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Optics Express

Optics Express

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Instrumentation, measurement, and metrology : Phase measurement


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  • JOSA A, Vol. 32, Issue 3, pp. 491-496 (March 2015)
  • M. J. Collett, L. R. Watkins

  • Optics Express, Vol. 23, Issue 3, pp. 3327-3340 (February 2015)
  • Rosario Porras-Aguilar, Konstantinos Falaggis, Julio C. Ramirez-San-Juan, Ruben Ramos-Garcia

  • Optics Express, Vol. 23, Issue 4, pp. 4563-4572 (February 2015)
  • Benjamin Langdon, Jonathan Garlick, Xiaoming Ren, Derrek J. Wilson, Adam M. Summers, Stefan Zigo, Matthias F. Kling, Shuting Lei, Christopher G. Elles, Eric Wells, Erwin D. Poliakoff, Kevin D. Carnes, Vinod Kumarappan, Itzik Ben-Itzhak, Carlos A. Trallero-Herrero

  • Optics Express, Vol. 23, Issue 4, pp. 4672-4690 (February 2015)
  • Maciej Trusiak, Krzysztof Patorski

  • Optics Express, Vol. 23, Issue 5, pp. 6846-6857 (March 2015)
  • Yongkai Yin, Meng Wang, Bruce Z. Gao, Xiaoli Liu, Xiang Peng

  • Optics Express, Vol. 23, Issue 7, pp. 8235-8245 (April 2015)
  • K. L. Dooley, E. Schreiber, H. Vahlbruch, C. Affeldt, J. R. Leong, H. Wittel, H. Grote

  • Optics Express, Vol. 23, Issue 7, pp. 8507-8518 (April 2015)
  • E. W. Snedden, D. A. Walsh, S. P. Jamison

  • Optics Express, Vol. 23, Issue 7, pp. 8829-8836 (April 2015)
  • Jianye Zhao, Dawei Li, Bo Ning, Shuangyou Zhang, Wei Duan

  • Applied Optics, Vol. 54, Issue 7, pp. 1688-1695 (March 2015)
  • William Cruz-Santos, Lourdes López-García

  • Applied Optics, Vol. 54, Issue 7, pp. 1776-1781 (March 2015)
  • Hua Tao, Suhas P. Veetil, Jun Cheng, Xingchen Pan, Haiyan Wang, Cheng Liu, Jianqiang Zhu

  • Applied Optics, Vol. 54, Issue 8, pp. 1936-1944 (March 2015)
  • Daniel Claus, John Marius Rodenburg

  • Applied Optics, Vol. 54, Issue 8, pp. 2132-2140 (March 2015)
  • Arturo Bianchetti, Francisco E. Veiras, Pablo Etchepareborda, Ana Laura Vadnjal, Alejandro Federico, Guillermo H. Kaufmann

  • Applied Optics, Vol. 54, Issue 9, pp. 2283-2288 (March 2015)
  • Michał Józwik, Tomasz Kozacki, Kamil Liżewski, Julianna Kostencka

  • Applied Optics, Vol. 54, Issue 9, pp. 2326-2333 (March 2015)
  • F. E. Veiras, L. M. Riobó, C. L. Matteo, L. I. Perez, M. T. Garea

  • Applied Optics, Vol. 54, Issue 10, pp. 2870-2879 (April 2015)
  • J. Salinas-Luna, J. M. Nuñez-Alfonso, J. H. Castro-Chacón, A. Nava-Vega, A. Regalado-Méndez, E. Peralta-Reyes

  • Applied Optics, Vol. 54, Issue 10, pp. 2885-2890 (April 2015)
  • Ming-Hung Chiu, Wei-Chou Chen, Chen-Tai Tan

  • Applied Optics, Vol. 54, Issue 10, pp. 2939-2952 (April 2015)
  • S. Dehaeck, Y. Tsoumpas, P. Colinet

  • Applied Optics, Vol. 54, Issue 10, pp. 3018-3023 (April 2015)
  • César D. Perciante, Marija Strojnik, Gonzalo Paez, J. Matias Di Martino, Gastón A. Ayubi, Jorge L. Flores, José A. Ferrari

  • Optical Materials Express, Vol. 5, Issue 4, pp. 764-773 (April 2015)
  • Shih-Hsien Liu, Po-Jen Yang, Hong-Cheu Lin

  • Optica, Vol. 2, Issue 2, pp. 141-146 (February 2015)
  • Fred N. Baynes, Franklyn Quinlan, Tara M. Fortier, Qiugui Zhou, Andreas Beling, Joe C. Campbell, Scott A. Diddams
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