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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 20 — Sep. 24, 2012
  • pp: 21833–22975

Optics InfoBase > Optics Express > Volume 20 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Adaptive Optics
  • Atomic and Molecular Physics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optics in Computing
  • Optoelectronics
  • Photonic Crystals
  • Physical Optics
  • Remote Sensing
  • Sensors
  • Solar Energy
  • Thin Films
  • Ultrafast Optics
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Adaptive Optics

  • Optics Express Vol. 20, Iss. 20, pp. 22143–22157 (2012)
  • Xiang Lei, Shuai Wang, Hu Yan, Wenjin Liu, Lizhi Dong, Ping Yang, and Bing Xu

Atomic and Molecular Physics

  • Optics Express Vol. 20, Iss. 20, pp. 22675–22682 (2012)
  • Ching-Hao Wang, Tzay-Ming Hong, Ray-Kuang Lee, and Daw-Wei Wang

Detectors

  • Optics Express Vol. 20, Iss. 20, pp. 22391–22397 (2012)
  • Arvind P. Ravikumar, Adrian Alfaro-Martinez, Guopeng Chen, Kuaile Zhao, Maria C. Tamargo, Claire F. Gmachl, and Aidong Shen

  • Optics Express Vol. 20, Iss. 20, pp. 22735–22742 (2012)
  • Krishna C. Balram and David A. B. Miller

Diffraction and Gratings

  • Optics Express Vol. 20, Iss. 20, pp. 21917–21923 (2012)
  • K. Walls, Q. Chen, J. Grant, S. Collins, D.R.S. Cumming, and T.D. Drysdale

  • Optics Express Vol. 20, Iss. 20, pp. 22555–22562 (2012)
  • Stefan Steiner, Stefanie Kroker, Thomas Käsebier, Ernst-Bernhard Kley, and Andreas Tünnermann

  • Optics Express Vol. 20, Iss. 20, pp. 22579–22584 (2012)
  • Lauren A. H. Fleming, Stefan Wackerow, Andrew C. Hourd, W. Allan Gillespie, Gerhard Seifert, and Amin Abdolvand

  • Optics Express Vol. 20, Iss. 20, pp. 22627–22635 (2012)
  • Yaxin Zhang and Liang Dong

  • Optics Express Vol. 20, Iss. 20, pp. 22830–22846 (2012)
  • Igor Bendoym, Andrii B. Golovin, and David T. Crouse

Fiber Optics and Optical Communications

  • Optics Express Vol. 20, Iss. 20, pp. 21833–21839 (2012)
  • Xinying Li, Jianjun Yu, Ze Dong, Junwen Zhang, Yufeng Shao, and Nan Chi

  • Optics Express Vol. 20, Iss. 20, pp. 22284–22289 (2012)
  • J. L. Wei, L. Geng, D.G. Cunningham, R.V. Penty, and I. H. White

  • Optics Express Vol. 20, Iss. 20, pp. 22429–22441 (2012)
  • L. Rodriguez-Cobo, A. Cobo, and J. M. Lopez-Higuera

  • Optics Express Vol. 20, Iss. 20, pp. 22523–22530 (2012)
  • Yiran Ma, Dekun Liu, Jingwen Yu, and Xiaomu Wang

  • Optics Express Vol. 20, Iss. 20, pp. 22537–22554 (2012)
  • M. Sumetsky

  • Optics Express Vol. 20, Iss. 20, pp. 22878–22885 (2012)
  • Bo Liu, Lijia Zhang, Xiangjun Xin, and Jianjun Yu

  • Optics Express Vol. 20, Iss. 20, pp. 22252–22261 (2012)
  • Wenguang Hou, Mingyue Ding, Nannan Qin, and Xudong Lai

Holography

  • Optics Express Vol. 20, Iss. 20, pp. 22334–22343 (2012)
  • Martin Persson, David Engström, and Mattias Goksör

  • Optics Express Vol. 20, Iss. 20, pp. 22636–22648 (2012)
  • Nektarios Koukourakis, Volker Jaedicke, Adamou Adinda-Ougba, Sebastian Goebel, Helge Wiethoff, Henning Höpfner, Nils C. Gerhardt, and Martin R. Hofmann

