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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 4 — Feb. 13, 2012
  • pp: 3367–4811

Optics InfoBase > Optics Express > Volume 20 > Issue 4 > Table of Contents

Topics in this Issue

 
  • Access Networks and LAN
  • Atmospheric and Oceanic Optics
  • Atomic and Molecular Physics
  • Coherence and Statistical Optics
  • Detectors
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Laser Microfabrication
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Metamaterials
  • Microscopy
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optical Trapping and Manipulation
  • Optics at Surfaces
  • Optics in Computing
  • Optoelectronics
  • Optomechanics
  • Photonic Crystals
  • Physical Optics
  • Quantum Optics
  • Scattering
  • Sensors
  • Solar Energy
  • Spectroscopy
  • Thin Films
  • Ultrafast Optics
  • X-ray Optics
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Access Networks and LAN

  • Optics Express Vol. 20, Iss. 4, pp. 3781–3786 (2012)
  • L. Marazzi, P. Parolari, R. Brenot, G. de Valicourt, and M. Martinelli

Atmospheric and Oceanic Optics

  • Optics Express Vol. 20, Iss. 4, pp. 4232–4247 (2012)
  • Xiang Yi, Zengji Liu, and Peng Yue

  • Optics Express Vol. 20, Iss. 4, pp. 4309–4330 (2012)
  • Wesley J. Moses, Jeffrey H. Bowles, Robert L. Lucke, and Michael R. Corson

Atomic and Molecular Physics

  • Optics Express Vol. 20, Iss. 4, pp. 3711–3724 (2012)
  • Xiaodong He, Shi Yu, Peng Xu, Jin Wang, and Mingsheng Zhan

  • Optics Express Vol. 20, Iss. 4, pp. 4346–4351 (2012)
  • M. Scherman, O. S. Mishina, P. Lombardi, E. Giacobino, and J. Laurat

Coherence and Statistical Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3967–3974 (2012)
  • Sebastian D. Saliba, Corey T. Putkunz, David V. Sheludko, Andrew J. McCulloch, Keith A. Nugent, and Robert E. Scholten

  • Optics Express Vol. 20, Iss. 4, pp. 4726–4737 (2012)
  • Geng Zhang, Zhensen Wu, and Yanhui Li

Detectors

  • Optics Express Vol. 20, Iss. 4, pp. 3479–3489 (2012)
  • Yung-Chi Yao, Meng-Tsan Tsai, Hsu-Cheng Hsu, Li-Wei She, Chun-Mao Cheng, Yi-Ching Chen, Chien-Jang Wu, and Ya-Ju Lee

  • Optics Express Vol. 20, Iss. 4, pp. 3572–3579 (2012)
  • Kuo-Wei Lai, Yi-Shan Lee, Ying-Jhe Fu, and Sheng-Di Lin

  • Optics Express Vol. 20, Iss. 4, pp. 3675–3692 (2012)
  • Yuqing Jiao, Bauke W. Tilma, Junji Kotani, Richard Nötzel, Meint K. Smit, Sailing He, and Erwin A. J. M. Bente

  • Optics Express Vol. 20, Iss. 4, pp. 4583–4602 (2012)
  • Javier Contreras, Luis Gomes, Sergej Filonovich, Nuno Correia, Elvira Fortunato, Rodrigo Martins, and Isabel Ferreira

Diffraction and Gratings

  • Optics Express Vol. 20, Iss. 4, pp. 4681–4689 (2012)
  • Kalle Ventola, Jani Tervo, Samuli Siitonen, Hemmo Tuovinen, and Markku Kuittinen

  • Optics Express Vol. 20, Iss. 4, pp. 4697–4709 (2012)
  • Frédéric Przybilla, Cyriaque Genet, and Thomas W. Ebbesen

Fiber Optics and Optical Communications

  • Optics Express Vol. 20, Iss. 4, pp. 3467–3472 (2012)
  • Felipe Beltrán-Mejía, Cristiano M. B. Cordeiro, Pedro Andrés, and Enrique Silvestre

  • Optics Express Vol. 20, Iss. 4, pp. 3473–3478 (2012)
  • Chul Han Kim

  • Optics Express Vol. 20, Iss. 4, pp. 3541–3549 (2012)
  • Ki Ho Han and Wang Joo Lee

  • Optics Express Vol. 20, Iss. 4, pp. 3620–3632 (2012)
  • S. Herath, N. P. Puente, E. I. Chaikina, and A. Yamilov

