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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 28 — Dec. 31, 2012
  • pp: 29137–29948

Optics InfoBase > Optics Express > Volume 20 > Issue 28 > Table of Contents

Topics in this Issue

 
  • Access Networks and LAN
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Backbone and Core Networks
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optoelectronics
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Remote Sensing
  • Scattering
  • Sensors
  • Solar Energy
  • Spectroscopy
  • Subsystems for Optical Networks
  • Transmission Systems and Network Elements
  • Ultrafast Optics
  • Waveguide and Optoelectronic Devices
  • X-ray Optics
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Access Networks and LAN

  • Optics Express Vol. 20, Iss. 28, pp. 29395–29403 (2012)
  • Atsushi Kanno, Toshiaki Kuri, Iwao Hosako, Tetsuya Kawanishi, Yuki Yoshida, Yoshihiro Yasumura, and Ken-ichi Kitayama

  • Optics Express Vol. 20, Iss. 28, pp. 29769–29775 (2012)
  • Marta Beltrán, Yan Shi, Chigo Okonkwo, Roberto Llorente, Eduward Tangdiongga, and Ton Koonen

Atmospheric and Oceanic Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29553–29567 (2012)
  • Matthew Hayman, Scott Spuler, Bruce Morley, and Joseph VanAndel

  • Optics Express Vol. 20, Iss. 28, pp. 29867–29881 (2012)
  • Joshua L. Santarpia, Yong-Le Pan, Steven C. Hill, Neal Baker, Brian Cottrell, Laura McKee, Shanna Ratnesar-Shumate, and Ronald G. Pinnick

Atomic and Molecular Physics

  • Optics Express Vol. 20, Iss. 28, pp. 29217–29222 (2012)
  • Theo Scholtes, Volkmar Schultze, Rob IJsselsteijn, Stefan Woetzel, and Hans-Georg Meyer

  • Optics Express Vol. 20, Iss. 28, pp. 29540–29552 (2012)
  • Radosław Chrapkiewicz and Wojciech Wasilewski

  • Optics Express Vol. 20, Iss. 28, pp. 29634–29645 (2012)
  • Laurin Ostermann, Hashem Zoubi, and Helmut Ritsch

Backbone and Core Networks

  • Optics Express Vol. 20, Iss. 28, pp. 29137–29142 (2012)
  • R. Casellas, R. Martinez, R. Muñoz, L. Liu, T. Tsuritani, and I. Morita

  • Optics Express Vol. 20, Iss. 28, pp. 29143–29148 (2012)
  • Ming Xia, R. Proietti, Stefan Dahlfort, and S. J. B. Yoo

  • Optics Express Vol. 20, Iss. 28, pp. 29149–29154 (2012)
  • Ricard Vilalta, Raul Muñoz, Ramon Casellas, and Ricardo Martinez

Detectors

  • Optics Express Vol. 20, Iss. 28, pp. 29338–29346 (2012)
  • Tsung-Ting Wu, Ching-Yang Chou, Ming-Chang M. Lee, and Neil Na

  • Optics Express Vol. 20, Iss. 28, pp. 29568–29568 (2012)
  • Pin Jern Ker, John P. R. David, and Chee Hing Tan

  • Optics Express Vol. 20, Iss. 28, pp. 29823–29837 (2012)
  • Woo-Yong Jang, Majeed M. Hayat, Payman Zarkesh-Ha, and Sanjay Krishna

Diffraction and Gratings

  • Optics Express Vol. 20, Iss. 28, pp. 29155–29163 (2012)
  • Y. Jourlin, S. Tonchev, A.V. Tishchenko, F. Lacour, and O. Parriaux

  • Optics Express Vol. 20, Iss. 28, pp. 29319–29328 (2012)
  • Mykola Kulishov and Bernard Kress

Fiber Optics and Optical Communications

  • Optics Express Vol. 20, Iss. 28, pp. 29378–29385 (2012)
  • Linh Viet Nguyen, Stephen C. Warren-Smith, Alan Cooper, and Tanya M. Monro

  • Optics Express Vol. 20, Iss. 28, pp. 29386–29394 (2012)
  • Zhenggang Lian, Peter Horak, Xian Feng, Limin Xiao, Ken Frampton, Nicholas White, John A. Tucknott, Harvey Rutt, David N. Payne, Will Stewart, and Wei H. Loh

  • Optics Express Vol. 20, Iss. 28, pp. 29507–29517 (2012)
  • Hualong Bao, Kristian Nielsen, Henrik K. Rasmussen, Peter Uhd Jepsen, and Ole Bang

  • Optics Express Vol. 20, Iss. 28, pp. 29590–29598 (2012)
  • S. Straullu, F. Forghieri, V. Ferrero, and R. Gaudino

