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Article Information

Frank Siewert, Jana Buchheim, S├ębastien Boutet, Garth J. Williams, Paul A. Montanez, Jacek Krzywinski, and Riccardo Signorato, "Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry," Opt. Express 20, 4525-4536 (2012)

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