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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 18 — Aug. 27, 2012
  • pp: 19612–20799

Optics InfoBase > Optics Express > Volume 20 > Issue 18 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optics in Computing
  • Optoelectronics
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Remote Sensing
  • Scattering
  • Sensors
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
  • Vision, Color, and Visual Optics
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Atmospheric and Oceanic Optics

  • Optics Express Vol. 20, Iss. 18, pp. 20096–20101 (2012)
  • K. B. Mao, Y. Ma, X. Y. Shen, B. P. Li, C. Y. Li, and Z. L. Li

  • Optics Express Vol. 20, Iss. 18, pp. 20482–20493 (2012)
  • Yunlin Zhang, Xiaohan Liu, Yan Yin, Mingzhu Wang, and Boqiang Qin

  • Optics Express Vol. 20, Iss. 18, pp. 20680–20683 (2012)
  • H. T. Yura and T. S. Rose

  • Optics Express Vol. 20, Iss. 18, pp. 20684–20687 (2012)
  • Ricardo Barrios and Federico Dios

  • Optics Express Vol. 20, Iss. 18, pp. 20754–20770 (2012)
  • Xianqiang He, Yan Bai, Delu Pan, Junwu Tang, and Difeng Wang

Atomic and Molecular Physics

  • Optics Express Vol. 20, Iss. 18, pp. 20201–20209 (2012)
  • Yueming Zhou, Cheng Huang, and Peixiang Lu

Coherence and Statistical Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19708–19713 (2012)
  • A. J. Jesus-Silva, J. M. Hickmann, and E. J. S. Fonseca

  • Optics Express Vol. 20, Iss. 18, pp. 20255–20265 (2012)
  • Chih-Hao Cheng, Chia-Wei Lee, Tzu-Wei Lin, and Fan-Yi Lin

Detectors

  • Optics Express Vol. 20, Iss. 18, pp. 20028–20042 (2012)
  • V. Goiffon, S. Girard, A. Chabane, P. Paillet, P. Magnan, P. Cervantes, P. Martin-Gonthier, J. Baggio, M. Estribeau, J.-L. Bourgade, S. Darbon, A. Rousseau, V. Yu. Glebov, G. Pien, and T. C. Sangster

  • Optics Express Vol. 20, Iss. 18, pp. 20090–20095 (2012)
  • E. Rouvalis, M. Chtioui, F. van Dijk, F. Lelarge, M. J. Fice, C. C. Renaud, G. Carpintero, and A. J. Seeds

  • Optics Express Vol. 20, Iss. 18, pp. 20115–20123 (2012)
  • Hirotaka Terai, Taro Yamashita, Shigehito Miki, Kazumasa Makise, and Zhen Wang

  • Optics Express Vol. 20, Iss. 18, pp. 20748–20753 (2012)
  • Nishuang Liu, Weiwei Tian, Xianghui Zhang, Jun Su, Qi Zhang, and Yihua Gao

Diffraction and Gratings

  • Optics Express Vol. 20, Iss. 18, pp. 20551–20557 (2012)
  • Tzeng Tsong Wu, Yu Cheng Syu, Shu Hsien Wu, Wei Ting Chen, Tien Chang Lu, Shing Chung Wang, Hai Pang Chiang, and Din Ping Tsai

Fiber Optics and Optical Communications

  • Optics Express Vol. 20, Iss. 18, pp. 19726–19734 (2012)
  • Stefano Faralli, Kimchau N. Nguyen, Jonathan D. Peters, Daryl T. Spencer, Daniel J. Blumenthal, and John E. Bowers

  • Optics Express Vol. 20, Iss. 18, pp. 19815–19821 (2012)
  • Kazushi Toyoda, Yuki Koizumi, Tatsunori Omiya, Masato Yoshida, Toshihiko Hirooka, and Masataka Nakazawa

  • Optics Express Vol. 20, Iss. 18, pp. 19836–19849 (2012)
  • Toshihiko Hirooka and Masataka Nakazawa

  • Optics Express Vol. 20, Iss. 18, pp. 19893–19904 (2012)
  • Alexandre Felipe, Guilherme Espíndola, Hypolito J. Kalinowski, José A. S. Lima, and Aleksander S. Paterno

