Feedback - Enhanced HTML (Beta)

Please let us know if you see any errors or problems with the display of the enhanced full-text HTML version of this article. This is a beta product, and we are continually working to improve the appearance and display of our full-text HTML. We also want to hear from you if you have any suggestions for enhancements and additional functionality.

Article Information

Wenwen Liu, Chaoyang Wei, Jianbo Wu, Zhenkun Yu, Hui Cui, Kui Yi, and Jianda Shao, "Investigations on single and multiple pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 1064 nm," Opt. Express 21, 22476-22487 (2013)

Technical Information

Your Name:
Your Email:
The email address you submit is confidential and will not be used by the Optical Society for any marketing purposes.
Please provide your
comments here:

Thank you for providing feedback on our enhanced HTML!