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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 12 — Jun. 4, 2012
  • pp: 12640–13591

Optics InfoBase > Optics Express > Volume 20 > Issue 12 > Table of Contents

Topics in this Issue

 
  • Adaptive Optics
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Scattering
  • Sensors
  • Solar Energy
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
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Adaptive Optics

  • Optics Express Vol. 20, Iss. 12, pp. 13252–13261 (2012)
  • Cyril Bourgenot, Christopher D. Saunter, Jonathan M. Taylor, John M. Girkin, and Gordon D. Love

Atmospheric and Oceanic Optics

  • Optics Express Vol. 20, Iss. 12, pp. 13055–13064 (2012)
  • Ricardo Barrios and Federico Dios

  • Optics Express Vol. 20, Iss. 12, pp. 13195–13200 (2012)
  • Mehul Malik, Malcolm O’Sullivan, Brandon Rodenburg, Mohammad Mirhosseini, Jonathan Leach, Martin P. J. Lavery, Miles J. Padgett, and Robert W. Boyd

Atomic and Molecular Physics

  • Optics Express Vol. 20, Iss. 12, pp. 13409–13418 (2012)
  • Joseph A. Pechkis and Fredrik K. Fatemi

Diffraction and Gratings

  • Optics Express Vol. 20, Iss. 12, pp. 13082–13090 (2012)
  • Emilie Sakat, Grégory Vincent, Petru Ghenuche, Nathalie Bardou, Christophe Dupuis, Stéphane Collin, Fabrice Pardo, Riad Haïdar, and Jean-Luc Pelouard

Fiber Optics and Optical Communications

  • Optics Express Vol. 20, Iss. 12, pp. 12893–12898 (2012)
  • Kenji Makino, Takahiro Kado, Azusa Inoue, and Yasuhiro Koike

  • Optics Express Vol. 20, Iss. 12, pp. 13274–13283 (2012)
  • Nicoletta Haarlammert, Oliver de Vries, Andreas Liem, Andrea Kliner, Thomas Peschel, Thomas Schreiber, Ramona Eberhardt, and Andreas Tünnermann

  • Optics Express Vol. 20, Iss. 12, pp. 13402–13408 (2012)
  • Y. G. Shee, M. H. Al-Mansoori, S. Yaakob, A. Man, A. K. Zamzuri, F. R. Mahamd Adikan, and M. A. Mahdi

  • Optics Express Vol. 20, Iss. 12, pp. 13451–13456 (2012)
  • Robert J. Williams, Nemanja Jovanovic, Graham D. Marshall, Graham N. Smith, M. J. Steel, and Michael J. Withford

  • Optics Express Vol. 20, Iss. 12, pp. 13006–13013 (2012)
  • Y. Wang, C. Sheng, H. Liu, Y. J. Zheng, C. Zhu, S. M. Wang, and S. N. Zhu

  • Optics Express Vol. 20, Iss. 12, pp. 13208–13214 (2012)
  • Guoxian Zheng, Feng Zhou, Jianfeng Liu, Tuotuo Li, Ning An, and Binglong Zhang

Holography

  • Optics Express Vol. 20, Iss. 12, pp. 12666–12674 (2012)
  • Jiang Lu, Raymond A. Shaw, and Weidong Yang

  • Optics Express Vol. 20, Iss. 12, pp. 13326–13336 (2012)
  • H. Brüning, V. Dieckmann, B. Schoke, K.-M. Voit, M. Imlau, G. Corradi, and C. Merschjann

Image Processing

  • Optics Express Vol. 20, Iss. 12, pp. 13238–13251 (2012)
  • Yi Ding, Jiangtao Xi, Yanguang Yu, Wenqing Cheng, Shu Wang, and Joe F. Chicharo

Imaging Systems

  • Optics Express Vol. 20, Iss. 12, pp. 12729–12741 (2012)
  • Farzad Fereidouni, Arjen N. Bader, and Hans C. Gerritsen

  • Optics Express Vol. 20, Iss. 12, pp. 12959–12965 (2012)
  • Kazunori Serita, Shori Mizuno, Hironaru Murakami, Iwao Kawayama, Yoshinori Takahashi, Masashi Yoshimura, Yusuke Mori, Juraj Darmo, and Masayoshi Tonouchi

  • Optics Express Vol. 20, Iss. 12, pp. 13129–13137 (2012)
  • Hugh T. Philipp, Kartik Ayyer, Mark W. Tate, Veit Elser, and Sol M. Gruner