  • Optics Express Vol. 20, Iss. 28, pp. 29599–29604 (2012)
  • Junwen Zhang, Jianjun Yu, Nan Chi, Ze Dong, Xinying Li, and G. K. Chang

  • Optics Express Vol. 20, Iss. 28, pp. 29613–29619 (2012)
  • Xinying Li, Jianjun Yu, Nan Chi, Ze Dong, Junwen Zhang, and Jianguo Yu

  • Optics Express Vol. 20, Iss. 28, pp. 29665–29672 (2012)
  • Li Tao, Jianjun Yu, Qi Yang, Ming Luo, Zhixue He, Yufeng Shao, Junwen Zhang, and Nan Chi

  • Optics Express Vol. 20, Iss. 28, pp. 29751–29760 (2012)
  • Hicham El Hamzaoui, Youcef Ouerdane, Laurent Bigot, Géraud Bouwmans, Bruno Capoen, Aziz Boukenter, Sylvain Girard, and Mohamed Bouazaoui

  • Optics Express Vol. 20, Iss. 28, pp. 29784–29797 (2012)
  • S. D. Emami, H. A. A. Rashid, A. Zarifi, A. Zarei, M. R. K. Soltanian, S. Z. M. Yasin, H. Ahmad, and S. W. Harun

  • Optics Express Vol. 20, Iss. 28, pp. 29838–29843 (2012)
  • Wangzhe Li, Weifeng Zhang, and Jianping Yao

  • Optics Express Vol. 20, Iss. 28, pp. 29931–29939 (2012)
  • Min Zhu, Wen-De Zhong, Zhenrong Zhang, and Feng Luan

Fourier Optics and Signal Processing

  • Optics Express Vol. 20, Iss. 28, pp. 29854–29866 (2012)
  • Pavel V. Yezhov, Alexander V. Kuzmenko, Jin-Tae Kim, and Tatiana N. Smirnova

Holography

  • Optics Express Vol. 20, Iss. 28, pp. 29844–29853 (2012)
  • Hoon Song, Geeyoung Sung, Sujin Choi, Kanghee Won, Hong-Seok Lee, and Hwi Kim

Image Processing

  • Optics Express Vol. 20, Iss. 28, pp. 29210–29216 (2012)
  • S. Flewett, C. M. Günther, C. von Korff Schmising, B. Pfau, J. Mohanty, F. Büttner, M. Riemeier, M. Hantschmann, M. Kläui, and S. Eisebitt

Imaging Systems

  • Optics Express Vol. 20, Iss. 28, pp. 29196–29209 (2012)
  • John A. Rogers, Adrian Bradu, and Adrian Gh. Podoleanu

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 28, pp. 29185–29195 (2012)
  • Xiaoyu Ma, Changhui Rao, Kai Wei, Youming Guo, and Xuejun Rao

  • Optics Express Vol. 20, Iss. 28, pp. 29347–29352 (2012)
  • Hidemi Tsuchida

  • Optics Express Vol. 20, Iss. 28, pp. 29457–29471 (2012)
  • Anthony C. Cheetham, Peter G. Tuthill, Anand Sivaramakrishnan, and James P. Lloyd

Integrated Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29309–29318 (2012)
  • Patrik Rugeland, Oleksandr Tarasenko, and Walter Margulis

  • Optics Express Vol. 20, Iss. 28, pp. 29620–29625 (2012)
  • Can Zhang, Song Liang, Hongliang Zhu, Baojun Wang, and Wei Wang

Laser Microfabrication

  • Optics Express Vol. 20, Iss. 28, pp. 29882–29889 (2012)
  • S. H. Messaddeq, R. Vallée, P. Soucy, M. Bernier, M. El-Amraoui, and Y. Messaddeq

  • Optics Express Vol. 20, Iss. 28, pp. 29890–29899 (2012)
  • Tommaso Baldacchini, Scott Snider, and Ruben Zadoyan

  • Optics Express Vol. 20, Iss. 28, pp. 29900–29908 (2012)
  • D Pietroy, Y Di Maio, B Moine, E Baubeau, and E Audouard

Lasers and Laser Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29472–29478 (2012)
  • Guanzhong Wang, Xiaoshun Jiang, Mingxiao Zhao, Yaoguang Ma, Huibo Fan, Qing Yang, Limin Tong, and Min Xiao

  • Optics Express Vol. 20, Iss. 28, pp. 29518–29523 (2012)
  • Hee-Won Yang, Chur Kim, Sun Young Choi, Guang-Hoon Kim, Yohei Kobayashi, Fabian Rotermund, and Jungwon Kim

  • Optics Express Vol. 20, Iss. 28, pp. 29524–29530 (2012)
  • Chur Kim, Kwangyun Jung, Khanh Kieu, and Jungwon Kim