  • Optics Express Vol. 20, Iss. 20, pp. 22860–22871 (2012)
  • F. Verpillat, F. Joud, M. Atlan, and M. Gross

Image Processing

  • Optics Express Vol. 20, Iss. 20, pp. 22048–22062 (2012)
  • D. R. Golish, E. M. Vera, K. J. Kelly, Q. Gong, P. A. Jansen, J. M. Hughes, D. S. Kittle, D. J. Brady, and M. E. Gehm

  • Optics Express Vol. 20, Iss. 20, pp. 22102–22117 (2012)
  • Jun Ke and Edmund Y. Lam

  • Optics Express Vol. 20, Iss. 20, pp. 22454–22464 (2012)
  • ChoongSang Cho, ByeongHo Choi, Hoonjong Kang, and Sangkeun Lee

  • Optics Express Vol. 20, Iss. 20, pp. 22847–22859 (2012)
  • Jacques Machizaud and Thierry Fournel

Imaging Systems

  • Optics Express Vol. 20, Iss. 20, pp. 21953–21967 (2012)
  • Krystal L. Sly, Trang T. Nguyen, and John C. Conboy

  • Optics Express Vol. 20, Iss. 20, pp. 22245–22251 (2012)
  • Sa Yu, Jun Zhang, Marina S. Moran, Jun Q. Lu, Yuanming Feng, and Xin-Hua Hu

  • Optics Express Vol. 20, Iss. 20, pp. 22262–22277 (2012)
  • Jonghwan Lee, Weicheng Wu, James Y. Jiang, Bo Zhu, and David A. Boas

  • Optics Express Vol. 20, Iss. 20, pp. 22360–22371 (2012)
  • Chuanmao Fan and Gang Yao

  • Optics Express Vol. 20, Iss. 20, pp. 22712–22719 (2012)
  • A. Buehler, X. L. Deán-Ben, J. Claussen, V. Ntziachristos, and D. Razansky

  • Optics Express Vol. 20, Iss. 20, pp. 22914–22921 (2012)
  • Koji Uematsu, Ken-ichiro Maki, and Chiko Otani

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 20, pp. 21905–21916 (2012)
  • Fang Zhang, Zhitao Xiao, Jun Wu, Lei Geng, Hongqiang Li, Jiangtao Xi, and Jinjiang Wang

  • Optics Express Vol. 20, Iss. 20, pp. 21932–21939 (2012)
  • Julien Roy, Jean-Daniel Deschênes, Simon Potvin, and Jérôme Genest

  • Optics Express Vol. 20, Iss. 20, pp. 22034–22041 (2012)
  • Kensuke Matsubara, Hidekazu Hachisu, Ying Li, Shigeo Nagano, Clayton Locke, Asahiko Nogami, Masatoshi Kajita, Kazuhiro Hayasaka, Tetsuya Ido, and Mizuhiko Hosokawa

  • Optics Express Vol. 20, Iss. 20, pp. 22079–22086 (2012)
  • Banghong Guo, Tao Gui, Zhaohui Li, Yuan Bao, Xingwen Yi, Jianping Li, Xinhuan Feng, and Songhao Liu

  • Optics Express Vol. 20, Iss. 20, pp. 22118–22133 (2012)
  • Benoit Fond, Christopher Abram, Andrew L Heyes, Andreas M Kempf, and Frank Beyrau

  • Optics Express Vol. 20, Iss. 20, pp. 22195–22207 (2012)
  • Andrew J. Sutton, Oliver Gerberding, Gerhard Heinzel, and Daniel A. Shaddock

Integrated Optics

  • Optics Express Vol. 20, Iss. 20, pp. 21840–21846 (2012)
  • Wei Shi, Han Yun, Wen Zhang, Charlie Lin, Ting Kai Chang, Yun Wang, Nicolas A. F. Jaeger, and Lukas Chrostowski

  • Optics Express Vol. 20, Iss. 20, pp. 21875–21887 (2012)
  • Min-Suk Kwon, Jin-Soo Shin, Sang-Yung Shin, and Wan-Gyu Lee

  • Optics Express Vol. 20, Iss. 20, pp. 22224–22232 (2012)
  • Dazeng Feng, Shirong Liao, Hong Liang, Joan Fong, Bhavin Bijlani, Roshanak Shafiiha, B. Jonathan Luff, Ying Luo, Jack Cunningham, Ashok V. Krishnamoorthy, and Mehdi Asghari