  • Optics Express Vol. 20, Iss. 12, pp. 13501–13512 (2012)
  • A.V. Martin, N.D. Loh, C.Y. Hampton, R.G. Sierra, F. Wang, A. Aquila, S. Bajt, M. Barthelmess, C. Bostedt, J.D. Bozek, N. Coppola, S.W. Epp, B. Erk, H. Fleckenstein, L. Foucar, M. Frank, H. Graafsma, L. Gumprecht, A. Hartmann, R. Hartmann, G. Hauser, H. Hirsemann, P. Holl, S. Kassemeyer, N. Kimmel, M. Liang, L. Lomb, F.R.N.C. Maia, S. Marchesini, K. Nass, E. Pedersoli, C. Reich, D. Rolles, B. Rudek, A. Rudenko, J. Schulz, R.L. Shoeman, H. Soltau, D. Starodub, J. Steinbrener, F. Stellato, L. Strüder, J. Ullrich, G. Weidenspointner, T.A. White, C.B. Wunderer, A. Barty, I. Schlichting, M.J. Bogan, and H.N. Chapman

  • Optics Express Vol. 20, Iss. 12, pp. 13532–13538 (2012)
  • Hiroyuki Kawano, Tatsuki Okamoto, Taku Matsuzawa, Hajime Nakajima, Junko Makita, Naoyuki Fujiyama, Eiji Niikura, Tatsuya Kunieda, and Tadashi Minobe

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 12, pp. 12771–12786 (2012)
  • Mark-Alexander Henn, Hermann Gross, Frank Scholze, Matthias Wurm, Clemens Elster, and Markus Bär

  • Optics Express Vol. 20, Iss. 12, pp. 13573–13581 (2012)
  • Maruthi M. Brundavanam, Yoko Miyamoto, Rakesh Kumar Singh, Dinesh N. Naik, Mitsuo Takeda, and Ken’ichi Nakagawa

Integrated Optics

  • Optics Express Vol. 20, Iss. 12, pp. 12926–12938 (2012)
  • Hui Yu, Marianna Pantouvaki, Joris Van Campenhout, Dietmar Korn, Katarzyna Komorowska, Pieter Dumon, Yanlu Li, Peter Verheyen, Philippe Absil, Luca Alloatti, David Hillerkuss, Juerg Leuthold, Roel Baets, and Wim Bogaerts

  • Optics Express Vol. 20, Iss. 12, pp. 13115–13122 (2012)
  • Ali Ayazi, Tom Baehr-Jones, Yang Liu, Andy Eu-Jin Lim, and Michael Hochberg

  • Optics Express Vol. 20, Iss. 12, pp. 13164–13172 (2012)
  • Masaki Asobe, Takeshi Umeki, and Osamu Tadanaga

  • Optics Express Vol. 20, Iss. 12, pp. 13215–13225 (2012)
  • Judson D. Ryckman, V. Diez-Blanco, Joyeeta Nag, Robert E. Marvel, B. K. Choi, Richard F. Haglund, and Sharon M. Weiss

  • Optics Express Vol. 20, Iss. 12, pp. 13284–13295 (2012)
  • Young-Tak Han, Jang-Uk Shin, Sang-Ho Park, Hyung-Jong Lee, Wol-Yon Hwang, Hyo-Hoon Park, and Yongsoon Baek

  • Optics Express Vol. 20, Iss. 12, pp. 13425–13439 (2012)
  • Daoxin Dai, Yongbo Tang, and John E Bowers

  • Optics Express Vol. 20, Iss. 12, pp. 13470–13477 (2012)
  • R. Halir, A. Maese-Novo, A. Ortega-Moñux, I. Molina-Fernández, J. G. Wangüemert-Pérez, P. Cheben, D.-X. Xu, J. H. Schmid, and S. Janz

  • Optics Express Vol. 20, Iss. 12, pp. 13513–13521 (2012)
  • Xin Gai, Duk-Yong Choi, Steve Madden, and Barry Luther-Davies

  • Optics Express Vol. 20, Iss. 12, pp. 13560–13565 (2012)
  • Lin Yang, Ruiqiang Ji, Lei Zhang, Jianfeng Ding, and Qianfan Xu

Laser Microfabrication

  • Optics Express Vol. 20, Iss. 12, pp. 12939–12948 (2012)
  • Bian Hao, Hewei Liu, Feng Chen, Qing Yang, Pubo Qu, Guangqing Du, Jinhai Si, Xianhua Wang, and Xun Hou

  • Optics Express Vol. 20, Iss. 12, pp. 12997–13005 (2012)
  • C. Mauclair, M. Zamfirescu, J. P. Colombier, G. Cheng, K. Mishchik, E. Audouard, and R. Stoian

