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Article Information

D. Y. Lei, S. Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier, and N. M. Alford, "Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films," Opt. Express 20, 4419-4427 (2012)

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