  • Optics Express Vol. 20, Iss. 4, pp. 3877–3882 (2012)
  • A. Hachmeister, M. Nölle, L. Molle, R. Freund, and M. Rohde

  • Optics Express Vol. 20, Iss. 4, pp. 3997–4008 (2012)
  • Florian Jansen, Fabian Stutzki, Hans-Jürgen Otto, Tino Eidam, Andreas Liem, Cesar Jauregui, Jens Limpert, and Andreas Tünnermann

  • Optics Express Vol. 20, Iss. 4, pp. 4009–4017 (2012)
  • Xiangkai Zeng, Lai Wei, Yingjun Pan, Shengping Liu, and Xiaohui Shi

  • Optics Express Vol. 20, Iss. 4, pp. 4074–4084 (2012)
  • Mathieu Paurisse, Louis Lévèque, Marc Hanna, Frédéric Druon, and Patrick Georges

  • Optics Express Vol. 20, Iss. 4, pp. 4219–4224 (2012)
  • Wen-Yi Lin, Ching-Hung Chang, Hai-Han Lu, Peng-Chun Peng, Ying-Pyng Lin, Chia-Yi Chen, and Chung-Yi Li

  • Optics Express Vol. 20, Iss. 4, pp. 4369–4375 (2012)
  • Lei Deng, Xiaodan Pang, Ying Zhao, M. B. Othman, Jesper Bevensee Jensen, Darko Zibar, Xianbin Yu, Deming Liu, and Idelfonso Tafur Monroy

  • Optics Express Vol. 20, Iss. 4, pp. 4436–4443 (2012)
  • R. C. G. Smith, A. M. Sarangan, Z. Jiang, and J. R. Marciante

  • Optics Express Vol. 20, Iss. 4, pp. 4454–4469 (2012)
  • Anatol Khilo, Steven J. Spector, Matthew E. Grein, Amir H. Nejadmalayeri, Charles W. Holzwarth, Michelle Y. Sander, Marcus S. Dahlem, Michael Y. Peng, Michael W. Geis, Nicole A. DiLello, Jung U. Yoon, Ali Motamedi, Jason S. Orcutt, Jade P. Wang, Cheryl M. Sorace-Agaskar, Miloš A. Popović, Jie Sun, Gui-Rong Zhou, Hyunil Byun, Jian Chen, Judy L. Hoyt, Henry I. Smith, Rajeev J. Ram, Michael Perrott, Theodore M. Lyszczarz, Erich P. Ippen, and Franz X. Kärtner

  • Optics Express Vol. 20, Iss. 4, pp. 4548–4563 (2012)
  • Florence Y. M. Chan, Alan Pak Tao Lau, and Hwa-Yaw Tam

  • Optics Express Vol. 20, Iss. 4, pp. 4564–4573 (2012)
  • Zixiong Wang, Changyuan Yu, Wen-De Zhong, Jian Chen, and Wei Chen

  • Optics Express Vol. 20, Iss. 4, pp. 4630–4644 (2012)
  • Iñaki Bikandi, María Asunción Illarramendi, Joseba Zubia, Jon Arrue, and Felipe Jiménez

Fourier Optics and Signal Processing

  • Optics Express Vol. 20, Iss. 4, pp. 3388–3393 (2012)
  • John Fredy Barrera, Myrian Tebaldi, Carlos Ríos, Edgar Rueda, Néstor Bolognini, and Roberto Torroba

  • Optics Express Vol. 20, Iss. 4, pp. 4050–4055 (2012)
  • Cristina Canavesi, William J. Cassarly, and Jannick P. Rolland

Holography

  • Optics Express Vol. 20, Iss. 4, pp. 3529–3540 (2012)
  • Takayuki Kurihara and Yasuhiro Takaki

  • Optics Express Vol. 20, Iss. 4, pp. 3918–3931 (2012)
  • Yasuhiro Takaki and Masahito Yokouchi

  • Optics Express Vol. 20, Iss. 4, pp. 4018–4023 (2012)
  • Jiantong Weng, Tomoyoshi Shimobaba, Naohisa Okada, Hirotaka Nakayama, Minoru Oikawa, Nobuyuki Masuda, and Tomoyoshi Ito

Image Processing

  • Optics Express Vol. 20, Iss. 4, pp. 3375–3387 (2012)
  • Shiro Ikeda and Hidetoshi Kono

