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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 22 — Oct. 25, 2010
  • pp: 22614–23516

Optics InfoBase > Optics Express > Volume 18 > Issue 22 > Table of Contents

Topics in this Issue

 
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Remote Sensing
  • Scattering
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
  • X-ray Optics
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Atomic and Molecular Physics

  • Optics Express Vol. 18, Iss. 22, pp. 23016–23023 (2010)
  • Gang Chen, Yongping Zhang, Liantuan Xiao, J. -Q. Liang, and Suotang Jia

Coherence and Statistical Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22826–22832 (2010)
  • Zhangrong Mei

Detectors

  • Optics Express Vol. 18, Iss. 22, pp. 22833–22841 (2010)
  • Ryan P. Shea, Anand S. Gawarikar, and Joseph J. Talghader

Diffraction and Gratings

  • Optics Express Vol. 18, Iss. 22, pp. 22772–22780 (2010)
  • Jia-Han Li, Chih-Hong Lin, Yao-Jen Tsai, Yi-Wei Cheng, and Tony Wen-Hann Sheu

  • Optics Express Vol. 18, Iss. 22, pp. 22850–22858 (2010)
  • Ismo Vartiainen, Jani Tervo, Jari Turunen, and Markku Kuittinen

  • Optics Express Vol. 18, Iss. 22, pp. 23258–23274 (2010)
  • Sabine Essig and Kurt Busch

Fiber Optics and Optical Communications

  • Optics Express Vol. 18, Iss. 22, pp. 22677–22685 (2010)
  • Ariane Stiebeiner, Ruth Garcia-Fernandez, and Arno Rauschenbeutel

  • Optics Express Vol. 18, Iss. 22, pp. 22796–22807 (2010)
  • Rameez Asif, Chien-Yu Lin, M. Holtmannspoetter, and Bernhard Schmauss

  • Optics Express Vol. 18, Iss. 22, pp. 22906–22914 (2010)
  • Mikel Sagues and Alayn Loayssa

  • Optics Express Vol. 18, Iss. 22, pp. 22982–22987 (2010)
  • Jie Liu, Duoduo Zeng, Changjian Guo, Lei Xu, and Sailing He

  • Optics Express Vol. 18, Iss. 22, pp. 23062–23069 (2010)
  • Guo-Wei Lu, Mats Sköld, Pontus Johannisson, Jian Zhao, Martin Sjödin, Henrik Sunnerud, Mathias Westlund, Andrew Ellis, and Peter A. Andrekson

  • Optics Express Vol. 18, Iss. 22, pp. 23133–23146 (2010)
  • Luca Vincetti and Valerio Setti

  • Optics Express Vol. 18, Iss. 22, pp. 23161–23172 (2010)
  • Lenin Mehedy, Masuduzzaman Bakaul, and Ampalavanapillai Nirmalathas

  • Optics Express Vol. 18, Iss. 22, pp. 23212–23217 (2010)
  • Siddharth Ramachandran, Christian Smith, Poul Kristensen, and Peter Balling

  • Optics Express Vol. 18, Iss. 22, pp. 23324–23330 (2010)
  • Hyun-Soo Kim, Dong Churl Kim, Ki-Soo Kim, Byung-Seok Choi, and O-Kyun Kwon

  • Optics Express Vol. 18, Iss. 22, pp. 23371–23377 (2010)
  • Ivan B. Djordjevic, Lei Xu, and Ting Wang

  • Optics Express Vol. 18, Iss. 22, pp. 23428–23434 (2010)
  • Benyuan Zhu

Image Processing

  • Optics Express Vol. 18, Iss. 22, pp. 22651–22676 (2010)
  • Ljubomir Jovanov, Aleksandra Pižurica, and Wilfried Philips

  • Optics Express Vol. 18, Iss. 22, pp. 22817–22825 (2010)
  • Laura Waller, Shan Shan Kou, Colin J. R. Sheppard, and George Barbastathis

  • Optics Express Vol. 18, Iss. 22, pp. 22859–22866 (2010)
  • Tapio Fabritius, Risto Myllylä, Shuichi Makita, and Yoshiaki Yasuno