  • Optics Express Vol. 20, Iss. 20, pp. 22278–22283 (2012)
  • D. Vermeulen, Y. De Koninck, Y. Li, E. Lambert, W. Bogaerts, R. Baets, and G. Roelkens

  • Optics Express Vol. 20, Iss. 20, pp. 22298–22307 (2012)
  • Xiaomin Zhang, Mark Harrison, Audrey Harker, and Andrea M. Armani

  • Optics Express Vol. 20, Iss. 20, pp. 22308–22313 (2012)
  • Fredrik Laurell, Thomas Calmano, Sebastian Müller, Peter Zeil, Carlota Canalias, and Günter Huber

  • Optics Express Vol. 20, Iss. 20, pp. 22314–22326 (2012)
  • Mohammad Soltani, James T. Inman, Michal Lipson, and Michelle D. Wang

  • Optics Express Vol. 20, Iss. 20, pp. 22398–22405 (2012)
  • Chao Xu, Yichang Jin, Longzhi Yang, Jianyi Yang, and Xiaoqing Jiang

  • Optics Express Vol. 20, Iss. 20, pp. 22465–22474 (2012)
  • Hong C. Nguyen, Satoshi Hashimoto, Mizuki Shinkawa, and Toshihiko Baba

  • Optics Express Vol. 20, Iss. 20, pp. 22490–22502 (2012)
  • Sébastien Cueff, Christophe Labbé, Olivier Jambois, Yonder Berencén, Anthony J. Kenyon, Blas Garrido, and Richard Rizk

  • Optics Express Vol. 20, Iss. 20, pp. 22609–22615 (2012)
  • C. Grillet, L. Carletti, C. Monat, P. Grosse, B. Ben Bakir, S. Menezo, J. M. Fedeli, and D. J. Moss

  • Optics Express Vol. 20, Iss. 20, pp. 22660–22668 (2012)
  • Emil Kleijn, Peter J. Williams, Neil D. Whitbread, Michael J. Wale, Meint K. Smit, and Xaveer J.M. Leijtens

  • Optics Express Vol. 20, Iss. 20, pp. 22728–22734 (2012)
  • Arash Mokhtari, Stefan Preußler, Kambiz Jamshidi, Mahmood Akbari, and Thomas Schneider

  • Optics Express Vol. 20, Iss. 20, pp. 22872–22877 (2012)
  • Yu-Hsin Yao, Chun-Ta Wang, Rui-Ren Chen, Hung-Chang Jau, Yi-Jen Chiu, and Tsung-Hsien Lin

  • Optics Express Vol. 20, Iss. 20, pp. 22934–22942 (2012)
  • Fernando Ramiro-Manzano, Nikola Prtljaga, Lorenzo Pavesi, Georg Pucker, and Mher Ghulinyan

Laser Microfabrication

  • Optics Express Vol. 20, Iss. 20, pp. 22922–22933 (2012)
  • D. Barat, V. Bardinal, I. Dika, O. Soppera, P. Debernardi, A. Rumyantseva, B. Reig, M. Renault, T. Camps, A. Bruyant, J.B. Doucet, J.P. Malval, and E. Daran

Lasers and Laser Optics

  • Optics Express Vol. 20, Iss. 20, pp. 21992–22000 (2012)
  • M. Siebold, M. Loeser, F. Roeser, M. Seltmann, G. Harzendorf, I. Tsybin, S. Linke, S. Banerjee, P. D. Mason, P. J. Phillips, K. Ertel, J. C. Collier, and U. Schramm

  • Optics Express Vol. 20, Iss. 20, pp. 22042–22047 (2012)
  • Nicola Coluccelli, Helge Fonnum, Magnus Haakestad, Alessio Gambetta, Davide Gatti, Marco Marangoni, Paolo Laporta, and Gianluca Galzerano

  • Optics Express Vol. 20, Iss. 20, pp. 22095–22101 (2012)
  • Xiang Gao, Guoying Feng, Jinghua Han, and Lingling Zhai