  • Optics Express Vol. 20, Iss. 18, pp. 19921–19927 (2012)
  • Liang B. Du, Mohammad Monir Morshed, and Arthur J. Lowery

  • Optics Express Vol. 20, Iss. 18, pp. 19990–19995 (2012)
  • Xu Zhang, Xiaodan Pang, Lei Deng, Darko Zibar, Idelfonso Tafur Monroy, and Richard Younce

  • Optics Express Vol. 20, Iss. 18, pp. 20071–20077 (2012)
  • Yu-Chieh Chi, Yi-Cheng Li, Huai-Yung Wang, Peng-Chun Peng, Hai-Han Lu, and Gong-Ru Lin

  • Optics Express Vol. 20, Iss. 18, pp. 20102–20114 (2012)
  • Adaickalavan Meiyappan, Pooi-Yuen Kam, and Hoon Kim

  • Optics Express Vol. 20, Iss. 18, pp. 20156–20169 (2012)
  • Sebastian Dochow, Ines Latka, Martin Becker, Ron Spittel, Jens Kobelke, Kay Schuster, Albrecht Graf, Sven Brückner, Sonja Unger, Manfred Rothhardt, Benjamin Dietzek, Christoph Krafft, and Jürgen Popp

  • Optics Express Vol. 20, Iss. 18, pp. 20191–20200 (2012)
  • K. S. Abedin, T. F. Taunay, M. Fishteyn, D. J. DiGiovanni, V.R. Supradeepa, J. M. Fini, M. F. Yan, B. Zhu, E. M. Monberg, and F.V. Dimarcello

  • Optics Express Vol. 20, Iss. 18, pp. 20238–20254 (2012)
  • John R. Marciante, Vladimir V. Shkunov, and David A. Rockwell

  • Optics Express Vol. 20, Iss. 18, pp. 20396–20406 (2012)
  • Tao Liu and Ivan B. Djordjevic

  • Optics Express Vol. 20, Iss. 18, pp. 20494–20505 (2012)
  • J.W. Nicholson, L. Meng, J.M. Fini, R.S. Windeler, A. DeSantolo, E. Monberg, F. DiMarcello, Y. Dulashko, M. Hassan, and R. Ortiz

  • Optics Express Vol. 20, Iss. 18, pp. 20558–20563 (2012)
  • Lawrence Shah, R. Andrew Sims, Pankaj Kadwani, Christina C.C. Willis, Joshua B. Bradford, Aaron Pung, Menelaos K. Poutous, Eric G. Johnson, and Martin Richardson

  • Optics Express Vol. 20, Iss. 18, pp. 20623–20628 (2012)
  • Jianzhong Zhang, Yanhua Luo, Zinat M. Sathi, Nilram Azadpeyma, and Gang-Ding Peng

  • Optics Express Vol. 20, Iss. 18, pp. 20666–20679 (2012)
  • R.P. Giddings, E. Hugues-Salas, and J.M. Tang

Geometric Optics

  • Optics Express Vol. 20, Iss. 18, pp. 20139–20155 (2012)
  • Kyle Fuerschbach, Jannick P. Rolland, and Kevin P. Thompson

Holography

  • Optics Express Vol. 20, Iss. 18, pp. 19628–19634 (2012)
  • Vera Marinova, Ren Chung Liu, Shiuan Huei Lin, and Ken Yuh Hsu

  • Optics Express Vol. 20, Iss. 18, pp. 19658–19669 (2012)
  • Dinesh N. Naik, Takahiro Ezawa, Rakesh Kumar Singh, Yoko Miyamoto, and Mitsuo Takeda

  • Optics Express Vol. 20, Iss. 18, pp. 19744–19756 (2012)
  • Quang Duc Pham, Satoshi Hasegawa, Tomohiro Kiire, Daisuke Barada, Toyohiko Yatagai, and Yoshio Hayasaki

  • Optics Express Vol. 20, Iss. 18, pp. 19806–19814 (2012)
  • Tatsuki Tahara, Yuki Shimozato, Peng Xia, Yasunori Ito, Yasuhiro Awatsuji, Kenzo Nishio, Shogo Ura, Osamu Matoba, and Toshihiro Kubota