Lasers and Laser Optics

  • Optics Express Vol. 20, Iss. 12, pp. 12787–12792 (2012)
  • Tzong-Yow Tsai, Yen-Cheng Fang, Hong-Xi Tsao, Shih-Ting Lin, and Chieh Hu

  • Optics Express Vol. 20, Iss. 12, pp. 12899–12905 (2012)
  • Kangwen Yang, Wenxue Li, Ming Yan, Xuling Shen, Jian Zhao, and Heping Zeng

  • Optics Express Vol. 20, Iss. 12, pp. 12906–12911 (2012)
  • S. R. Bowman, S. O’Connor, and N. J. Condon

  • Optics Express Vol. 20, Iss. 12, pp. 12912–12925 (2012)
  • Cesar Jauregui, Tino Eidam, Hans-Jürgen Otto, Fabian Stutzki, Florian Jansen, Jens Limpert, and Andreas Tünnermann

  • Optics Express Vol. 20, Iss. 12, pp. 12966–12974 (2012)
  • Sung Yoon Ryu, Kyung-Soo Kim, Jungwon Kim, and Soohyun Kim

  • Optics Express Vol. 20, Iss. 12, pp. 13123–13128 (2012)
  • Jianfeng Li, Tomonori Hu, and Stuart D. Jackson

  • Optics Express Vol. 20, Iss. 12, pp. 13390–13401 (2012)
  • A. Quirce and A. Valle

  • Optics Express Vol. 20, Iss. 12, pp. 13539–13550 (2012)
  • Henrik Tünnermann, Jörg Neumann, Dietmar Kracht, and Peter Weßels

  • Optics Express Vol. 20, Iss. 12, pp. 13551–13559 (2012)
  • Raynald Laheurte, Philippe Darnis, Nathalie Darbois, Olivier Cahuc, and Jérôme Neauport

Materials

  • Optics Express Vol. 20, Iss. 12, pp. 12658–12665 (2012)
  • Sandro Marcio Lima, Luis Humberto da Cunha Andrade, Junior Reis Silva, Antonio Carlos Bento, Mauro Luciano Baesso, Juraci Aparecido Sampaio, Luiz Antonio de Oliveira Nunes, Yannick Guyot, and Georges Boulon

  • Optics Express Vol. 20, Iss. 12, pp. 13030–13039 (2012)
  • Raluca A. Negres, Ghaleb M. Abdulla, David A. Cross, Zhi M. Liao, and Christopher W. Carr

  • Optics Express Vol. 20, Iss. 12, pp. 13357–13367 (2012)
  • Ilya Snetkov, Anton Vyatkin, Oleg Palashov, and Efim Khazanov

  • Optics Express Vol. 20, Iss. 12, pp. 13419–13424 (2012)
  • Juan Huo and Xianfeng Chen

  • Optics Express Vol. 20, Iss. 12, pp. 13582–13591 (2012)
  • J. J. Velázquez, V. K. Tikhomirov, L. F. Chibotaru, N. T. Cuong, A. S. Kuznetsov, V. D. Rodríguez, M. T. Nguyen, and V. V. Moshchalkov

Medical Optics and Biotechnology

  • Optics Express Vol. 20, Iss. 12, pp. 13488–13500 (2012)
  • Yong Song, Kai Zhang, Qun Hao, and Jannick P. Rolland

Metamaterials

  • Optics Express Vol. 20, Iss. 12, pp. 12752–12760 (2012)
  • Alexey A. Basharin, Maria Kafesaki, Eleftherios N. Economou, and Costas M. Soukoulis

  • Optics Express Vol. 20, Iss. 12, pp. 13065–13070 (2012)
  • Zheng-Gao Dong, Peigen Ni, Jie Zhu, Xiaobo Yin, and X. Zhang

  • Optics Express Vol. 20, Iss. 12, pp. 13262–13273 (2012)
  • Tom Driscoll, Guy Lipworth, Jack Hunt, Nathan Landy, Nathan Kundtz, Dimitri N. Basov, and David R. Smith

Microscopy

  • Optics Express Vol. 20, Iss. 12, pp. 12793–12798 (2012)
  • Chris J. Lee and Klaus J. Boller

  • Optics Express Vol. 20, Iss. 12, pp. 13173–13188 (2012)
  • Benedikt Hauer, Andreas P. Engelhardt, and Thomas Taubner

  • Optics Express Vol. 20, Iss. 12, pp. 13347–13356 (2012)
  • Jiwoong Kwon, Youngbin Lim, Jiwon Jung, and Seong Keun Kim

  • Optics Express Vol. 20, Iss. 12, pp. 13522–13531 (2012)
  • Antony Orth and Kenneth Crozier