  • Optics Express Vol. 20, Iss. 4, pp. 3853–3865 (2012)
  • Wen Chen, Xudong Chen, and Colin J. R. Sheppard

Imaging Systems

  • Optics Express Vol. 20, Iss. 4, pp. 3424–3433 (2012)
  • Tatiana Pikuz, Anatoly Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yashinori Senba, Tadashi Togashi, and Tetsuya Ishikawa

  • Optics Express Vol. 20, Iss. 4, pp. 3642–3653 (2012)
  • S. Zwick, R. Feßler, J. Jegorov, and G. Notni

  • Optics Express Vol. 20, Iss. 4, pp. 4168–4175 (2012)
  • M. Krishnamurthi, J. R. Sparks, R. He, I. A. Temnykh, N. F. Baril, Z. Liu, P. J. A. Sazio, J. V. Badding, and V. Gopalan

  • Optics Express Vol. 20, Iss. 4, pp. 4260–4271 (2012)
  • Sergei Evladov, Ofer Levi, and Adrian Stern

  • Optics Express Vol. 20, Iss. 4, pp. 4574–4582 (2012)
  • Miguel A. Cagigas, Pedro J. Valle, and Manuel P. Cagigal

Instrumentation, Measurement, and Metrology

  • Optics Express Vol. 20, Iss. 4, pp. 3954–3966 (2012)
  • Tetsuya Hoshino, Toyohiko Yatagai, and Masahide Itoh

  • Optics Express Vol. 20, Iss. 4, pp. 4403–4418 (2012)
  • Ping Zhou, Yong Shu, Chunyu Zhao, and Jim H. Burge

  • Optics Express Vol. 20, Iss. 4, pp. 4419–4427 (2012)
  • D. Y. Lei, S. Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier, and N. M. Alford

  • Optics Express Vol. 20, Iss. 4, pp. 4525–4536 (2012)
  • Frank Siewert, Jana Buchheim, Sébastien Boutet, Garth J. Williams, Paul A. Montanez, Jacek Krzywinski, and Riccardo Signorato

  • Optics Express Vol. 20, Iss. 4, pp. 4603–4618 (2012)
  • Rong Su, Mikhail Kirillin, Peter Ekberg, Arne Roos, Ekaterina Sergeeva, and Lars Mattsson

Integrated Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3408–3423 (2012)
  • P. Neutens, L. Lagae, G. Borghs, and P. Van Dorpe

  • Optics Express Vol. 20, Iss. 4, pp. 3556–3562 (2012)
  • Jin Tae Kim and Choon-Gi Choi

  • Optics Express Vol. 20, Iss. 4, pp. 3814–3824 (2012)
  • Richard Soref, Joshua Hendrickson, and Justin W. Cleary

  • Optics Express Vol. 20, Iss. 4, pp. 3825–3831 (2012)
  • C. Stamatiadis, L. Stampoulidis, D. Kalavrouziotis, I. Lazarou, K. Vyrsokinos, L. Zimmermann, K. Voigt, G. B. Preve, L. Moerl, J. Kreissl, and H. Avramopoulos

  • Optics Express Vol. 20, Iss. 4, pp. 4032–4038 (2012)
  • Li Chen and Ronald M. Reano

  • Optics Express Vol. 20, Iss. 4, pp. 4213–4218 (2012)
  • Qing Huang, Peng Liu, Tao Liu, Lian Zhang, and Xue-Lin Wang

  • Optics Express Vol. 20, Iss. 4, pp. 4280–4290 (2012)
  • Sunil Sandhu and Shanhui Fan

  • Optics Express Vol. 20, Iss. 4, pp. 4331–4345 (2012)
  • Berkehan Ciftcioglu, Rebecca Berman, Shang Wang, Jianyun Hu, Ioannis Savidis, Manish Jain, Duncan Moore, Michael Huang, Eby G. Friedman, Gary Wicks, and Hui Wu

  • Optics Express Vol. 20, Iss. 4, pp. 4444–4453 (2012)
  • G. B. Montanari, P. De Nicola, S. Sugliani, A. Menin, A. Parini, A. Nubile, G. Bellanca, M. Chiarini, M. Bianconi, and G. G. Bentini

  • Optics Express Vol. 20, Iss. 4, pp. 4796–4804 (2012)
  • Keijiro Suzuki, Hong C. Nguyen, Takemasa Tamanuki, Fumihiro Shinobu, Yuji Saito, Yuya Sakai, and Toshihiko Baba