  • Optics Express Vol. 18, Iss. 22, pp. 23472–23487 (2010)
  • Kang Zhang and Jin U. Kang

Imaging Systems

  • Optics Express Vol. 18, Iss. 22, pp. 23041–23053 (2010)
  • Ryoichi Horisaki and Jun Tanida

  • Optics Express Vol. 18, Iss. 22, pp. 23331–23342 (2010)
  • Jue-Chin Yu and Peichen Yu

  • Optics Express Vol. 18, Iss. 22, pp. 23394–23405 (2010)
  • Laure Fauch, Ervin Nippolainen, Victor Teplov, and Alexei A. Kamshilin

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 18, Iss. 22, pp. 22722–22733 (2010)
  • Oliver Otto, Fabian Czerwinski, Joanne L. Gornall, Gunter Stober, Lene B. Oddershede, Ralf Seidel, and Ulrich F. Keyser

  • Optics Express Vol. 18, Iss. 22, pp. 23095–23103 (2010)
  • Paul Anton Letnes, Ingar Stian Nerbø, Lars Martin S. Aas, Pål Gunnar Ellingsen, and Morten Kildemo

  • Optics Express Vol. 18, Iss. 22, pp. 23236–23246 (2010)
  • M. L. Gorodetsky, A. Schliesser, G. Anetsberger, S. Deleglise, and T. J. Kippenberg

  • Optics Express Vol. 18, Iss. 22, pp. 23358–23370 (2010)
  • Jean-Daniel Deschênes, Philippe Giaccarri, and Jérôme Genest

  • Optics Express Vol. 18, Iss. 22, pp. 23378–23384 (2010)
  • Kye-Sung Lee, Kevin P. Thompson, and Jannick P. Rolland

Integrated Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22747–22761 (2010)
  • Tom Claes, Wim Bogaerts, and Peter Bienstman

  • Optics Express Vol. 18, Iss. 22, pp. 22867–22879 (2010)
  • D.-X. Xu, M. Vachon, A. Densmore, R. Ma, S. Janz, A. Delâge, J. Lapointe, P. Cheben, J. H. Schmid, E. Post, Sonia Messaoudène, and Jean-Marc Fédéli

  • Optics Express Vol. 18, Iss. 22, pp. 23035–23040 (2010)
  • Haixi Zhang and Ho-Pui Ho

  • Optics Express Vol. 18, Iss. 22, pp. 23079–23087 (2010)
  • Lian-Wee Luo, Salah Ibrahim, Arthur Nitkowski, Zhi Ding, Carl B. Poitras, S. J. Ben Yoo, and Michal Lipson

  • Optics Express Vol. 18, Iss. 22, pp. 23183–23195 (2010)
  • Kamal Muhieddine, Anatole Lupu, Eric Cassan, and Jean-Michel Lourtioz

  • Optics Express Vol. 18, Iss. 22, pp. 23466–23471 (2010)
  • Shashank Pandey, Gagan Kumar, and Ajay Nahata

Laser Microfabrication

  • Optics Express Vol. 18, Iss. 22, pp. 23488–23494 (2010)
  • Fernando Brandi, Nicolas Burdet, Riccardo Carzino, and Alberto Diaspro

Lasers and Laser Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22715–22721 (2010)
  • Jochen B. Schroeder, Stéphane Coen, Thibaut Sylvestre, and Benjamin J. Eggleton

  • Optics Express Vol. 18, Iss. 22, pp. 22781–22788 (2010)
  • Kenji Numata, Jordan Camp, Michael A. Krainak, and Lew Stolpner

  • Optics Express Vol. 18, Iss. 22, pp. 22880–22885 (2010)
  • Jinsong Liu, Yong Liu, Jiantao Lü, and Kejia Wang

  • Optics Express Vol. 18, Iss. 22, pp. 22928–22936 (2010)
  • Francois Anquez, Emmanuel Courtade, Aude Sivéry, Pierre Suret, and Stéphane Randoux

