Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry

• Abstract

• Optics Letters, Vol. 36, Issue 2, pp. 154-156 (January 2011)
• Zhongwei Li, Youfu Li

Experimental requirement of the error-compensating five-frame interferogram-collecting sequence used in phase-shifting interferometry

• Abstract

• Optics Letters, Vol. 36, Issue 2, pp. 214-216 (January 2011)
• N. Ansari, W. R. Ashurst

Simple calibration of a phase-based 3D imaging system based on uneven fringe projection

• Abstract

• Optics Letters, Vol. 36, Issue 5, pp. 627-629 (March 2011)
• Zonghua Zhang, Haiyan Ma, Sixiang Zhang, Tong Guo, Catherine E. Towers, David P. Towers

Simple, flexible calibration of phase calculation-based three-dimensional imaging system

• Abstract

• Optics Letters, Vol. 36, Issue 7, pp. 1257-1259 (April 2011)
• Zonghua Zhang, Haiyan Ma, Tong Guo, Sixiang Zhang, Jinping Chen

Recovering the absolute phase maps of two fringe patterns with selected frequencies

• Abstract

• Optics Letters, Vol. 36, Issue 13, pp. 2518-2520 (July 2011)
• Yi Ding, Jiangtao Xi, Yanguang Yu, Joe Chicharo

Wide measurement range scanning heterodyne interferometer utilizing astigmatic position sensing scheme

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3112-3114 (August 2011)
• Youngkyu Park, Kyoung-Eop Kim, Seong-Jin Kim, June-Gyu Park, Young-Hun Joo, Bu Hyun Shin, Seung-Yop Lee, Kyuman Cho

High-numerical-aperture microlens shape measurement with digital holographic microscopy

• Abstract

• Optics Letters, Vol. 36, Issue 22, pp. 4419-4421 (November 2011)
• Tomasz Kozacki, Michał Józwik, Kamil Liżewski

Time-of-flight method using multiple pulse train interference as a time recorder

• Abstract

• Optics Express, Vol. 19, Issue 6, pp. 4881-4889 (March 2011)
• Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

A multiple height-transfer interferometric technique

• Abstract

• Optics Express, Vol. 19, Issue 17, pp. 16365-16374 (August 2011)
• Hao Yu, Carl Aleksoff, Jun Ni

Method of surface topography retrieval by direct solution of sparse weighted seminormal equations

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1714-1726 (January 2012)
• Jeffrey Koskulics, Steven Englehardt, Steven Long, Yongxiang Hu, Knut Stamnes

Space position measurement using long-path heterodyne interferometer with optical frequency comb

• Abstract

• Optics Express, Vol. 20, Issue 3, pp. 2725-2732 (January 2012)
• Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

Universal calculation formula and calibration method in Fourier transform profilometry

• Abstract

• Applied Optics, Vol. 49, Issue 34, pp. 6563-6569 (December 2010)
• Yongfu Wen, Sikun Li, Haobo Cheng, Xianyu Su, Qican Zhang

Random errors in interferometry with the least-squares method

• Abstract

• Applied Optics, Vol. 50, Issue 3, pp. 246-252 (January 2011)
• Qi Wang

Research on coding and decoding method for digital levels

• Abstract

• Applied Optics, Vol. 50, Issue 3, pp. 356-359 (January 2011)
• Li-fen Tu, Si-dong Zhong

Depth fingerprint map of active range-gated imaging for real-time three-dimensional measurement of foreground objects

• Abstract

• Applied Optics, Vol. 50, Issue 18, pp. 2984-2989 (June 2011)
• Xinwei Wang, Yan Zhou, Jun He, Songtao Fan, Xin Zhang, Pingshun Lei, Yuliang Liu

Sensitivity enhancement of grating interferometer based two-dimensional sensor arrays using two-wavelength readout

• Abstract

• Applied Optics, Vol. 50, Issue 19, pp. 3289-3295 (July 2011)
• Onur Ferhanoglu, Hakan Urey

High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification technique

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 4011-4016 (July 2011)
• Wang-Tsung Wu, Hung-Chih Hsieh, Wei-Yao Chang, Yen-Liang Chen, Der-Chin Su

All-fiber interferometry: design and analysis

• Abstract

• Applied Optics, Vol. 50, Issue 22, pp. 4450-4456 (August 2011)
• Abhijit A. Kulkarni, Shanti Bhattacharya, Anil Prabhakar

Application of generalized grating imaging to pattern projection in three-dimensional profilometry

• Abstract

• Applied Optics, Vol. 50, Issue 26, pp. 5115-5121 (September 2011)
• Koichi Iwata, Yusuke Sando, Kazuo Satoh, Kousuke Moriwaki

Soft imprint lithography of a bulk chalcogenide glass

• Abstract

• Optical Materials Express, Vol. 1, Issue 5, pp. 796-802 (September 2011)
• Jiri Orava, Tomas Kohoutek, A. Lindsay Greer, Hiroshi Fudouzi