Laser Microfabrication

  • Optics Express Vol. 20, Iss. 4, pp. 3832–3843 (2012)
  • Andrey Okhrimchuk, Vladimir Mezentsev, Alexander Shestakov, and Ian Bennion

  • Optics Express Vol. 20, Iss. 4, pp. 4291–4296 (2012)
  • Changning Liu, Yang Liao, Fei He, Yinglong Shen, Danping Chen, Ya Cheng, Zhizhan Xu, Koji Sugioka, and Katsumi Midorikawa

  • Optics Express Vol. 20, Iss. 4, pp. 4389–4396 (2012)
  • Feng Liang, Réal Vallée, and See Leang Chin

Lasers and Laser Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3394–3400 (2012)
  • Martha Segura, Martin Kadankov, Xavier Mateos, Maria Cinta Pujol, Joan Josep Carvajal, Magdalena Aguiló, Francesc Díaz, Uwe Griebner, and Valentin Petrov

  • Optics Express Vol. 20, Iss. 4, pp. 3434–3442 (2012)
  • G. H. Kim, J. Yang, S. A. Chizhov, E. G. Sall, A. V. Kulik, V. E. Yashin, D. S. Lee, and U. Kang

  • Optics Express Vol. 20, Iss. 4, pp. 3550–3555 (2012)
  • Kevin Schires, Rihab Al Seyab, Antonio Hurtado, Ville-Markus Korpijärvi, Mircea Guina, Ian D. Henning, and Michael J. Adams

  • Optics Express Vol. 20, Iss. 4, pp. 3844–3852 (2012)
  • Nikolai B. Chichkov, Christian Hapke, Jörg Neumann, Dietmar Kracht, Dieter Wandt, and Uwe Morgner

  • Optics Express Vol. 20, Iss. 4, pp. 3866–3876 (2012)
  • S. Fathololoumi, E. Dupont, C.W.I. Chan, Z.R. Wasilewski, S.R. Laframboise, D. Ban, A. Mátyás, C. Jirauschek, Q. Hu, and H. C. Liu

  • Optics Express Vol. 20, Iss. 4, pp. 3890–3897 (2012)
  • Peter Fuchs, Jochen Friedl, Sven Höfling, Johannes Koeth, Alfred Forchel, Lukas Worschech, and Martin Kamp

  • Optics Express Vol. 20, Iss. 4, pp. 3941–3947 (2012)
  • Gray Lin, Pei-Yin Su, and Hsu-Chieh Cheng

  • Optics Express Vol. 20, Iss. 4, pp. 3983–3989 (2012)
  • Mizuki Shirao, Takashi Sato, Noriaki Sato, Nobuhiko Nishiyama, and Shigehisa Arai

  • Optics Express Vol. 20, Iss. 4, pp. 4024–4031 (2012)
  • Moritz M. Vogel, Martin Rumpel, Birgit Weichelt, Andreas Voss, Matthias Haefner, Christof Pruss, Wolfgang Osten, Marwan Abdou Ahmed, and Thomas Graf

  • Optics Express Vol. 20, Iss. 4, pp. 4136–4148 (2012)
  • Mario Mangold, Valentin J. Wittwer, Oliver D. Sieber, Martin Hoffmann, Igor L. Krestnikov, Daniil A. Livshits, Matthias Golling, Thomas Südmeyer, and Ursula Keller

  • Optics Express Vol. 20, Iss. 4, pp. 4206–4212 (2012)
  • Akira Higuchi, Hideyuki Naito, Kousuke Torii, Masahiro Miyamoto, Junya Maeda, Hirofumi Miyajima, and Harumasa Yoshida

  • Optics Express Vol. 20, Iss. 4, pp. 4248–4253 (2012)
  • Selina Pekarek, Alexander Klenner, Thomas Südmeyer, Christian Fiebig, Katrin Paschke, Götz Erbert, and Ursula Keller

  • Optics Express Vol. 20, Iss. 4, pp. 4352–4359 (2012)
  • Y. Aviad, I. Reidler, M. Zigzag, M. Rosenbluh, and I. Kanter

  • Optics Express Vol. 20, Iss. 4, pp. 4382–4388 (2012)
  • Arkadiy Lyakh, Richard Maulini, Alexei Tsekoun, Rowel Go, and C. Kumar N. Patel