  • Optics Express Vol. 20, Iss. 20, pp. 22134–22142 (2012)
  • Angela Pirri, Guido Toci, Martin Nikl, and Matteo Vannini

  • Optics Express Vol. 20, Iss. 20, pp. 22188–22194 (2012)
  • Nicolas Caron, Martin Bernier, Dominic Faucher, and Réal Vallée

  • Optics Express Vol. 20, Iss. 20, pp. 22442–22447 (2012)
  • Jiang Liu, Qian Wang, and Pu Wang

  • Optics Express Vol. 20, Iss. 20, pp. 22448–22453 (2012)
  • S.D. Liu, L.H. Zheng, J.L. He, J. Xu, X.D. Xu, L.B. Su, K.J. Yang, B.T. Zhang, R.H. Wang, and X.M. Liu

  • Optics Express Vol. 20, Iss. 20, pp. 22481–22489 (2012)
  • Antonio Consoli and Ignacio Esquivias

  • Optics Express Vol. 20, Iss. 20, pp. 22503–22516 (2012)
  • Lilia Mashal, Guy Van der Sande, Lendert Gelens, Jan Danckaert, and Guy Verschaffelt

  • Optics Express Vol. 20, Iss. 20, pp. 22563–22568 (2012)
  • Y. J. Rao, W. L. Zhang, J. M. Zhu, Z. X. Yang, Z. N. Wang, and X. H. Jia

  • Optics Express Vol. 20, Iss. 20, pp. 22602–22608 (2012)
  • W. Z. Zhuang, Yi-Fan Chen, K. W. Su, K. F. Huang, and Y. F. Chen

  • Optics Express Vol. 20, Iss. 20, pp. 22669–22674 (2012)
  • Miro Erkintalo, Claude Aguergaray, Antoine Runge, and Neil G. R. Broderick

  • Optics Express Vol. 20, Iss. 20, pp. 22692–22699 (2012)
  • Sandro Perrone, Ramon Vilaseca, and Cristina Masoller

  • Optics Express Vol. 20, Iss. 20, pp. 22895–22901 (2012)
  • Marc Fabert, Agnès Desfarges-Berthelemot, Vincent Kermène, and Aurelian Crunteanu

Materials

  • Optics Express Vol. 20, Iss. 20, pp. 21860–21874 (2012)
  • Shao-Ying Ting, Yu-Feng Yao, Wei-Lun Chung, Wen-Ming Chang, Chih-Yen Chen, Hao-Tsung Chen, Che-Hao Liao, Horng-Shyang Chen, Chieh Hsieh, and C. C. Yang

  • Optics Express Vol. 20, Iss. 20, pp. 22569–22578 (2012)
  • Jiayu Zheng, Mingying Peng, Fengwen Kang, Renping Cao, Zhijun Ma, Guoping Dong, Jianrong Qiu, and Shanhui Xu

Medical Optics and Biotechnology

  • Optics Express Vol. 20, Iss. 20, pp. 22158–22171 (2012)
  • Yi Hong Ong, Mayasari Lim, and Quan Liu

  • Optics Express Vol. 20, Iss. 20, pp. 22649–22659 (2012)
  • Zhaohui Wang, Seunghan Ha, and Kang Kim

  • Optics Express Vol. 20, Iss. 20, pp. 22796–22812 (2012)
  • Kazuhiro Kurokawa, Kazuhiro Sasaki, Shuichi Makita, Young-Joo Hong, and Yoshiaki Yasuno

Metamaterials

  • Optics Express Vol. 20, Iss. 20, pp. 21968–21976 (2012)
  • He-Xiu Xu, Guang-Ming Wang, Mei-Qing Qi, and Hui-Yong Zeng

  • Optics Express Vol. 20, Iss. 20, pp. 22372–22382 (2012)
  • Yingran He, Sailing He, Jie Gao, and Xiaodong Yang

  • Optics Express Vol. 20, Iss. 20, pp. 22406–22411 (2012)
  • Wangren Xu, Willie J. Padilla, and Sameer Sonkusale

  • Optics Express Vol. 20, Iss. 20, pp. 22700–22711 (2012)
  • Philipp Schau, Liwei Fu, Karsten Frenner, M. Schäferling, Heinz Schweizer, Harald Giessen, Luis Miguel Gaspar Venancio, and Wolfgang Osten

