Please let us know if you see any errors or problems with the display of the enhanced full-text HTML version of this article. This is a beta product, and we are continually working to improve the appearance and display of our full-text HTML. We also want to hear from you if you have any suggestions for enhancements and additional functionality.
Nils Bornemann and Edgar Dörsam, "A flatbed scanner for large-area thickness determination of ultra-thin layers in printed electronics," Opt. Express 21, 21897-21911 (2013)