  • Optics Express Vol. 20, Iss. 4, pp. 4397–4402 (2012)
  • Luis Escalante-Zarate, Yuri O. Barmenkov, Stanislav A. Kolpakov, José L. Cruz, and Miguel V. Andrés

  • Optics Express Vol. 20, Iss. 4, pp. 4484–4493 (2012)
  • Martin Baumgartl, Mario Chemnitz, Cesar Jauregui, Tobias Meyer, Benjamin Dietzek, Jürgen Popp, Jens Limpert, and Andreas Tünnermann

  • Optics Express Vol. 20, Iss. 4, pp. 4663–4674 (2012)
  • Xiaohua Wang, Qiang Fu, Feng Shen, and Changhui Rao

  • Optics Express Vol. 20, Iss. 4, pp. 4690–4696 (2012)
  • Hiroaki Yoshioka, Yu Yang, Hirofumi Watanabe, and Yuji Oki

  • Optics Express Vol. 20, Iss. 4, pp. 4747–4752 (2012)
  • Zhaoli Zeng, Shulian Zhang, Yun Wu, Peng Zhang, Zhengqi Zhao, and Yan Li

  • Optics Express Vol. 20, Iss. 4, pp. 4753–4762 (2012)
  • Akira Takada, Makoto Fujino, and Shigenori Nagano

Materials

  • Optics Express Vol. 20, Iss. 4, pp. 3803–3813 (2012)
  • Bo Zhou, Lili Tao, Yuen H. Tsang, Wei Jin, and Edwin Yue-Bun Pun

  • Optics Express Vol. 20, Iss. 4, pp. 3932–3940 (2012)
  • Huining Wang, Ziwu Ji, Shuang Qu, Gang Wang, Yongzhi Jiang, Baoli Liu, Xiangang Xu, and Hirofumi Mino

  • Optics Express Vol. 20, Iss. 4, pp. 4056–4066 (2012)
  • Jung Woo Leem, Yunhae Yeh, and Jae Su Yu

  • Optics Express Vol. 20, Iss. 4, pp. 4360–4368 (2012)
  • Yanlin Huang, Young Moon Yu, Taiju Tsuboi, and Hyo Jin Seo

  • Optics Express Vol. 20, Iss. 4, pp. 4428–4435 (2012)
  • A. Joshi, N. D. Haynes, D. E. Zelmon, O. Stafsudd, and R. Shori

Medical Optics and Biotechnology

  • Optics Express Vol. 20, Iss. 4, pp. 4159–4167 (2012)
  • I. Y. Petrov, Y. Petrov, D. S. Prough, I. Cicenaite, D. J. Deyo, and R. O. Esenaliev

  • Optics Express Vol. 20, Iss. 4, pp. 4710–4725 (2012)
  • Yali Jia, Ou Tan, Jason Tokayer, Benjamin Potsaid, Yimin Wang, Jonathan J. Liu, Martin F. Kraus, Hrebesh Subhash, James G. Fujimoto, Joachim Hornegger, and David Huang

Metamaterials

  • Optics Express Vol. 20, Iss. 4, pp. 3693–3702 (2012)
  • Avner Yanai, Meir Orenstein, and Uriel Levy

  • Optics Express Vol. 20, Iss. 4, pp. 3898–3917 (2012)
  • Kazuaki Sakoda

  • Optics Express Vol. 20, Iss. 4, pp. 4494–4502 (2012)
  • Lei Zhu, Fan-Yi Meng, Jia-Hui Fu, Qun Wu, and Jun Hua

  • Optics Express Vol. 20, Iss. 4, pp. 4675–4680 (2012)
  • LiangKui Sun, HaiFeng Cheng, YongJiang Zhou, and Jun Wang

Microscopy

  • Optics Express Vol. 20, Iss. 4, pp. 3654–3662 (2012)
  • Uwe Petzold, Andreas Büchel, and Thomas Halfmann

  • Optics Express Vol. 20, Iss. 4, pp. 3744–3752 (2012)
  • Giulia Ghielmetti and Christof M. Aegerter

  • Optics Express Vol. 20, Iss. 4, pp. 3990–3996 (2012)
  • Alexandros Selimis, George J. Tserevelakis, Sotiria Kogou, Paraskevi Pouli, George Filippidis, Natalia Sapogova, Nikita Bityurin, and Costas Fotakis