  • Optics Express Vol. 20, Iss. 28, pp. 29531–29539 (2012)
  • Ryo Yasuhara, Hiroaki Furuse, Akifumi Iwamoto, Junji Kawanaka, and Takagimi Yanagitani

  • Optics Express Vol. 20, Iss. 28, pp. 29659–29664 (2012)
  • Shou-Tai Lin and Chuan-Sheng Hsieh

  • Optics Express Vol. 20, Iss. 28, pp. 29798–29806 (2012)
  • L. M. Baumgartel, R. J. Thompson, and N. Yu

Materials

  • Optics Express Vol. 20, Iss. 28, pp. 29266–29275 (2012)
  • Le Dac Tuyen, An Chi Liu, Chia-Chi Huang, Pei-Cheng Tsai, Jian Hung Lin, Chin-Wei Wu, Lai-Kwan Chau, Tzyy Schiuan Yang, Le Quoc Minh, Hung-Chih Kan, and Chia Chen Hsu

  • Optics Express Vol. 20, Iss. 28, pp. 29743–29750 (2012)
  • RongFei Wei, ChongGeng Ma, YunLe Wei, JiaYu Gao, and Hai Guo

Medical Optics and Biotechnology

  • Optics Express Vol. 20, Iss. 28, pp. 29479–29487 (2012)
  • Soon Joon Yoon, Avinash Murthy, Keith P. Johnston, Konstantin V. Sokolov, and Stanislav Y. Emelianov

  • Optics Express Vol. 20, Iss. 28, pp. 29807–29822 (2012)
  • Caigang Zhu and Quan Liu

Metamaterials

  • Optics Express Vol. 20, Iss. 28, pp. 29447–29456 (2012)
  • Arash Farhang, S. Anantha Ramakrishna, and Olivier J. F. Martin

Microscopy

  • Optics Express Vol. 20, Iss. 28, pp. 29353–29360 (2012)
  • Wonseok Hwang, Sangsu Bae, and Sungchul Hohng

  • Optics Express Vol. 20, Iss. 28, pp. 29369–29377 (2012)
  • Giuseppe de Vito, Angelo Bifone, and Vincenzo Piazza

  • Optics Express Vol. 20, Iss. 28, pp. 29626–29633 (2012)
  • Francesco De Angelis, Remo Proietti Zaccaria, and Enzo Di Fabrizio

  • Optics Express Vol. 20, Iss. 28, pp. 29694–29704 (2012)
  • Christophe Silien, Ning Liu, Nordine Hendaoui, Syed A. M. Tofail, and André Peremans

  • Optics Express Vol. 20, Iss. 28, pp. 29705–29716 (2012)
  • Annalisa De Angelis, Alexis Labruyère, Vincent Couderc, Philippe Leproux, Alessandro Tonello, Hiroki Segawa, Masanari Okuno, Hideaki Kano, Delia Arnaud-Cormos, Philippe Lévèque, and Hiro-o Hamaguchi

Nonlinear Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29923–29930 (2012)
  • Ghazal Hajisalem, Aftab Ahmed, Yuanjie Pang, and Reuven Gordon

  • Optics Express Vol. 20, Iss. 28, pp. 29940–29948 (2012)
  • Luis Mateos, Pablo Molina, Juan Galisteo, Cefe López, Luisa E. Bausá, and Mariola O Ramírez

Optical Devices

  • Optics Express Vol. 20, Iss. 28, pp. 29260–29265 (2012)
  • Toshitaka Wakayama, Kazuki Komaki, Yukitoshi Otani, and Toru Yoshizawa

  • Optics Express Vol. 20, Iss. 28, pp. 29500–29506 (2012)
  • L. Lever, Z. Ikonić, and R. W. Kelsall

  • Optics Express Vol. 20, Iss. 28, pp. 29605–29612 (2012)
  • Eui Su Lee and Tae-In Jeon

Optical Trapping and Manipulation

  • Optics Express Vol. 20, Iss. 28, pp. 29679–29693 (2012)
  • D. B. Phillips, G. M. Gibson, R. Bowman, M. J. Padgett, S. Hanna, D. M. Carberry, M. J. Miles, and S. H. Simpson

Optics at Surfaces

  • Optics Express Vol. 20, Iss. 28, pp. 29646–29658 (2012)
  • A. Mendoza-Galván, K. Järrendahl, A. Dmitriev, T. Pakizeh, M. Käll, and H. Arwin

  • Optics Express Vol. 20, Iss. 28, pp. 29909–29922 (2012)
  • Xiaojin Jiao and Steve Blair

Optoelectronics

  • Optics Express Vol. 20, Iss. 28, pp. 29164–29173 (2012)
  • Elizabeth H. Edwards, Ross M. Audet, Edward T. Fei, Stephanie A. Claussen, Rebecca K. Schaevitz, Emel Tasyurek, Yiwen Rong, Theodore I. Kamins, James S. Harris, and David A. B. Miller