Microscopy

  • Optics Express Vol. 20, Iss. 20, pp. 21924–21931 (2012)
  • Ugo Siciliani de Cumis, Ji-Hua Xu, Luca Masini, Riccardo Degl’Innocenti, Pasqualantonio Pingue, Fabio Beltram, Alessandro Tredicucci, Miriam S. Vitiello, Pier Alberto Benedetti, Harvey E. Beere, and David A. Ritchie

  • Optics Express Vol. 20, Iss. 20, pp. 22383–22390 (2012)
  • Christian Graulig, Mario Kanka, and Rainer Riesenberg

  • Optics Express Vol. 20, Iss. 20, pp. 22585–22601 (2012)
  • Alexander P. Fields and Adam E. Cohen

  • Optics Express Vol. 20, Iss. 20, pp. 22720–22727 (2012)
  • Alexandre S. Goy and Demetri Psaltis

  • Optics Express Vol. 20, Iss. 20, pp. 22953–22960 (2012)
  • Yao Ting Wang, Bo Han Cheng, You Zhe Ho, Yung-Chiang Lan, Pi-Gang Luan, and Din Ping Tsai

Nonlinear Optics

  • Optics Express Vol. 20, Iss. 20, pp. 21940–21945 (2012)
  • Jiabao Li, Xiaosheng Xiao, Lingjie Kong, and Changxi Yang

  • Optics Express Vol. 20, Iss. 20, pp. 21977–21991 (2012)
  • Ryan M. Camacho

  • Optics Express Vol. 20, Iss. 20, pp. 22753–22762 (2012)
  • U. K. Sapaev, I. Babushkin, and J. Herrmann

Optical Design and Fabrication

  • Optics Express Vol. 20, Iss. 20, pp. 22683–22691 (2012)
  • Ilhan Kaya, Kevin P. Thompson, and Jannick P. Rolland

  • Optics Express Vol. 20, Iss. 20, pp. 22819–22829 (2012)
  • Tong Chen, Hansuek Lee, Jiang Li, and Kerry J. Vahala

Optical Devices

  • Optics Express Vol. 20, Iss. 20, pp. 22012–22017 (2012)
  • Torsten Beck, Steffen Schloer, Tobias Grossmann, Timo Mappes, and Heinz Kalt

  • Optics Express Vol. 20, Iss. 20, pp. 22327–22333 (2012)
  • Zhi Liu, Weixuan Hu, Shaojian Su, Chong Li, Chuanbo Li, Chunlai Xue, Yaming Li, Yuhua Zuo, Buwen Cheng, and Qiming Wang

  • Optics Express Vol. 20, Iss. 20, pp. 22531–22536 (2012)
  • Pengxin Chen, Yunpeng Zhu, Yaocheng Shi, Daoxin Dai, and Sailing He

Optical Trapping and Manipulation

  • Optics Express Vol. 20, Iss. 20, pp. 22616–22626 (2012)
  • Lei Shi and Francisco Meseguer

Optics at Surfaces

  • Optics Express Vol. 20, Iss. 20, pp. 21888–21895 (2012)
  • M. Albooyeh and C. R. Simovski

  • Optics Express Vol. 20, Iss. 20, pp. 22063–22078 (2012)
  • Paul Kühler, F. Javier García de Abajo, Philipp Leiprecht, Andreas Kolloch, Javier Solis, Paul Leiderer, and Jan Siegel

  • Optics Express Vol. 20, Iss. 20, pp. 22172–22180 (2012)
  • Chao-Yi Tai and Wen-Hsiang Yu

  • Optics Express Vol. 20, Iss. 20, pp. 22233–22244 (2012)
  • Yin Huang, Changjun Min, and Georgios Veronis

  • Optics Express Vol. 20, Iss. 20, pp. 22290–22297 (2012)
  • Min Song, Gengxu Chen, Yan Liu, E Wu, Botao wu, and Heping Zeng

  • Optics Express Vol. 20, Iss. 20, pp. 22943–22952 (2012)
  • Chih-Yi Liu, Kengchih Liang, Chun-Cheng Chang, and Yonhua Tzeng