Nonlinear Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3490–3498 (2012)
  • Jin Wen, Hongjun Liu, Nan Huang, Qibing Sun, and Wei Zhao

  • Optics Express Vol. 20, Iss. 4, pp. 3613–3619 (2012)
  • Gil Porat, Yaron Silberberg, Ady Arie, and Haim Suchowski

  • Optics Express Vol. 20, Iss. 4, pp. 3948–3953 (2012)
  • Yan Sheng, Vito Roppo, Mingliang Ren, Ksawery Kalinowski, Crina Cojocaru, Jose Trull, Zhiyuan Li, Kaloian Koynov, and Wieslaw Krolikowski

  • Optics Express Vol. 20, Iss. 4, pp. 4085–4101 (2012)
  • Ali R. Motamedi, Amir H. Nejadmalayeri, Anatol Khilo, Franz X. Kärtner, and Erich P. Ippen

  • Optics Express Vol. 20, Iss. 4, pp. 4198–4205 (2012)
  • Sean Kilmurray, Tobias Fehenberger, Polina Bayvel, and Robert I. Killey

  • Optics Express Vol. 20, Iss. 4, pp. 4509–4517 (2012)
  • G. Stoeppler, N. Thilmann, V. Pasiskevicius, A. Zukauskas, C. Canalias, and M. Eichhorn

  • Optics Express Vol. 20, Iss. 4, pp. 4537–4547 (2012)
  • T. Cesca, P. Calvelli, G. Battaglin, P. Mazzoldi, and G. Mattei

  • Optics Express Vol. 20, Iss. 4, pp. 4619–4629 (2012)
  • Christoph Skrobol, Izhar Ahmad, Sandro Klingebiel, Christoph Wandt, Sergei A. Trushin, Zsuzsanna Major, Ferenc Krausz, and Stefan Karsch

  • Optics Express Vol. 20, Iss. 4, pp. 4784–4789 (2012)
  • C. Torres-Torres, A. López-Suárez, R. Torres-Martínez, A. Rodriguez, J. A. Reyes-Esqueda, L. Castañeda, J. C. Alonso, and A. Oliver

  • Optics Express Vol. 20, Iss. 4, pp. 4790–4795 (2012)
  • Xiaodong Sun, Shengqi Xu, Jiayu Zhao, Weiwei Liu, Ya Cheng, Zhizhan Xu, See Leang Chin, and Guoguang Mu

Optical Design and Fabrication

  • Optics Express Vol. 20, Iss. 4, pp. 4763–4775 (2012)
  • Jens Dunkel, Frank Wippermann, Andreas Brückner, Andreas Bräuer, and Andreas Tünnermann

Optical Devices

  • Optics Express Vol. 20, Iss. 4, pp. 3499–3508 (2012)
  • Igor Gvozdovskyy, Oleg Yaroshchuk, Marina Serbina, and Rumiko Yamaguchi

  • Optics Express Vol. 20, Iss. 4, pp. 4272–4279 (2012)
  • Onur Basarir, Suraj Bramhavar, and Kamil L. Ekinci

  • Optics Express Vol. 20, Iss. 4, pp. 4738–4746 (2012)
  • Che Ju Hsu and Chia Rong Sheu

Optical Trapping and Manipulation

  • Optics Express Vol. 20, Iss. 4, pp. 3367–3374 (2012)
  • Shiyun Lin and Kenneth B. Crozier

  • Optics Express Vol. 20, Iss. 4, pp. 3633–3641 (2012)
  • Kazuhisa Onda and Fumihito Arai

  • Optics Express Vol. 20, Iss. 4, pp. 3787–3802 (2012)
  • Francesco Pedaci, Zhuangxiong Huang, Maarten van Oene, and Nynke H. Dekker

  • Optics Express Vol. 20, Iss. 4, pp. 4254–4259 (2012)
  • Kiminori Ito, Hiroshi Frusawa, and Masahiro Kimura

  • Optics Express Vol. 20, Iss. 4, pp. 4645–4652 (2012)
  • Poonam Kumari, J. A. Dharmadhikari, A. K. Dharmadhikari, H. Basu, S. Sharma, and D. Mathur

Optics at Surfaces

  • Optics Express Vol. 20, Iss. 4, pp. 3663–3674 (2012)
  • Jesper Jung and Thomas G. Pedersen