  • Optics Express Vol. 20, Iss. 18, pp. 19822–19835 (2012)
  • Nisan Siegel, Joseph Rosen, and Gary Brooker

  • Optics Express Vol. 20, Iss. 18, pp. 20286–20291 (2012)
  • Takashi Kakue, Seiya Itoh, Peng Xia, Tatsuki Tahara, Yasuhiro Awatsuji, Kenzo Nishio, Shogo Ura, Toshihiro Kubota, and Osamu Matoba

Image Processing

  • Optics Express Vol. 20, Iss. 18, pp. 19714–19725 (2012)
  • Christian Schulze, Darryl Naidoo, Daniel Flamm, Oliver A. Schmidt, Andrew Forbes, and Michael Duparré

  • Optics Express Vol. 20, Iss. 18, pp. 20427–20446 (2012)
  • Takeaki Shimokawa, Takashi Kosaka, Okito Yamashita, Nobuo Hiroe, Takashi Amita, Yoshihiro Inoue, and Masa-aki Sato

Imaging Systems

  • Optics Express Vol. 20, Iss. 18, pp. 19612–19617 (2012)
  • Keisuke Goda, Ali Fard, Omer Malik, Gilbert Fu, Alan Quach, and Bahram Jalali

  • Optics Express Vol. 20, Iss. 18, pp. 19697–19707 (2012)
  • Jan-Hendrik Spille, Tim Kaminski, Heinz-Peter Königshoven, and Ulrich Kubitscheck

  • Optics Express Vol. 20, Iss. 18, pp. 19757–19768 (2012)
  • Kwang-Hoon Lee, Youngsik Park, Hyoung Lee, Seon Kyu Yoon, and Sung-Kyu Kim

  • Optics Express Vol. 20, Iss. 18, pp. 20705–20714 (2012)
  • Yan Feng, Paul A Dalgarno, David Lee, Yi Yang, Robert R Thomson, and Alan H Greenaway

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 18, pp. 19868–19881 (2012)
  • Sheng-Kang Yu, Wei-Lun Chen, Ting-Kun Liu, and Shih-Chieh Lin

  • Optics Express Vol. 20, Iss. 18, pp. 20078–20089 (2012)
  • Jungjae Park, Lingfeng Chen, Quandou Wang, and Ulf Griesmann

  • Optics Express Vol. 20, Iss. 18, pp. 20466–20481 (2012)
  • D. Layden, M. F. G. Wood, and I. A. Vitkin

  • Optics Express Vol. 20, Iss. 18, pp. 20771–20782 (2012)
  • Xuezhen Wang, Jiancheng Lai, and Zhenhua Li

Integrated Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19882–19892 (2012)
  • Przemek J. Bock, Pavel Cheben, Jens H. Schmid, Aitor V. Velasco, André Delâge, Siegfried Janz, Dan-Xia Xu, Jean Lapointe, Trevor J. Hall, and María L. Calvo

  • Optics Express Vol. 20, Iss. 18, pp. 20021–20027 (2012)
  • Yunhong Ding, Liu Liu, Christophe Peucheret, and Haiyan Ou

  • Optics Express Vol. 20, Iss. 18, pp. 20506–20515 (2012)
  • L. Alloatti, D. Korn, C. Weimann, C. Koos, W. Freude, and J. Leuthold

  • Optics Express Vol. 20, Iss. 18, pp. 20535–20544 (2012)
  • Lin Chen, Tian Zhang, Xun Li, and Weiping Huang

  • Optics Express Vol. 20, Iss. 18, pp. 20545–20550 (2012)
  • B. M. Holmes, M. A. Naeem, D. C. Hutchings, J. H. Marsh, and A. E. Kelly

  • Optics Express Vol. 20, Iss. 18, pp. 20564–20575 (2012)
  • Li Fan, Leo T. Varghese, Yi Xuan, Jian Wang, Ben Niu, and Minghao Qi

  • Optics Express Vol. 20, Iss. 18, pp. 20659–20665 (2012)
  • Harish Subbaraman, Xiaochuan Xu, John Covey, and Ray T. Chen

  • Optics Express Vol. 20, Iss. 18, pp. 20790–20799 (2012)
  • Jiahua Fan and Lin Zhu