Nonlinear Optics

  • Optics Express Vol. 20, Iss. 12, pp. 12860–12865 (2012)
  • Krishnan Thyagarajan, Simon Rivier, Andrea Lovera, and Olivier J.F. Martin

  • Optics Express Vol. 20, Iss. 12, pp. 13014–13029 (2012)
  • Chia-Chien Huang

  • Optics Express Vol. 20, Iss. 12, pp. 13100–13107 (2012)
  • Andrzej Gajda, Lars Zimmermann, Mahmoud Jazayerifar, Georg Winzer, Hui Tian, Robert Elschner, Thomas Richter, Colja Schubert, Bernd Tillack, and Klaus Petermann

  • Optics Express Vol. 20, Iss. 12, pp. 13189–13194 (2012)
  • Hyungsuk Ryu, Jaehun Kim, Young Min Jhon, Seok Lee, and Namkyoo Park

  • Optics Express Vol. 20, Iss. 12, pp. 13457–13469 (2012)
  • Xiangming Liu, Yusuke Adachi, Yasuo Tomita, Juro Oshima, Takuya Nakashima, and Tsuyoshi Kawai

Optical Devices

  • Optics Express Vol. 20, Iss. 12, pp. 12682–12691 (2012)
  • Norbert Danz, Christoph A. Wächter, Dirk Michaelis, Peter Dannberg, and Michael Flämmich

  • Optics Express Vol. 20, Iss. 12, pp. 12742–12751 (2012)
  • Michael A. Taylor, Alex Szorkovszky, Joachim Knittel, Kwan H. Lee, Terry G. McRae, and Warwick P. Bowen

  • Optics Express Vol. 20, Iss. 12, pp. 12885–12892 (2012)
  • Wonkeun Chung, Hyunchul Jung, Chang Hun Lee, Jihyun Kim, and Sung Hyun Kim

  • Optics Express Vol. 20, Iss. 12, pp. 13296–13301 (2012)
  • Xinkai Liu, Wei Pan, Xihua Zou, Bin Luo, Lianshan Yan, and Bing Lu

  • Optics Express Vol. 20, Iss. 12, pp. 13478–13487 (2012)
  • Bin Jiang, Chunfeng Zhang, Xiaoyong Wang, Fei Xue, Min Joo Park, Joon Seop Kwak, and Min Xiao

Optical Trapping and Manipulation

  • Optics Express Vol. 20, Iss. 12, pp. 12987–12996 (2012)
  • Yongyin Cao, Alexander B Stilgoe, Lixue Chen, Timo A Nieminen, and Halina Rubinsztein-Dunlop

  • Optics Express Vol. 20, Iss. 12, pp. 13368–13389 (2012)
  • F. J. Valdivia-Valero and M. Nieto-Vesperinas

Optics at Surfaces

  • Optics Express Vol. 20, Iss. 12, pp. 12866–12876 (2012)
  • Daniel R. Mason, Dmitri K. Gramotnev, and Kwang S. Kim

  • Optics Express Vol. 20, Iss. 12, pp. 12877–12884 (2012)
  • Christoph Lemke, Till Leißner, Stephan Jauernik, Alwin Klick, Jacek Fiutowski, Jakob Kjelstrup-Hansen, Horst-Günter Rubahn, and Michael Bauer

  • Optics Express Vol. 20, Iss. 12, pp. 13146–13163 (2012)
  • D. Macías, P.-M. Adam, V. Ruíz-Cortés, R. Rodríguez-Oliveros, and J. A. Sánchez-Gil

  • Optics Express Vol. 20, Iss. 12, pp. 13311–13319 (2012)
  • Michael G. Nielsen, Anders Pors, Ole Albrektsen, and Sergey I. Bozhevolnyi

Photonic Crystals

  • Optics Express Vol. 20, Iss. 12, pp. 13040–13054 (2012)
  • G. C. R. Devarapu and S. Foteinopoulou

  • Optics Express Vol. 20, Iss. 12, pp. 13091–13099 (2012)
  • Fei Qin, Zi-Ming Meng, Xiao-Lan Zhong, Ye Liu, and Zhi-Yuan Li

  • Optics Express Vol. 20, Iss. 12, pp. 13108–13114 (2012)
  • Pierre Colman, Sylvain Combrié, Gaëlle Lehoucq, and Alfredo De Rossi

Physical Optics

  • Optics Express Vol. 20, Iss. 12, pp. 12692–12698 (2012)
  • Xiang Hao, Cuifang Kuang, Yanghui Li, and Xu Liu