  • Optics Express Vol. 20, Iss. 4, pp. 4067–4073 (2012)
  • Gopakumar Ramakrishnan, Nishant Kumar, Paul C. M. Planken, Daisuke Tanaka, and Kotaro Kajikawa

  • Optics Express Vol. 20, Iss. 4, pp. 4176–4188 (2012)
  • Giuseppe Toscano, Søren Raza, Antti-Pekka Jauho, N. Asger Mortensen, and Martijn Wubs

Optics in Computing

  • Optics Express Vol. 20, Iss. 4, pp. 4297–4308 (2012)
  • Pu Li, Yun-Cai Wang, An-Bang Wang, Ling-Zhen Yang, Ming-Jiang Zhang, and Jian-Zhong Zhang

Optoelectronics

  • Optics Express Vol. 20, Iss. 4, pp. 3519–3528 (2012)
  • Nadav Gutman, W. Hugo Dupree, Yue Sun, Andrey A. Sukhorukov, and C. Martijn de Sterke

  • Optics Express Vol. 20, Iss. 4, pp. 3773–3780 (2012)
  • Shinji Matsuo, Koji Takeda, Tomonari Sato, Masaya Notomi, Akihiko Shinya, Kengo Nozaki, Hideaki Taniyama, Koichi Hasebe, and Takaaki Kakitsuka

Optomechanics

  • Optics Express Vol. 20, Iss. 4, pp. 3586–3612 (2012)
  • Yi Zhao, Dalziel J. Wilson, K.-K. Ni, and H. J. Kimble

Photonic Crystals

  • Optics Express Vol. 20, Iss. 4, pp. 4124–4135 (2012)
  • T-P. Vo, M. Mivelle, S. Callard, A. Rahmani, F. Baida, D. Charraut, A. Belarouci, D. Nedeljkovic, C. Seassal, G.W. Burr, and T. Grosjean

  • Optics Express Vol. 20, Iss. 4, pp. 4225–4231 (2012)
  • Manjit Chahal, George K. Celler, Yogesh Jaluria, and Wei Jiang

  • Optics Express Vol. 20, Iss. 4, pp. 4776–4783 (2012)
  • Khanh-Van Do, Xavier Le Roux, Delphine Marris-Morini, Laurent Vivien, and Eric Cassan

Physical Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3563–3571 (2012)
  • O. V. Angelsky, A. Ya. Bekshaev, P. P. Maksimyak, A. P. Maksimyak, S. G. Hanson, and C. Yu. Zenkova

Quantum Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3509–3518 (2012)
  • Chun Liang Wang, Zhi Hui Kang, Si Cong Tian, and Jin Hui Wu

  • Optics Express Vol. 20, Iss. 4, pp. 3753–3772 (2012)
  • E. S. Gómez, W. A. T. Nogueira, C. H. Monken, and G. Lima

  • Optics Express Vol. 20, Iss. 4, pp. 4470–4483 (2012)
  • L. J. Salazar, D. A. Guzmán, F. J. Rodríguez, and L. Quiroga

Scattering

  • Optics Express Vol. 20, Iss. 4, pp. 4376–4381 (2012)
  • Jeppe Clausen, Alexander B. Christiansen, Joergen Garnaes, N. Asger Mortensen, and Anders Kristensen

Sensors

  • Optics Express Vol. 20, Iss. 4, pp. 3401–3407 (2012)
  • Vincenzo Spagnolo, Lei Dong, Anatoliy A. Kosterev, and Frank K. Tittel

  • Optics Express Vol. 20, Iss. 4, pp. 3456–3466 (2012)
  • Shellee D. Dyer, Michael G. Tanner, Burm Baek, Robert H. Hadfield, and Sae Woo Nam

  • Optics Express Vol. 20, Iss. 4, pp. 3703–3710 (2012)
  • Gene Olczak

  • Optics Express Vol. 20, Iss. 4, pp. 4189–4197 (2012)
  • Junfeng Song, Xianshu Luo, Xiaoguang Tu, Mi Kyoung Park, Jack Sheng Kee, Huijuan Zhang, Mingbin Yu, Guo-Qiang Lo, and Dim-Lee Kwong

  • Optics Express Vol. 20, Iss. 4, pp. 4805–4811 (2012)
  • Jianjun Ma, Yasser Chiniforooshan, Wenhui Hao, Wojtek J. Bock, and Zhi Yuan Wang

