Optics Express Vol. 18, Iss. 20, pp. 21074–21082 (2010)
  • Bevin Lin, Shiro Urayama, Ramez M. G. Saroufeem, Dennis L. Matthews, and Stavros G. Demos

  • Optics Express Vol. 18, Iss. 20, pp. 21183–21197 (2010)
  • Sucbei Moon, Sang-Won Lee, Marc Rubinstein, Brian J. F. Wong, and Zhongping Chen

  • Optics Express Vol. 18, Iss. 20, pp. 21293–21307 (2010)
  • Qi Yang, Charles A. Reisman, Zhenguo Wang, Yasufumi Fukuma, Masanori Hangai, Nagahisa Yoshimura, Atsuo Tomidokoro, Makoto Araie, Ali S. Raza, Donald C. Hood, and Kinpui Chan

Metamaterials

  • Optics Express Vol. 18, Iss. 20, pp. 20912–20917 (2010)
  • Yuehui Lu, Joo Yull Rhee, Won Ho Jang, and Young Pak Lee

Microscopy

  • Optics Express Vol. 18, Iss. 20, pp. 21225–21237 (2010)
  • Nadine Gröner, Jérémie Capoulade, Christoph Cremer, and Malte Wachsmuth

Nonlinear Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20786–20792 (2010)
  • Xing Zhu, Hong Wang, and Li-Xian Zheng

  • Optics Express Vol. 18, Iss. 20, pp. 21024–21029 (2010)
  • Marco Santagiustina, Carlo G. Someda, Giovanni Vadala', Sylvain Combrie', and Alfredo De Rossi

  • Optics Express Vol. 18, Iss. 20, pp. 21449–21460 (2010)
  • Slaven Moro, Ana Peric, Nikola Alic, Bryan Stossel, and Stojan Radic

  • Optics Express Vol. 18, Iss. 20, pp. 21484–21489 (2010)
  • Chul Kang, Yeung Lak Lee, Changsoo Jung, Hyung Keun Yoo, and Chul-Sik Kee

  • Optics Express Vol. 18, Iss. 20, pp. 21504–21510 (2010)
  • P. Prem Kiran, Suman Bagchi, Cord L. Arnold, Siva Rama Krishnan, G. Ravindra Kumar, and Arnaud Couairon

Optical Design and Fabrication

  • Optics Express Vol. 18, Iss. 20, pp. 20876–20886 (2010)
  • Lei Li, Qiong-Hua Wang, Xiao-Qing Xu, and Da-Hai Li

  • Optics Express Vol. 18, Iss. 20, pp. 20926–20938 (2010)
  • Fei Chen, Kai Wang, Zong Qin, Dan Wu, Xiaobing Luo, and Sheng Liu

  • Optics Express Vol. 18, Iss. 20, pp. 20968–20978 (2010)
  • Reinhard Voelkel, Uwe Vogler, Andreas Bich, Pascal Pernet, Kenneth J. Weible, Michael Hornung, Ralph Zoberbier, Elmar Cullmann, Lorenz Stuerzebecher, Torsten Harzendorf, and Uwe D. Zeitner

Optical Devices

  • Optics Express Vol. 18, Iss. 20, pp. 21427–21448 (2010)
  • Chethiya M. Dissanayake, Malin Premaratne, Ivan D. Rukhlenko, and Govind P. Agrawal

  • Optics Express Vol. 18, Iss. 20, pp. 21461–21476 (2010)
  • Etgar C. Levy, Olukayode Okusaga , Moshe Horowitz, Curtis R. Menyuk, Weimin Zhou, and Gary M. Carter

Optical Trapping and Manipulation

  • Optics Express Vol. 18, Iss. 20, pp. 21053–21061 (2010)
  • Balpreet Singh Ahluwalia, Peter McCourt, Thomas Huser, and Olav Gaute Hellesø

Optics at Surfaces

  • Optics Express Vol. 18, Iss. 20, pp. 20610–20619 (2010)
  • Eloïse Devaux, Jean-Yves Laluet, Benedikt Stein, Cyriaque Genet, Thomas Ebbesen, Jean-Claude Weeber, and Alain Dereux

  • Optics Express Vol. 18, Iss. 20, pp. 20939–20948 (2010)
  • Changjun Min and Georgios Veronis

  • Optics Express Vol. 18, Iss. 20, pp. 21013–21023 (2010)
  • P. David Flammer, Jonathan M. Banks, Thomas E. Furtak, Charles G. Durfee, Russell E. Hollingsworth, and Reuben T. Collins

  • Optics Express Vol. 18, Iss. 20, pp. 21030–21037 (2010)
  • Mingbo Pu, Na Yao, Chenggang Hu, Xuecheng Xin, Zeyu Zhao, Changtao Wang, and Xiangang Luo

  • Optics Express Vol. 18, Iss. 20, pp. 21219–21224 (2010)
  • W. L. Zhang and S. F. Yu

  • Optics Express Vol. 18, Iss. 20, pp. 21498–21503 (2010)
  • Wangshi Zhao, Omar M. Eldaiki, Ruoxi Yang, and Zhaolin Lu