Laser Microfabrication

  • Optics Express Vol. 20, Iss. 18, pp. 19978–19989 (2012)
  • P. S. Salter and M. J. Booth

Lasers and Laser Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19670–19682 (2012)
  • Di Zhang, Jianyi Zhao, Qi Yang, Wen Liu, Yanfeng Fu, Chao Li, Ming Luo, Shenglei Hu, Qianggao Hu, and Lei Wang

  • Optics Express Vol. 20, Iss. 18, pp. 19905–19911 (2012)
  • Z. Q. Luo, C. C. Ye, H. Y. Fu, H. H. Cheng, J. Z. Wang, and Z. P. Cai

  • Optics Express Vol. 20, Iss. 18, pp. 19946–19955 (2012)
  • John S. Parker, Abirami Sivananthan, Erik Norberg, and Larry A. Coldren

  • Optics Express Vol. 20, Iss. 18, pp. 19996–20001 (2012)
  • Xin Tu, Xiang Wu, Ming Li, Liying Liu, and Lei Xu

  • Optics Express Vol. 20, Iss. 18, pp. 20170–20180 (2012)
  • Jiang Li, Hansuek Lee, Tong Chen, and Kerry J. Vahala

  • Optics Express Vol. 20, Iss. 18, pp. 20368–20375 (2012)
  • Byung-Seok Choi, Su Hwan Oh, Ki Soo Kim, Ki-Hong Yoon, Hyun Soo Kim, Mi-Ran Park, Jong Sool Jeong, O-Kyun Kwon, Jun-Kyu Seo, Hak-Kyu Lee, and Yun C. Chung

  • Optics Express Vol. 20, Iss. 18, pp. 20387–20395 (2012)
  • F. Reichert, F. Moglia, D.-T. Marzahl, P. Metz, M. Fechner, N.-O. Hansen, and G. Huber

  • Optics Express Vol. 20, Iss. 18, pp. 20629–20634 (2012)
  • Peter W. Roth, David Burns, and Alan J. Kemp

  • Optics Express Vol. 20, Iss. 18, pp. 20647–20658 (2012)
  • Kazuue Fujita, Masamichi Yamanishi, Shinichi Furuta, Kazunori Tanaka, Tadataka Edamura, Tillmann Kubis, and Gerhard Klimeck

  • Optics Express Vol. 20, Iss. 18, pp. 20698–20704 (2012)
  • Cheng-Yu Shih and Hui-Chen Yeh

Materials

  • Optics Express Vol. 20, Iss. 18, pp. 20447–20458 (2012)
  • R. A. Negres, R. N. Raman, J. D. Bude, M. D. Feit, and S. G. Demos

Medical Optics and Biotechnology

  • Optics Express Vol. 20, Iss. 18, pp. 19643–19657 (2012)
  • Nikhil N. Mutyal, Andrew Radosevich, Bradley Gould, Jeremy D. Rogers, Andrew Gomes, Vladimir Turzhitsky, and Vadim Backman

  • Optics Express Vol. 20, Iss. 18, pp. 20516–20534 (2012)
  • Boy Braaf, Koenraad A. Vermeer, Kari V. Vienola, and Johannes F. de Boer

  • Optics Express Vol. 20, Iss. 18, pp. 20730–20741 (2012)
  • Klaus C. Schuermann and Hernán E. Grecco

Metamaterials

  • Optics Express Vol. 20, Iss. 18, pp. 19928–19935 (2012)
  • Sabine Dobmann, Dzmitry Shyroki, Peter Banzer, Andreas Erdmann, and Ulf Peschel

Microscopy

  • Optics Express Vol. 20, Iss. 18, pp. 19936–19945 (2012)
  • Florian Mauch, Wolfram Lyda, Marc Gronle, and Wolfgang Osten

  • Optics Express Vol. 20, Iss. 18, pp. 20582–20598 (2012)
  • L. Silvestri, A. Bria, L. Sacconi, G. Iannello, and F. S. Pavone

  • Optics Express Vol. 20, Iss. 18, pp. 20605–20622 (2012)
  • Woosub Song, Jihoon Lee, and Hyuk-Sang Kwon