Solar Energy

  • Optics Express Vol. 20, Iss. 4, pp. 3733–3743 (2012)
  • Wei Wang, Shaomin Wu, Randy. J. Knize, Kitt Reinhardt, Yalin Lu, and Shaochen Chen

Spectroscopy

  • Optics Express Vol. 20, Iss. 4, pp. 3580–3585 (2012)
  • Ke Chen, Wenfang Wang, Jianming Chen, Jinhui Wen, and Tianshu Lai

  • Optics Express Vol. 20, Iss. 4, pp. 4653–4662 (2012)
  • Lars Egil Helseth

Thin Films

  • Optics Express Vol. 20, Iss. 4, pp. 3883–3889 (2012)
  • Kai Wu, Cheng-Chung Lee, and Tzu-Ling Ni

  • Optics Express Vol. 20, Iss. 4, pp. 4503–4508 (2012)
  • V. Pervak, O. Pronin, O. Razskazovskaya, J. Brons, I. B. Angelov, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz

  • Optics Express Vol. 20, Iss. 4, pp. 4518–4524 (2012)
  • Elmer S. Estacio, Christopher T. Que, Fritz C. B. Awitan, Jan Isaac Bugante, Francesca Isabel de Vera, Jonathan Azares, Jessica Afalla, Jeffrey de Vero, Armando S. Somintac, Roland V. Sarmago, Arnel A. Salvador, Kohji Yamamoto, and Masahiko Tani

Ultrafast Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3443–3455 (2012)
  • Sandro Klingebiel, Izhar Ahmad, Christoph Wandt, Christoph Skrobol, Sergei A. Trushin, Zsuzsanna Major, Ferenc Krausz, and Stefan Karsch

  • Optics Express Vol. 20, Iss. 4, pp. 3725–3732 (2012)
  • Hironori Igarashi, Ayumu Makida, Motohiko Ito, and Taro Sekikawa

  • Optics Express Vol. 20, Iss. 4, pp. 4102–4113 (2012)
  • Michelle Y. Sander, Sergey Frolov, Joseph Shmulovich, Erich P. Ippen, and Franz X. Kärtner

  • Optics Express Vol. 20, Iss. 4, pp. 4114–4123 (2012)
  • Leandro Matiolli Machado, Ricardo Elgul Samad, Wagner de Rossi, and Nilson Dias Vieira Junior

X-ray Optics

  • Optics Express Vol. 20, Iss. 4, pp. 3975–3982 (2012)
  • Adam M. Zysk, Robert W. Schoonover, Qiaofeng Xu, and Mark A. Anastasio

  • Optics Express Vol. 20, Iss. 4, pp. 4039–4049 (2012)
  • J. Gulden, O. M. Yefanov, A. P. Mancuso, R. Dronyak, A. Singer, V. Bernátová, A. Burkhardt, O. Polozhentsev, A. Soldatov, M. Sprung, and I. A. Vartanyants

  • Optics Express Vol. 20, Iss. 4, pp. 4149–4158 (2012)
  • Stephan Kassemeyer, Jan Steinbrener, Lukas Lomb, Elisabeth Hartmann, Andrew Aquila, Anton Barty, Andrew V. Martin, Christina Y. Hampton, Saša Bajt, Miriam Barthelmess, Thomas R.M. Barends, Christoph Bostedt, Mario Bott, John D. Bozek, Nicola Coppola, Max Cryle, Daniel P. DePonte, R. Bruce Doak, Sascha W. Epp, Benjamin Erk, Holger Fleckenstein, Lutz Foucar, Heinz Graafsma, Lars Gumprecht, Andreas Hartmann, Robert Hartmann, Günter Hauser, Helmut Hirsemann, André Hömke, Peter Holl, Olof Jönsson, Nils Kimmel, Faton Krasniqi, Mengning Liang, Filipe R.N.C. Maia, Stefano Marchesini, Karol Nass, Christian Reich, Daniel Rolles, Benedikt Rudek, Artem Rudenko, Carlo Schmidt, Joachim Schulz, Robert L. Shoeman, Raymond G. Sierra, Heike Soltau, John C. H. Spence, Dmitri Starodub, Francesco Stellato, Stephan Stern, Gunter Stier, Martin Svenda, Georg Weidenspointner, Uwe Weierstall, Thomas A. White, Cornelia Wunderer, Matthias Frank, Henry N. Chapman, Joachim Ullrich, Lothar Strüder, Michael J. Bogan, and Ilme Schlichting
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