  • Optics Express Vol. 18, Iss. 22, pp. 22964–22972 (2010)
  • Yulong Tang, Lin Xu, Yi Yang, and Jianqiu Xu

  • Optics Express Vol. 18, Iss. 22, pp. 22996–23008 (2010)
  • R. M. Oldenbeuving, C. J. Lee, P. D. Van Voorst, H. L. Offerhaus, and K. -. Boller

  • Optics Express Vol. 18, Iss. 22, pp. 23024–23029 (2010)
  • Dong Mao, Xueming Liu, Leiran Wang, Hua Lu, and Huan Feng

  • Optics Express Vol. 18, Iss. 22, pp. 23054–23061 (2010)
  • Amos Martinez, Kazuyuki Fuse, Bo Xu, and Shinji Yamashita

Materials

  • Optics Express Vol. 18, Iss. 22, pp. 23275–23284 (2010)
  • Haitao Guo, Chaoqi Hou, Fei Gao, Aoxiang Lin, Pengfei Wang, Zhiguang Zhou, Min Lu, Wei Wei, and Bo Peng

  • Optics Express Vol. 18, Iss. 22, pp. 23495–23503 (2010)
  • Volker Dieckmann, Kristin Springfeld, Sebastian Eicke, Mirco Imlau, and Jeffrey J. Rack

Medical Optics and Biotechnology

  • Optics Express Vol. 18, Iss. 22, pp. 23153–23160 (2010)
  • Ting-Hsiang Wu, Tara Teslaa, Michael A. Teitell, and Pei-Yu Chiou

  • Optics Express Vol. 18, Iss. 22, pp. 23247–23257 (2010)
  • Mohamadreza Najiminaini, Fartash Vasefi, Kenneth M. Tichauer, Ting-Yim Lee, Bozena Kaminska, and Jeffrey J. L. Carson

  • Optics Express Vol. 18, Iss. 22, pp. 23285–23295 (2010)
  • Woo June Choi, Do In Jeon, Sang-Gun Ahn, Jung-Hoon Yoon, Sungho Kim, and Byeong Ha Lee

  • Optics Express Vol. 18, Iss. 22, pp. 23435–23441 (2010)
  • Marinko V. Sarunic, Azadeh Yazdanpanah, Eli Gibson, Jing Xu, Yujing Bai, Sieun Lee, H. Uri Saragovi, and Mirza Faisal Beg

Metamaterials

  • Optics Express Vol. 18, Iss. 22, pp. 22631–22636 (2010)
  • Dexin Ye, Shan Qiao, Jiangtao Huangfu, and Lixin Ran

  • Optics Express Vol. 18, Iss. 22, pp. 22734–22746 (2010)
  • Dmitriy Korobkin, Burton Neuner III, Chris Fietz, Nikoletta Jegenyes, Gabriel Ferro, and Gennady Shvets

  • Optics Express Vol. 18, Iss. 22, pp. 23196–23203 (2010)
  • Bo Zhu, Yijun Feng, Junming Zhao, Ci Huang, Zhengbin Wang, and Tian Jiang

Microscopy

  • Optics Express Vol. 18, Iss. 22, pp. 22693–22701 (2010)
  • Ori Katz, Jonathan M. Levitt, Eran Grinvald, and Yaron Silberberg

  • Optics Express Vol. 18, Iss. 22, pp. 22886–22905 (2010)
  • Hendrik Deschout, Joel Hagman, Sophia Fransson, Jenny Jonasson, Mats Rudemo, Niklas Lorén, and Kevin Braeckmans

Nonlinear Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22637–22650 (2010)
  • Chen-Cheng Wu, Tai-Min Liu, Tai-Ying Wei, Li Xin, Yi-Ci Li, Li-Shu Lee, Che-Kai Chang, Jaw-Luen Tang, Sidney S. Yang, and Tai-Huei Wei

  • Optics Express Vol. 18, Iss. 22, pp. 22686–22692 (2010)
  • Pavel Sidorenko, Maxim Kozlov, Alon Bahabad, Tenio Popmintchev, Margaret Murnane, Henry Kapteyn, and Oren Cohen

