Image fidelity for single-layer and multi-layer silver superlenses

• Abstract

• JOSA A, Vol. 25, Issue 4, pp. 911-918 (April 2008)
• Ciaran P. Moore, Matthew D. Arnold, Philip J. Bones, Richard J. Blaikie

Divisive normalization image quality metric revisited

• Abstract

• JOSA A, Vol. 27, Issue 4, pp. 852-864 (April 2010)
• Valero Laparra, Jordi Muñoz-Marí, Jesús Malo

Estimating the usefulness of distorted natural images using an image contour degradation measure

• Abstract

• JOSA A, Vol. 28, Issue 2, pp. 157-188 (February 2011)
• David M. Rouse, Sheila S. Hemami, Romuald Pépion, Patrick Le Callet

Optimization of hybrid imaging systems based on maximization of kurtosis of the restored point spread function

• Abstract

• Optics Letters, Vol. 36, Issue 24, pp. 4740-4742 (December 2011)
• Mads Demenikov

Calibration and validation by professional observers of the Mission-Quality criterion for imaging systems design

• Abstract

• Optics Express, Vol. 16, Issue 7, pp. 4824-4837 (March 2008)
• Alain P. Kattnig, Jérôme Primot

Fundamental estimation bounds for polarimetric imagery

• Abstract

• Optics Express, Vol. 16, Issue 16, pp. 12018-12036 (August 2008)
• Daniel A. LeMaster

Autofocus using image phase congruency

• Abstract

• Optics Express, Vol. 19, Issue 1, pp. 261-270 (January 2011)
• Yibin Tian

Experimental characterization of the transfer function for a Silver-dielectric superlens

• Abstract

• Optics Express, Vol. 20, Issue 6, pp. 6412-6420 (March 2012)
• Ciaran P. Moore, Richard J. Blaikie

Defocus sensitivity optimization using the defocus Taylor expansion of the optical transfer function

• Abstract

• Applied Optics, Vol. 47, Issue 31, pp. 5893-5902 (November 2008)
• Shane Barwick

Fold-ray videometrics method for the deformation measurement of nonintervisible large structures

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4683-4687 (August 2009)
• Qifeng Yu, Guangwen Jiang, Sihua Fu, Zhichao Chao, Yang Shang, Xiangyi Sun

Analysis of normalized point source sensitivity as a performance metric for large telescopes

• Abstract

• Applied Optics, Vol. 48, Issue 31, pp. 5997-6007 (November 2009)
• Byoung-Joon Seo, Carl Nissly, George Angeli, Brent Ellerbroek, Jerry Nelson, Norbert Sigrist, Mitchell Troy

Study of a pose-relay videometric method using a parallel camera series

• Abstract

• Applied Optics, Vol. 49, Issue 28, pp. 5192-5198 (October 2010)
• Zhichao Chao, Qifeng Yu, Guangwen Jiang, Sihua Fu

Design strategies to simplify and miniaturize imaging systems

• Abstract

• Applied Optics, Vol. 50, Issue 6, pp. 943-951 (February 2011)
• Florence de la Barrière, Guillaume Druart, Nicolas Guérineau, Jean Taboury

Pattern-integrated interference lithography: single-exposure fabrication of photonic-crystal structures

• Abstract

• Applied Optics, Vol. 51, Issue 18, pp. 4028-4041 (June 2012)
• Guy M. Burrow, Matthieu C. R. Leibovici, Thomas K. Gaylord