Feedback - Enhanced HTML (Beta)

Please let us know if you see any errors or problems with the display of the enhanced full-text HTML version of this article. This is a beta product, and we are continually working to improve the appearance and display of our full-text HTML. We also want to hear from you if you have any suggestions for enhancements and additional functionality.

Article Information

Florian Bayer, Simon Zabler, Christian Brendel, Georg Pelzer, Jens Rieger, André Ritter, Thomas Weber, Thilo Michel, and Gisela Anton, "Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures," Opt. Express 21, 19922-19933 (2013)

Technical Information

Your Name:
Your Email:
The email address you submit is confidential and will not be used by the Optical Society for any marketing purposes.
Please provide your
comments here:

Thank you for providing feedback on our enhanced HTML!