Please let us know if you see any errors or problems with the display of the enhanced full-text HTML version of this article. This is a beta product, and we are continually working to improve the appearance and display of our full-text HTML. We also want to hear from you if you have any suggestions for enhancements and additional functionality.
J. M. Ramírez, Y. Berencén, F. Ferrarese Lupi, D. Navarro-Urrios, A. Anopchenko, A. Tengattini, N. Prtljaga, L. Pavesi, P. Rivallin, J. M. Fedeli, and B. Garrido, "Electrical pump & probe and injected carrier losses quantification in Er doped Si slot waveguides," Opt. Express 20, 28808-28818 (2012)