3 January 2011, Volume 19, Issue 1, pp. 1-408;
Energy Express pp: A1–A71
53 articles
Actions
- Export Citations as
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
- Save to my favorites
- Choose folder...
Sort:
Increasing the depth-of-field (DOF) while maintaining high resolution imaging has been a classical challenge for conventional microscopes. Conventional microscopic images of the sample, as the objective focuses at (a) near and (b) far distances. [See S. Liu and H. Hua Fig. 7 for details].
Topics
Sort by Name | Total Articles
- My Topics
- Atmospheric and Oceanic Optics (1)
- Atomic and Molecular Physics (1)
- Detectors (1)
- Diffraction and Gratings (1)
- Fiber Optics and Optical Communications (7)
- Fluorescent Luminescent Materials (2)
- Fourier Optics and Signal Processing (1)
- Image Processing (1)
- Imaging Systems (2)
- Integrated Optics (2)
- Lasers and Laser Optics (4)
- Light-emitting Diodes (2)
- Medical Optics and Biotechnology (3)
- Metamaterials (3)
- Microscopy (1)
- Nonlinear Optics (3)
- Optical Devices (1)
- Optics at Surfaces (1)
- Optoelectronics (1)
- Photovoltaics (4)
- Quantum Optics (1)
- Remote Sensing (1)
- Scattering (1)
- Sensors (1)
- Solar Energy (1)
- Spectroscopy (2)
- Thin Films (1)
- Ultrafast Optics (2)
- X-ray Optics (1)