  • Optics Express Vol. 20, Iss. 28, pp. 29223–29236 (2012)
  • Aleksandr Biberman, Erman Timurdogan, William A. Zortman, Douglas C. Trotter, and Michael R. Watts

  • Optics Express Vol. 20, Iss. 28, pp. 29252–29259 (2012)
  • A. Coens, M. Chakaroun, A. P. A. Fischer, M. W. Lee, A. Boudrioua, B. Geffroy, and G. Vemuri

Photonic Crystals

  • Optics Express Vol. 20, Iss. 28, pp. 29361–29368 (2012)
  • Christian Reimer, Milos Nedeljkovic, David J. M. Stothard, Matthieu O. S. Esnault, Christopher Reardon, Liam O’Faolain, Malcolm Dunn, Goran Z. Mashanovich, and Thomas F. Krauss

  • Optics Express Vol. 20, Iss. 28, pp. 29673–29678 (2012)
  • Yongsheng Zhu, Wen Xu, Hanzhuang Zhang, Sai Xu, Yunfeng Wang, Qinlin Dai, Biao Dong, Lin Xu, and Hongwei Song

Physical Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29276–29283 (2012)
  • Zhijun Ren, Liangwei Dong, Chaofu Ying, and Changjiang Fan

Quantum Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29174–29184 (2012)
  • Alex Hayat, Xingxing Xing, Amir Feizpour, and Aephraim M. Steinberg

  • Optics Express Vol. 20, Iss. 28, pp. 29761–29768 (2012)
  • Héctor Cruz-Ramírez, Roberto Ramírez-Alarcón, Francisco J. Morelos, Pedro A. Quinto-Su, Julio C. Gutiérrez-Vega, and Alfred B. U’Ren

Remote Sensing

  • Optics Express Vol. 20, Iss. 28, pp. 29413–29425 (2012)
  • Romain Ceolato, Nicolas Riviere, and Laurent Hespel

Scattering

  • Optics Express Vol. 20, Iss. 28, pp. 29237–29251 (2012)
  • Jochen Aulbach, Bergin Gjonaj, Patrick Johnson, and Ad Lagendijk

  • Optics Express Vol. 20, Iss. 28, pp. 29296–29307 (2012)
  • Zhangrong Mei and Olga Korotkova

Sensors

  • Optics Express Vol. 20, Iss. 28, pp. 29426–29446 (2012)
  • Woosung Kim, Sahin Kaya Ozdemir, Jiangang Zhu, Faraz Monifi, Cevayir Coban, and Lan Yang

Solar Energy

  • Optics Express Vol. 20, Iss. 28, pp. 29488–29499 (2012)
  • M. Peters, C. Battaglia, K. Forberich, B. Bläsi, N. Sahraei, and A.G. Aberle

Spectroscopy

  • Optics Express Vol. 20, Iss. 28, pp. 29717–29726 (2012)
  • David J. Hilton

  • Optics Express Vol. 20, Iss. 28, pp. 29727–29742 (2012)
  • Brian Brumfield and Gerard Wysocki

Subsystems for Optical Networks

  • Optics Express Vol. 20, Iss. 28, pp. 29404–29412 (2012)
  • Paraskevas Bakopoulos, Stefanos Dris, Bernhard Schrenk, Ioannis Lazarou, and Hercules Avramopoulos

Transmission Systems and Network Elements

  • Optics Express Vol. 20, Iss. 28, pp. 29776–29783 (2012)
  • Adriana Lobato, Filipe Ferreira, Maxim Kuschnerov, Dirk van den Borne, Sander L. Jansen, Antonio Napoli, Bernhard Spinnler, and Berthold Lankl

Ultrafast Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29284–29295 (2012)
  • Pei-Hsun Wang, Fahmida Ferdous, Houxun Miao, Jian Wang, Daniel E. Leaird, Kartik Srinivasan, Lei Chen, Vladimir Aksyuk, and Andrew M. Weiner

Waveguide and Optoelectronic Devices

  • Optics Express Vol. 20, Iss. 28, pp. 29577–29589 (2012)
  • P. I. Kuindersma, X.J.M. Leijtens, J. H. C. van Zantvoort, and H. de Waardt

X-ray Optics

  • Optics Express Vol. 20, Iss. 28, pp. 29329–29337 (2012)
  • Takuro Tomita, Minoru Yamamoto, Noboru Hasegawa, Kota Terakawa, Yasuo Minami, Masaharu Nishikino, Masahiko Ishino, Takeshi Kaihori, Yoshihiro Ochi, Tetsuya Kawachi, Mitsuru Yamagiwa, and Tohru Suemoto

Errata

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 28, pp. 29308–29308 (2012)
  • Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, and Fred Bijkerk
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