Nonlinear Optics

  • Optics Express Vol. 20, Iss. 18, pp. 20002–20010 (2012)
  • Hideki Ishizuki and Takunori Taira

  • Optics Express Vol. 20, Iss. 18, pp. 20043–20058 (2012)
  • Tao Chen, Junqiang Sun, and Linsen Li

  • Optics Express Vol. 20, Iss. 18, pp. 20181–20190 (2012)
  • Meiyan Qin, Xiaosong Zhu, Kunlong Liu, Qingbin Zhang, and Peixiang Lu

  • Optics Express Vol. 20, Iss. 18, pp. 20222–20227 (2012)
  • Wei Li, Li Xian Wang, Werner Hofmann, Ning Hua Zhu, and Dieter Bimberg

  • Optics Express Vol. 20, Iss. 18, pp. 20715–20720 (2012)
  • Wei Gao, Xiaobo Hu, Di Sun, and Jianyi Li

Optical Design and Fabrication

  • Optics Express Vol. 20, Iss. 18, pp. 19787–19798 (2012)
  • David Walker, Guoyu Yu, Hongyu Li, Wilhelmus Messelink, Rob Evans, and Anthony Beaucamp

  • Optics Express Vol. 20, Iss. 18, pp. 20130–20138 (2012)
  • Youngmin Kim, Keehoon Hong, Jiwoon Yeom, Jisoo Hong, Jae-Hyun Jung, Yong Wook Lee, Jae-Hyeung Park, and Byoungho Lee

Optical Devices

  • Optics Express Vol. 20, Iss. 18, pp. 19635–19642 (2012)
  • Jiun-Ting Chen, Wei-Chih Lai, Chi-Heng Chen, Ya-Yu Yang, Jinn-Kong Sheu, Kun-Wei Lin, and Li-Wen Lai

  • Optics Express Vol. 20, Iss. 18, pp. 20124–20129 (2012)
  • Jie Sun, Yuan Chen, and Shin-Tson Wu

  • Optics Express Vol. 20, Iss. 18, pp. 20276–20285 (2012)
  • Ji Hye Oh, Su Ji Yang, Yeon-Goog Sung, and Y. R. Do

  • Optics Express Vol. 20, Iss. 18, pp. 20742–20747 (2012)
  • S. Keppler, M. Hornung, R. Bödefeld, M. Kahle, J. Hein, and M. C. Kaluza

Optics at Surfaces

  • Optics Express Vol. 20, Iss. 18, pp. 19618–19627 (2012)
  • O. Sydoruk, R. R. A. Syms, and L. Solymar

  • Optics Express Vol. 20, Iss. 18, pp. 19690–19696 (2012)
  • Jing Niu, Young Jun Shin, Jaesung Son, Youngbin Lee, Jong-Hyun Ahn, and Hyunsoo Yang

  • Optics Express Vol. 20, Iss. 18, pp. 19735–19743 (2012)
  • Kwangseuk Kyhm, Koo-Chul Je, and Robert A. Taylor

  • Optics Express Vol. 20, Iss. 18, pp. 20210–20221 (2012)
  • Yongpin P. Chen, Wei E. I. Sha, Wallace C. H. Choy, Lijun Jiang, and Weng Cho Chew

  • Optics Express Vol. 20, Iss. 18, pp. 20342–20355 (2012)
  • Yun-Ting Hung, Chen-Bin Huang, and Jer-Shing Huang

Optics in Computing

  • Optics Express Vol. 20, Iss. 18, pp. 19683–19689 (2012)
  • Elad Cohen, Michael Rosenbluh, and Ido Kanter

  • Optics Express Vol. 20, Iss. 18, pp. 20292–20308 (2012)
  • Thomas Van Vaerenbergh, Martin Fiers, Pauline Mechet, Thijs Spuesens, Rajesh Kumar, Geert Morthier, Benjamin Schrauwen, Joni Dambre, and Peter Bienstman

  • Optics Express Vol. 20, Iss. 18, pp. 20407–20426 (2012)
  • Ioannis Roudas, B. Roe Hemenway, Richard R. Grzybowski, and Fotini Karinou

Optoelectronics

  • Optics Express Vol. 20, Iss. 18, pp. 19859–19867 (2012)
  • Saeed Khan and Sasan Fathpour