Optoelectronics

  • Optics Express Vol. 18, Iss. 20, pp. 21038–21046 (2010)
  • Ismail Emre Araci, Roland Himmelhuber, Chris T. DeRose, J. D. Luo, A. K.-Y. Jen, R. A. Norwood, and N. Peyghambarian

  • Optics Express Vol. 18, Iss. 20, pp. 21204–21218 (2010)
  • Niels Gregersen, Torben Roland Nielsen, Jesper Mørk, Julien Claudon, and Jean-Michel Gérard

  • Optics Express Vol. 18, Iss. 20, pp. 21322–21329 (2010)
  • John Henson, Emmanouil Dimakis, Jeff DiMaria, Rui Li, Salvatore Minissale, Luca Dal Negro, Theodore D. Moustakas, and Roberto Paiella

Photonic Crystals

  • Optics Express Vol. 18, Iss. 20, pp. 20558–20564 (2010)
  • B. C. Richards, J. Hendrickson, J. D. Olitzky, R. Gibson, M. Gehl, K. Kieu, U. K. Khankhoje, A. Homyk, A. Scherer, J.-Y. Kim, Y.-H. Lee, G. Khitrova, and H. M. Gibbs

  • Optics Express Vol. 18, Iss. 20, pp. 20894–20899 (2010)
  • Chia-Tsung Chan and J. Andrew Yeh

  • Optics Express Vol. 18, Iss. 20, pp. 21397–21403 (2010)
  • Snjezana Tomljenovic-Hanic and C. Martijn de Sterke

Physical Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20681–20689 (2010)
  • Shlomo Ruschin

  • Optics Express Vol. 18, Iss. 20, pp. 20817–20826 (2010)
  • R. Martínez-Herrero, P. M. Mejías, and A. Manjavacas

  • Optics Express Vol. 18, Iss. 20, pp. 21111–21120 (2010)
  • Néstor Uribe-Patarroyo, Alberto Alvarez-Herrero, and Tomás Belenguer

  • Optics Express Vol. 18, Iss. 20, pp. 21419–21426 (2010)
  • Yuan Shen, Kun Ding, Wujiong Sun, and Lei Zhou

Remote Sensing

  • Optics Express Vol. 18, Iss. 20, pp. 20845–20851 (2010)
  • Françoise Viallefont-Robinet

  • Optics Express Vol. 18, Iss. 20, pp. 20862–20875 (2010)
  • Damien Josset, Peng-Wang Zhai, Yongxiang Hu, Jacques Pelon, and Patricia L. Lucker

  • Optics Express Vol. 18, Iss. 20, pp. 20949–20959 (2010)
  • Hubert Loisel, Bertrand Lubac, David Dessailly, Lucile Duforet-Gaurier, and Vincent Vantrepotte

Scattering

  • Optics Express Vol. 18, Iss. 20, pp. 21083–21089 (2010)
  • Lan Ding, Jinsong Liu, Dong Wang, and Kejia Wang

Sensors

  • Optics Express Vol. 18, Iss. 20, pp. 20638–20644 (2010)
  • Shinyoung Lee, Seok Chan Eom, Jee Soo Chang, Chul Huh, Gun Yong Sung, and Jung H. Shin

Slow and Fast Light

  • Optics Express Vol. 18, Iss. 20, pp. 21155–21161 (2010)
  • Kadir Üstün and Hamza Kurt

Thin Films

  • Optics Express Vol. 18, Iss. 20, pp. 21284–21292 (2010)
  • Chad M. Eliason and Matthew D. Shawkey

Ultrafast Optics

  • Optics Express Vol. 18, Iss. 20, pp. 20645–20650 (2010)
  • Jun Liu, Kotaro Okamura, Yuichiro Kida, Takahiro Teramoto, and Takayoshi Kobayashi

  • Optics Express Vol. 18, Iss. 20, pp. 20667–20672 (2010)
  • Nicoletta Brauckmann, Michael Kues, Petra Groß, and Carsten Fallnich

  • Optics Express Vol. 18, Iss. 20, pp. 20673–20680 (2010)
  • Y. Senoo, N. Nishizawa, Y. Sakakibara, K. Sumimura, E. Itoga, H. Kataura, and K. Itoh

  • Optics Express Vol. 18, Iss. 20, pp. 20900–20911 (2010)
  • Omel Mendoza-Yero, Benjamín Alonso, Oscar Varela, Gladys Mínguez-Vega, Íñigo Juan Sola, Jesús Lancis, Vicent Climent, and Luis Roso

  • Optics Express Vol. 18, Iss. 20, pp. 21252–21260 (2010)
  • Matthew O. Williams, Colin W. McGrath, and J. Nathan Kutz

  • Optics Express Vol. 18, Iss. 20, pp. 21350–21355 (2010)
  • K. Kieu, R. J. Jones, and N. Peyghambarian

Vision, Color, and Visual Optics

  • Optics Express Vol. 18, Iss. 20, pp. 21386–21396 (2010)
  • C. Leahy and C. Dainty
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