  • Optics Express Vol. 18, Iss. 22, pp. 22915–22927 (2010)
  • C. Monat, M. Ebnali-Heidari, C. Grillet, B. Corcoran, B. J. Eggleton, T. P. White, L. O’Faolain, J. Li, and T. F. Krauss

  • Optics Express Vol. 18, Iss. 22, pp. 23121–23132 (2010)
  • Neal Radwell, Patrick Rose, Carsten Cleff, Cornelia Denz, and Thorsten Ackemann

  • Optics Express Vol. 18, Iss. 22, pp. 23173–23182 (2010)
  • Mark D. Thomson, Volker Blank, and Hartmut G. Roskos

  • Optics Express Vol. 18, Iss. 22, pp. 23218–23225 (2010)
  • Ronja Bäumner, Luigi Bonacina, Jörg Enderlein, Jèrôme Extermann, Thomas Fricke-Begemann, Gerd Marowsky, and Jean-Pierre Wolf

  • Optics Express Vol. 18, Iss. 22, pp. 23413–23419 (2010)
  • Slaven Moro, Aleksandar Danicic, Nikola Alic, Bryan Stossel, and Stojan Radic

Optical Design and Fabrication

  • Optics Express Vol. 18, Iss. 22, pp. 22973–22981 (2010)
  • Hao Hu, Yifan Dai, and Xiaoqiang Peng

  • Optics Express Vol. 18, Iss. 22, pp. 23296–23301 (2010)
  • Lewis G. Carpenter, Christopher Holmes, Helen L. Rogers, Peter G.R. Smith, and James C. Gates

Optical Devices

  • Optics Express Vol. 18, Iss. 22, pp. 22614–22624 (2010)
  • Hamid Pahlevaninezhad and Thomas E. Darcie

  • Optics Express Vol. 18, Iss. 22, pp. 22842–22849 (2010)
  • Jung Hwa Her, Suck Jae Shin, Young Jin Lim, Kyoung Ho Park, Joun Ho Lee, Byeong Koo Kim, Gi-Dong Lee, and Seung Hee Lee

  • Optics Express Vol. 18, Iss. 22, pp. 23030–23034 (2010)
  • Byung-Jae Kim, Michael A. Mastro, Jennifer Hite, Charles R. Eddy, and Jihyun Kim

  • Optics Express Vol. 18, Iss. 22, pp. 23406–23412 (2010)
  • Kuei-Ting Chen, Wan-Chun Huang, Tsung-Han Hsieh, Chang-Hua Hsieh, and Chia-Feng Lin

  • Optics Express Vol. 18, Iss. 22, pp. 23442–23457 (2010)
  • Mohammadreza Khorasaninejad and Simarjeet Singh Saini

Optics at Surfaces

  • Optics Express Vol. 18, Iss. 22, pp. 23009–23015 (2010)
  • Tobias Holmgaard, Jacek Gosciniak, and Sergey I. Bozhevolnyi

  • Optics Express Vol. 18, Iss. 22, pp. 23226–23235 (2010)
  • Audrey Berrier, Ronald Ulbricht, Mischa Bonn, and Jaime Gómez Rivas

  • Optics Express Vol. 18, Iss. 22, pp. 23302–23313 (2010)
  • Anil K. Kodali, Matthew V. Schulmerich, Rohun Palekar, Xavier Llora, and Rohit Bhargava

  • Optics Express Vol. 18, Iss. 22, pp. 23314–23323 (2010)
  • Tzu-Hsiang Lan and Chung-Hao Tien

  • Optics Express Vol. 18, Iss. 22, pp. 23385–23393 (2010)
  • Dongjiang Qiu, Zhengfen Wan, Xikun Cai, Zijian Yuan, Lian Hu, Bingpo Zhang, Chunfeng Cai, and Huizhen Wu

  • Optics Express Vol. 18, Iss. 22, pp. 23458–23465 (2010)
  • Yanhui Zhao, Sz-Chin Steven Lin, Ahmad Ahsan Nawaz, Brian Kiraly, Qingzhen Hao, Yanjun Liu, and Tony Jun Huang

