Accuracy enhancement of digital image correlation with B-spline interpolation

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3070-3072 (August 2011)
• Long Luu, Zhaoyang Wang, Minh Vo, Thang Hoang, Jun Ma

Phase extraction in speckle interferometry by a circle fitting procedure in the complex plane

• Abstract

• Optics Letters, Vol. 36, Issue 23, pp. 4617-4619 (December 2011)
• Sébastien Equis, Patrick Flandrin, Pierre Jacquot

Electronic speckle pattern interferometry using vortex beams

• Abstract

• Optics Letters, Vol. 36, Issue 23, pp. 4644-4646 (December 2011)
• René Restrepo, Néstor Uribe-Patarroyo, Tomás Belenguer

Path-independent phase unwrapping using phase gradient and total-variation (TV) denoising

• Abstract

• Optics Express, Vol. 20, Issue 13, pp. 14075-14089 (June 2012)
• Howard Y. H. Huang, L. Tian, Z. Zhang, Y. Liu, Z. Chen, G. Barbastathis

Multiwavelength digital holography with autocalibration of phase shifts and artificial wavelengths

• Abstract

• Applied Optics, Vol. 48, Issue 34, pp. H1-H8 (December 2009)
• Daniel Carl, Markus Fratz, Marcel Pfeifer, Dominik M. Giel, Heinrich Höfler

Measurement of three-dimensional deformations using digital holography with radial sensitivity

• Abstract

• Applied Optics, Vol. 49, Issue 20, pp. 4004-4009 (July 2010)
• Christian Kohler, Matias R. Viotti, G. Armando Albertazzi, Jr.

Microscope spectrometer for light scattering investigations

• Abstract

• Applied Optics, Vol. 49, Issue 22, pp. 4193-4201 (August 2010)
• Aude Barbara, Tomas Lopez-Rios, Sylvain Dumont, Frédéric Gay, Pascal Quémerais

Electronic speckle pattern interferometry and digital holographic interferometry with microbolometer arrays at 10.6 μm

• Abstract

• Applied Optics, Vol. 49, Issue 27, pp. 5067-5075 (September 2010)
• Jean-François Vandenrijt, Marc P. Georges

Time average vibration fringe analysis using Hilbert transformation

• Abstract

• Applied Optics, Vol. 49, Issue 30, pp. 5777-5786 (October 2010)
• Upputuri Paul Kumar, Nandigana Krishna Mohan, Mahendra Prasad Kothiyal

Real-time heterodyne speckle pattern interferometry using the correlation image sensor

• Abstract

• Applied Optics, Vol. 49, Issue 35, pp. 6808-6815 (December 2010)
• Akira Kimachi

Quantitative shearography: error reduction by using more than three measurement channels

• Abstract

• Applied Optics, Vol. 50, Issue 2, pp. 134-146 (January 2011)
• Tom O. H. Charrett, Daniel Francis, Ralph P. Tatam

Phase measurement in temporal speckle pattern interferometry signals presenting low-modulated regions by means of the bidimensional empirical mode decomposition

• Abstract

• Applied Optics, Vol. 50, Issue 5, pp. 641-647 (February 2011)
• María Belén Bernini, Alejandro Federico, Guillermo H. Kaufmann

Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain sensor with radial in-plane sensitivity: experimental comparison with electrical strain gauges

• Abstract

• Applied Optics, Vol. 50, Issue 7, pp. 1014-1022 (March 2011)
• Matias R. Viotti, Armando Albertazzi G., Jr., Walter A. Kapp

Two-dimensional quantification of the corrosion process in metal surfaces using digital speckle pattern interferometry

• Abstract

• Applied Optics, Vol. 50, Issue 10, pp. 1323-1328 (April 2011)
• N. Andrés, J. Lobera, M. P. Arroyo, L. A. Angurel

Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry

• Abstract

• Applied Optics, Vol. 51, Issue 8, pp. 1095-1100 (March 2012)
• Ju-Yi Lee, Ming-Pei Lu, Kun-Yi Lin, Szu-Han Huang

Calculation method for a quadrature phase-shifting interferometer and its applications

• Abstract

• Applied Optics, Vol. 52, Issue 1, pp. A433-A440 (January 2013)
• Suezou Nakadate, Shinya Sawada, Tomohiro Kiire, Masato Shibuya, Toyohiko Yatagai

Nondestructive testing by using long-wave infrared interferometric techniques with CO₂ lasers and microbolometer arrays

• Abstract

• Applied Optics, Vol. 52, Issue 1, pp. A56-A67 (January 2013)
• Igor Alexeenko, Jean-François Vandenrijt, Giancarlo Pedrini, Cédric Thizy, Birgit Vollheim, Wolfgang Osten, Marc P. Georges

Frequency-division multiplexing for multicomponent shearography

• Abstract

• Applied Optics, Vol. 52, Issue 3, pp. 350-358 (January 2013)
• Ian A. Bledowski, Thomas O. H. Charrett, Daniel Francis, Stephen W. James, Ralph P. Tatam

Discussion of sources of error in laser-speckle based systems

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 7, pp. 071203-071203 (July 2011)
• Bernhard G. Zogar

Compensation method for obtaining accurate, sub-micrometer displacement measurements of immersed specimens using electronic speckle interferometry

• Abstract

• Biomedical Optics Express, Vol. 3, Issue 3, pp. 407-417 (March 2012)
• Massimo A. Fazio, Luigi Bruno, Juan F. Reynaud, Andrea Poggialini, J. Crawford Downs