  • Optics Express Vol. 20, Iss. 12, pp. 12949–12958 (2012)
  • Kenji Yamamoto, Yasuyuki Ichihashi, Takanori Senoh, Ryutaro Oi, and Taiichiro Kurita

  • Optics Express Vol. 20, Iss. 12, pp. 13071–13081 (2012)
  • Vasily Klimov, Shulin Sun, and Guang-Yu Guo

  • Optics Express Vol. 20, Iss. 12, pp. 13201–13207 (2012)
  • C. F. Phelan, K. E. Ballantine, P. R. Eastham, J. F. Donegan, and J. G. Lunney

  • Optics Express Vol. 20, Iss. 12, pp. 13302–13310 (2012)
  • Jeffrey A. Davis, Don M. Cottrell, and David Sand

Quantum Optics

  • Optics Express Vol. 20, Iss. 12, pp. 13440–13450 (2012)
  • Wen-An Li and Lian-Fu Wei

Scattering

  • Optics Express Vol. 20, Iss. 12, pp. 12799–12826 (2012)
  • Dimitrios Giannakis, Peter Schwander, and Abbas Ourmazd

  • Optics Express Vol. 20, Iss. 12, pp. 12827–12849 (2012)
  • Peter Schwander, Dimitrios Giannakis, Chun Hong Yoon, and Abbas Ourmazd

  • Optics Express Vol. 20, Iss. 12, pp. 12975–12986 (2012)
  • Barry M. Cornella, Sergey F. Gimelshein, Mikhail N. Shneider, Taylor C. Lilly, and Andrew D. Ketsdever

Sensors

  • Optics Express Vol. 20, Iss. 12, pp. 12710–12720 (2012)
  • U. Wiedemann, W. Alt, and D. Meschede

  • Optics Express Vol. 20, Iss. 12, pp. 13138–13145 (2012)
  • Da-Peng Zhou, Zengguang Qin, Wenhai Li, Liang Chen, and Xiaoyi Bao

  • Optics Express Vol. 20, Iss. 12, pp. 13320–13325 (2012)
  • Tingting Han, Yan-ge Liu, Zhi Wang, Zhifang Wu, Shuangxia Wang, and Shuo Li

Solar Energy

  • Optics Express Vol. 20, Iss. 12, pp. 12640–12648 (2012)
  • Itsara Srithanachai, Surada Ueamanapong, Surasak Niemcharoen, and Preecha P Yupapin

  • Optics Express Vol. 20, Iss. 12, pp. 12649–12657 (2012)
  • Richard S. Kim, Jinfeng Zhu, Jeung Hun Park, Lu Li, Zhibin Yu, Huajun Shen, Mei Xue, Kang L. Wang, Gyechoon Park, Timothy J. Anderson, and Qibing Pei

  • Optics Express Vol. 20, Iss. 12, pp. 12675–12681 (2012)
  • Shih-Chen Chen, Yu-Kuang Liao, Hsueh-Ju Chen, Chia-Hsiang Chen, Chih-Huang Lai, Yu-Lun Chueh, Hao-Chung Kuo, Kaung-Hsiung Wu, Jenh-Yih Juang, Shun-Jen Cheng, Tung-Po Hsieh, and Takayoshi Kobayashi

  • Optics Express Vol. 20, Iss. 12, pp. 13226–13237 (2012)
  • E. Wang, T. P. White, and K. R. Catchpole

Spectroscopy

  • Optics Express Vol. 20, Iss. 12, pp. 12699–12709 (2012)
  • Evgueni Gudimenko, Vladimir Milosavljević, and Stephen Daniels

  • Optics Express Vol. 20, Iss. 12, pp. 12761–12770 (2012)
  • Paul M. Donaldson, Halina Strzalka, and Peter Hamm

  • Optics Express Vol. 20, Iss. 12, pp. 12850–12859 (2012)
  • Yong Fan, Kazuhiro Hotta, Akira Yamaguchi, and Norio Teramae

Thin Films

  • Optics Express Vol. 20, Iss. 12, pp. 13566–13572 (2012)
  • Dae-Seon Kim, Dong-Hyun Kim, Sehyun Hwang, and Jae-Hyung Jang

Ultrafast Optics

  • Optics Express Vol. 20, Iss. 12, pp. 12721–12728 (2012)
  • Markus Henriksson, Jean-Francois Daigle, Francis Théberge, Marc Châteauneuf, and Jacques Dubois

  • Optics Express Vol. 20, Iss. 12, pp. 13337–13346 (2012)
  • N. Kaya, J. Strohaber, A. A. Kolomenskii, G. Kaya, H. Schroeder, and H. A. Schuessler
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