Photonic Crystals

  • Optics Express Vol. 18, Iss. 22, pp. 22702–22714 (2010)
  • Mohamed El Beheiry, Victor Liu, Shanhui Fan, and Ofer Levi

  • Optics Express Vol. 18, Iss. 22, pp. 22808–22816 (2010)
  • M. B. de la Mora, J. A. del Río, R. Nava, J. Tagüeña-Martínez, J. A. Reyes-Esqueda, A. Kavokin, J. Faubert, and J. E. Lugo

Physical Optics

  • Optics Express Vol. 18, Iss. 22, pp. 23504–23516 (2010)
  • Chi-Young Hwang, Dawoon Choi, Kyoung-Youm Kim, and Byoungho Lee

Quantum Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22789–22795 (2010)
  • Angela Dudley, Michael Nock, Thomas Konrad, Filippus S. Roux, and Andrew Forbes

Remote Sensing

  • Optics Express Vol. 18, Iss. 22, pp. 23353–23357 (2010)
  • Stuart Gray, Anping Liu, Feng Xie, and Chung-en Zah

Scattering

  • Optics Express Vol. 18, Iss. 22, pp. 22958–22963 (2010)
  • Tao Zhu, Xiaoyi Bao, Liang Chen, Hao Liang, and Yongkang Dong

  • Optics Express Vol. 18, Iss. 22, pp. 23343–23352 (2010)
  • Matthew J. Berg, Steve C. Hill, Yong-Le Pan, and Gorden Videen

Spectroscopy

  • Optics Express Vol. 18, Iss. 22, pp. 22762–22771 (2010)
  • Yaroslav Sych, Rainer Engelbrecht, Bernhard Schmauss, Dimitrii Kozlov, Thomas Seeger, and Alfred Leipertz

  • Optics Express Vol. 18, Iss. 22, pp. 22937–22943 (2010)
  • Xin Du, Mingfu Zhang, Qingkun Meng, Yunfei Song, Xing He, Yanqiang Yang, and Jiecai Han

Thin Films

  • Optics Express Vol. 18, Iss. 22, pp. 22944–22957 (2010)
  • P. Němec, S. Zhang, V. Nazabal, K. Fedus, G. Boudebs, A. Moreac, M. Cathelinaud, and X.-H. Zhang

  • Optics Express Vol. 18, Iss. 22, pp. 23204–23211 (2010)
  • Li-Jin Chen, Guoqing Chang, Chih-Hao Li, Andrew J. Benedick, David F. Philips, Ronald L. Walsworth, and Franz X. Kärtner

Ultrafast Optics

  • Optics Express Vol. 18, Iss. 22, pp. 22625–22630 (2010)
  • Shixiang Xu, Jin Liu, Guoliang Zheng, and Jingzhen Li

  • Optics Express Vol. 18, Iss. 22, pp. 22988–22995 (2010)
  • Nicolas K. Fontaine, David J. Geisler, Ryan P. Scott, Tingting He, Jonathan P. Heritage, and S. J. B. Yoo

  • Optics Express Vol. 18, Iss. 22, pp. 23070–23078 (2010)
  • Eiji Shiraki, Norihiko Nishizawa, and Kazuyoshi Itoh

  • Optics Express Vol. 18, Iss. 22, pp. 23088–23094 (2010)
  • Takayuki Suzuki and Masayuki Katsuragawa

  • Optics Express Vol. 18, Iss. 22, pp. 23104–23120 (2010)
  • Chris L. Palombini and Kurt E. Oughstun

  • Optics Express Vol. 18, Iss. 22, pp. 23147–23152 (2010)
  • Stefano Bonora, Daniele Brida, Paolo Villoresi, and Giulio Cerullo

X-ray Optics

  • Optics Express Vol. 18, Iss. 22, pp. 23420–23427 (2010)
  • Cameron M. Kewish, Manuel Guizar-Sicairos, Chian Liu, Jun Qian, Bing Shi, Christa Benson, Ali M. Khounsary, Joan Vila-Comamala, Oliver Bunk, James R. Fienup, Albert T. Macrander, and Lahsen Assoufid
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