Editors and Staff

Optics Express, Vol. 18, Iss. 14 pp. 14311-15282

Editor-in-Chief
C. Martijn de Sterke    University of Sydney
 
Deputy Editors
Miguel Alonso    University of Rochester
John Dudley    Universite de Franche-Comte
F. Javier Garcia de Abajo    Instituto de Optica
Bernard Kippelen    Georgia Institute of Technology
Guifang Li    University of Central Florida
James Leger    University of Minnesota
Colin McKinstrie    Alcatel Lucent
Brian Orr    Macquarie University
 
Associate Editors
Nail N. Akhmediev    Australian National University
Jacques Albert    Carleton University
Victor Arrizon    Inst Nat Astrofisica Optica Electronica
Vasily N. Astratov    University of North Carolina at Charlotte
Konrad Banaszek    University of Warsaw
Julie L. Bentley    University of Rochester
Pierre Berini    University of Ottawa
Martin J. Booth    University of Oxford
Glenn Boreman    University of Central Florida
Alexandre Bouhelier    Universit de Bourgogne
Jim Burge    University of Arizona
David Burns    University of Strathclyde
Hamid Dehghani    University of Birmingham
Mark R. Dennis    University of Bristol
Gilles Dennler    Konarka Technologies
Christophe Dorrer    University of Rochester
Mark Dubinskii    US Army Research Laboratory
Andrew Ellis    University College Cork
Stefan Enoch    Centre National de la Recherche Scientifique
Xudong Fan    University of Michigan
Javier Garcia-Monreal    Universitat de Valencia
David Gerwe    Boeing Company
Philippe Goldner    Ecole Nationale Superieure de Chimie de Paris
Chunlei Guo    University of Rochester
Julio C. Gutirrez-Vega    Tecnologico de Monterrey
Ingmar Hartl    IMRA America Inc.
Seppo Honkanen    Helsinki University of Technology
Guillaume Huyet    Tyndall National Institute
Yoonchan Jeong    University of Southampton
Peter Uhd Jepsen    Technical University of Denmark
Norbert Kaiser    Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Jena
Inuk Kang    Bell Labs, Alcatel-Lucent
Magnus Karlsson    Chalmers University of Technology
Martti Kauranen    Tampere University of Technology
Sin-Doo Lee    Seoul National University
Yong-Hee Lee    Korea Advanced Institute of Science and Technology
Gerd Leuchs    University of Erlangen-Nurenberg
Hanli Liu    University of Texas in Arlington
Xiang Liu    Alcatel-Lucent
Hanne Ludvigsen    Helsinki University of Technology
Curtis Menyuk    University of Maryland, Baltimore County
Daniel M. Mittleman    Rice University
Niels Asger Mortensen    Technical University of Denmark
Paul E. Murphy    QED Technologies
Satoru Okamoto    Keio University
Takashige Omatsu    Chiba University
Namkyoo Park    Seoul National University
Stanley Pau    University of Arizona
Matthew A. Pelton    Argonne National Laboratory
Gabriel Popescu    University of Illinois at Urbana-Champaign
Alexander M. Popov    Moscow State University
Michelle Lynn Povinelli    University of Southern California
Philippe Rfrgier    Ecole Centrale de Marseille
Vitor Schneider    Corning, Inc.
Christian Seassal    Ecole Centrale de Lyon
Dmitry V. Skryabin    University of Bath
Adrian Stern    Ben Gurion University of the Negev
Thomas Sdmeyer    ETH Zurich
Paola Taroni    Politecnico di Milano
Thierry Taunay    OFS Laboratories
Limin Tong    Zhejiang University
Vasan Venugopalan    University of California, