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Optics Express

Optics Express

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Instrumentation, measurement, and metrology : Phase measurement


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  • Optics Letters, Vol. 39, Issue 14, pp. 4080-4083 (July 2014)
  • Felix Rohde, Erik Benkler, Thomas Puppe, Reinhard Unterreitmayer, Armin Zach, Harald R. Telle

  • Optics Express, Vol. 22, Issue 10, pp. 11407-11416 (May 2014)
  • Yunfeng Guo, Jianpei Xia, Jianping Ding

  • Optics Express, Vol. 22, Issue 11, pp. 13472-13483 (June 2014)
  • José A. Rodrigo, Tatiana Alieva

  • Optics Express, Vol. 22, Issue 11, pp. 14031-14040 (June 2014)
  • Angela Dudley, Giovanni Milione, Robert R. Alfano, Andrew Forbes

  • Optics Express, Vol. 22, Issue 12, pp. 14712-14726 (June 2014)
  • Peter Schemmel, Giampaolo Pisano, Bruno Maffei

  • Optics Express, Vol. 22, Issue 12, pp. 14929-14943 (June 2014)
  • Vicente Mico, Carlos Ferreira, Zeev Zalevsky, Javier García

  • Optics Express, Vol. 22, Issue 13, pp. 15437-15446 (June 2014)
  • Cristoffer J. Blackhall, Kaye S. Morgan, Daniele Pelliccia

  • Optics Express, Vol. 22, Issue 13, pp. 15918-15923 (June 2014)
  • Razvan G. Ungureanu, Gabriel V. Cojocaru, Romeo A. Banici, Daniel Ursescu

  • Optics Express, Vol. 22, Issue 13, pp. 16087-16098 (June 2014)
  • Yu Takiguchi, Tomoko Otsu, Takashi Inoue, Haruyoshi Toyoda

  • Optics Express, Vol. 22, Issue 14, pp. 17172-17186 (July 2014)
  • Chao Zuo, Qian Chen, Lei Huang, Anand Asundi

  • Optics Express, Vol. 22, Issue 14, pp. 17430-17439 (July 2014)
  • Daesuk Kim, Yoonho Seo, Moonseob Jin, Yonghee Yoon, Won Chegal, Yong Jae Cho, Hyun Mo Cho, Dahi G. Abdelsalam, Robert Magnusson

  • Applied Optics, Vol. 53, Issue 16, pp. D29-D39 (June 2014)
  • Micah H. Jenkins, Joshua M. Long, Thomas K. Gaylord

  • Applied Optics, Vol. 53, Issue 19, pp. 4150-4157 (July 2014)
  • Rahul G. Waghmare, Deepak Mishra, G. R. K. Sai Subrahmanyam, Earu Banoth, Sai Siva Gorthi

  • Applied Optics, Vol. 53, Issue 19, pp. 4334-4342 (July 2014)
  • Peter J. de Groot

  • Applied Optics, Vol. 53, Issue 20, pp. 4565-4579 (July 2014)
  • Visa Korkiakoski, Christoph U. Keller, Niek Doelman, Matthew Kenworthy, Gilles Otten, Michel Verhaegen

  • Applied Optics, Vol. 53, Issue 21, pp. 4628-4636 (July 2014)
  • Leslie L. Deck

  • Journal of Optical Technology, Vol. 81, Issue 6, pp. 308-311 (June 2014)
  • Liang Lei, Anquan Sun, Wei Yuan, Jinyun Zhou, Bo Wang, Xiaobo Xing

  • Chinese Optics Letters, Vol. 12, Issue 6, pp. 060012- (June 2014)
  • Arun Anand, Bahram Javidi

  • Chinese Optics Letters, Vol. 12, Issue 7, pp. 071801- (July 2014)
  • Liang Xue, Shouyu Wang, Keding Yan, Nan Sun, Zhenhua Li, Fei Liu

  • Photonics Research, Vol. 2, Issue 3, pp. 87-91 (June 2014)
  • Juanjuan Zheng, Peng Gao, Baoli Yao, Tong Ye, Ming Lei, Junwei Min, Dan Dan, Yanlong Yang, Shaohui Yan
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