Stochastic transfer function: application to fluorescence microscopy

• Abstract

• JOSA A, Vol. 26, Issue 7, pp. 1622-1629 (July 2009)
• Ken Hsu, Michael G. Somekh, Mark C. Pitter

Stochastic transfer function for structured illumination microscopy

• Abstract

• JOSA A, Vol. 26, Issue 7, pp. 1630-1637 (July 2009)
• Michael G. Somekh, Ken Hsu, Mark C. Pitter

Laser-scanning optical-resolution photoacoustic microscopy

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1771-1773 (June 2009)
• Zhixing Xie, Shuliang Jiao, Hao F. Zhang, Carmen A. Puliafito

Coherent anti-Stokes Raman scattering microscopy using tightly focused radially polarized light

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1870-1872 (June 2009)
• Fake Lu, Wei Zheng, Zhiwei Huang

Quantitative phase-gradient imaging at high resolution with asymmetric illumination-based differential phase contrast

• Abstract

• Optics Letters, Vol. 34, Issue 13, pp. 1924-1926 (July 2009)
• Shalin B. Mehta, Colin J. R. Sheppard

Controlling depth of focus in 3D image reconstructions by flexible and adaptive deformation of digital holograms

• Abstract
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• Optics Letters, Vol. 34, Issue 18, pp. 2787-2789 (September 2009)
• P. Ferraro, M. Paturzo, P. Memmolo, A. Finizio

A field theoretical restoration method for images degraded by non-uniform light attenuation : an application for light microscopy

• Abstract

• Optics Express, Vol. 17, Issue 14, pp. 11294-11308 (July 2009)
• Hwee K. Lee, Mohammad S. Uddin, Shvetha Sankaran, Srivats Hariharan, Sohail Ahmed

Surface plasmon converging and diverging properties modulated by polymer refractive structures on metal films

• Abstract

• Optics Express, Vol. 17, Issue 14, pp. 11315-11320 (July 2009)
• D. G. Zhang, X.-C. L. Yuan, J. Bu, G. H. Yuan, Q. Wang, J. Lin, X. J. Zhang, P. Wang, H. Ming, T. Mei

Simplified approach to diffraction tomography in optical microscopy

• Abstract

• Optics Express, Vol. 17, Issue 15, pp. 12407-12417 (July 2009)
• Reto Fiolka, Kai Wicker, Rainer Heintzmann, Andreas Stemmer

Two-photon excitation STED microscopy

• Abstract

• Optics Express, Vol. 17, Issue 17, pp. 14567-14573 (August 2009)
• Gael Moneron, Stefan W. Hell

Characterisation of a resolution enhancing image inversion interferometer

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15491-15501 (August 2009)
• Kai Wicker, Simon Sindbert, Rainer Heintzmann

Micro-step localization using double charge optical vortex interferometer

• Abstract

• Optics Express, Vol. 17, Issue 18, pp. 16144-16159 (August 2009)
• Jan Masajada, Monika Leniec, Sławomir Drobczyński, Hugo Thienpont, Bernard Kress

Impact of storage induced outgassing organic contamination on laser induced damage of silica optics at 351 nm

• Abstract

• Optics Express, Vol. 17, Issue 21, pp. 18703-18713 (October 2009)
• K. Bien-Aimé, C. Belin, L. Gallais, P. Grua, E. Fargin, J. Néauport, I. Tovena-Pecault

Creating an extended focus image of a tilted object in Fourier digital holography

• Abstract
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• Optics Express, Vol. 17, Issue 22, pp. 20546-20552 (October 2009)
• Melania Paturzo, Pietro Ferraro

Microscopic hyperspectral imaging used as a bio-optical taxonomic tool for micro- and macroalgae

• Abstract

• Applied Optics, Vol. 48, Issue 21, pp. 4170-4176 (July 2009)
• Zsolt Volent, Geir Johnsen, Fred Sigernes

Optical scattering analysis of the diffraction distortion of a two-dimensional reflection grating

• Abstract

• Applied Optics, Vol. 48, Issue 23, pp. 4519-4525 (August 2009)
• Shuyun Teng, Junchao Zhang, Chuanfu Cheng

Accurate cross-sectional stress profiling of optical fibers

• Abstract

• Applied Optics, Vol. 48, Issue 26, pp. 4985-4995 (September 2009)
• Michael R. Hutsel, Reeve Ingle, Thomas K. Gaylord

Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)

• Abstract

• Applied Optics, Vol. 48, Issue 30, pp. 5713-5717 (October 2009)
• L. F. Lastras-Martínez, R. Castro-García, R. E. Balderas-Navarro, A. Lastras-Martínez

Around-the-objective total internal reflection fluorescence microscopy

• Abstract

• Applied Optics, Vol. 48, Issue 32, pp. 6120-6131 (November 2009)
• Thomas P. Burghardt, Andrew D. Hipp, Katalin Ajtai

A novel atomic force microscope operating in liquid with open probe unit and optimized laser tracking system

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 10, pp. 891-893 (October 2009)
• Xia Fu, Dongxian Zhang, Haijun Zhang