Optics in Computing

  • Optics Express Vol. 20, Iss. 20, pp. 22783–22795 (2012)
  • François Duport, Bendix Schneider, Anteo Smerieri, Marc Haelterman, and Serge Massar

Optoelectronics

  • Optics Express Vol. 20, Iss. 20, pp. 21847–21859 (2012)
  • Suguru Akiyama and Shintaro Nomura

  • Optics Express Vol. 20, Iss. 20, pp. 22181–22187 (2012)
  • Andrew Lee, Qi Jiang, Mingchu Tang, Alwyn Seeds, and Huiyun Liu

Photonic Crystals

  • Optics Express Vol. 20, Iss. 20, pp. 22001–22011 (2012)
  • Eloise Van Hooijdonk, Cédric Vandenbem, Serge Berthier, and Jean Pol Vigneron

  • Optics Express Vol. 20, Iss. 20, pp. 22018–22033 (2012)
  • H. Kurt, B. B. Oner, M. Turduev, and I. H. Giden

  • Optics Express Vol. 20, Iss. 20, pp. 22412–22428 (2012)
  • Arthur C. T. Thijssen, Martin J. Cryan, John G. Rarity, and Ruth Oulton

  • Optics Express Vol. 20, Iss. 20, pp. 22743–22752 (2012)
  • Ryo Terawaki, Yasushi Takahashi, Masahiro Chihara, Yoshitaka Inui, and Susumu Noda

  • Optics Express Vol. 20, Iss. 20, pp. 22763–22769 (2012)
  • Sahand Mahmoodian, J.E. Sipe, Christopher G. Poulton, Kokou B. Dossou, Lindsay C. Botten, Ross C. McPhedran, and C. Martijn de Sterke

  • Optics Express Vol. 20, Iss. 20, pp. 22902–22913 (2012)
  • T. Denis, B. Reijnders, J. H. H. Lee, P. J. M. van der Slot, W. L. Vos, and K.-J. Boller

Physical Optics

  • Optics Express Vol. 20, Iss. 20, pp. 21896–21904 (2012)
  • Ryo Imai, Natsuki Kanda, Takuya Higuchi, Zhu Zheng, Kuniaki Konishi, and Makoto Kuwata-Gonokami

  • Optics Express Vol. 20, Iss. 20, pp. 22961–22975 (2012)
  • F. Ricci, W. Löffler, and M.P. van Exter

Remote Sensing

  • Optics Express Vol. 20, Iss. 20, pp. 22344–22359 (2012)
  • Kristan P. Gurton and Melvin Felton

Sensors

  • Optics Express Vol. 20, Iss. 20, pp. 21946–21952 (2012)
  • Marta S. Ferreira, Jörg Bierlich, Jens Kobelke, Kay Schuster, José L. Santos, and Orlando Frazão

  • Optics Express Vol. 20, Iss. 20, pp. 22208–22223 (2012)
  • U. C. Hasar, I. Y. Ozbek, E. A. Oral, T. Karacali, and H. Efeoglu

  • Optics Express Vol. 20, Iss. 20, pp. 22517–22522 (2012)
  • Liang Gao, Lin Chen, Long Huang, and Xiangfei Chen

  • Optics Express Vol. 20, Iss. 20, pp. 22813–22818 (2012)
  • C. R. Liao, T.Y. Hu, and D. N. Wang

Solar Energy

  • Optics Express Vol. 20, Iss. 20, pp. 22087–22094 (2012)
  • Ying Qiu, Hong-Chen Hao, Jing Zhou, and Ming Lu

Thin Films

  • Optics Express Vol. 20, Iss. 20, pp. 22770–22782 (2012)
  • Radu Malureanu, Maksim Zalkovskij, Zhengyong Song, Claudia Gritti, Andrei Andryieuski, Qiong He, Lei Zhou, Peter Uhd Jepsen, and Andrei V. Lavrinenko

Ultrafast Optics

  • Optics Express Vol. 20, Iss. 20, pp. 22475–22480 (2012)
  • G. Bonanno, S. Bivona, R. Burlon, and C. Leone

  • Optics Express Vol. 20, Iss. 20, pp. 22886–22894 (2012)
  • Simon Toft Sørensen, Casper Larsen, Uffe Møller, Peter M. Moselund, Carsten L. Thomsen, and Ole Bang
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