  • Optics Express Vol. 20, Iss. 18, pp. 20330–20341 (2012)
  • Steven J. Koester, Huan Li, and Mo Li

Photonic Crystals

  • Optics Express Vol. 20, Iss. 18, pp. 20356–20367 (2012)
  • Jian Wang and Minghao Qi

  • Optics Express Vol. 20, Iss. 18, pp. 20635–20646 (2012)
  • H. Kurt, D. Yilmaz, A. E. Akosman, and E. Ozbay

Physical Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19972–19977 (2012)
  • Michel Zamboni-Rached, K. Z. Nóbrega, and C. A. Dartora

  • Optics Express Vol. 20, Iss. 18, pp. 20228–20237 (2012)
  • Pierre-André Bélanger and Simon Thibault

Quantum Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19956–19971 (2012)
  • Elke Neu, Mario Agio, and Christoph Becher

Remote Sensing

  • Optics Express Vol. 20, Iss. 18, pp. 20318–20329 (2012)
  • Jonas Sandsten and Martin Andersson

  • Optics Express Vol. 20, Iss. 18, pp. 20688–20697 (2012)
  • Billy Kaldvee, Christian Brackmann, Marcus Aldén, and Joakim Bood

Scattering

  • Optics Express Vol. 20, Iss. 18, pp. 20376–20386 (2012)
  • Brice Rolly, Brian Stout, and Nicolas Bonod

  • Optics Express Vol. 20, Iss. 18, pp. 20599–20604 (2012)
  • Alexander E. Krasnok, Andrey E. Miroshnichenko, Pavel A. Belov, and Yuri S. Kivshar

  • Optics Express Vol. 20, Iss. 18, pp. 20721–20729 (2012)
  • Wonjun Choi, Q-Han Park, and Wonshik Choi

Sensors

  • Optics Express Vol. 20, Iss. 18, pp. 19912–19920 (2012)
  • Y. Liu and H. W. M. Salemink

  • Optics Express Vol. 20, Iss. 18, pp. 20309–20317 (2012)
  • Meng Wang, Jussi Hiltunen, Christina Liedert, Stuart Pearce, Martin Charlton, Leena Hakalahti, Pentti Karioja, and Risto Myllylä

  • Optics Express Vol. 20, Iss. 18, pp. 20459–20465 (2012)
  • Zengguang Qin, Liang Chen, and Xiaoyi Bao

Spectroscopy

  • Optics Express Vol. 20, Iss. 18, pp. 19769–19777 (2012)
  • W. Qiao, D. Stephan, M. Hasselbeck, Q. Liang, and T. Dekorsy

  • Optics Express Vol. 20, Iss. 18, pp. 19850–19858 (2012)
  • Sheng-Di Lin, Ying-Jhe Fu, and Chun Cheng

  • Optics Express Vol. 20, Iss. 18, pp. 20011–20020 (2012)
  • J. A. Frey and J. Berezovsky

Thin Films

  • Optics Express Vol. 20, Iss. 18, pp. 20266–20275 (2012)
  • Jeremy Ball, Anthony Centeno, Budhika G. Mendis, H. S. Reehal, and Neil Alford

  • Optics Express Vol. 20, Iss. 18, pp. 20576–20581 (2012)
  • Jung Woo Leem and Jae Su Yu

Ultrafast Optics

  • Optics Express Vol. 20, Iss. 18, pp. 19778–19786 (2012)
  • T. I. Oh, Y. S. You, and K. Y. Kim

  • Optics Express Vol. 20, Iss. 18, pp. 19799–19805 (2012)
  • Xin-ben Zhang, Xian Zhu, Xiang Chen, Hai-qing Li, Jing-gang Peng, Neng-li Dai, and Jin-yan Li

  • Optics Express Vol. 20, Iss. 18, pp. 20783–20789 (2012)
  • Minwoo Yi, Hyosub Kim, Kyong Hwan Jin, Jong Chul Ye, and Jaewook Ahn

Vision, Color, and Visual Optics

  • Optics Express Vol. 20, Iss. 18, pp. 20059–20070 (2012)
  • Yao-Fang Hsieh, Mang Ou-Yang, Ting-Wei Huang, and Cheng-Chung Lee
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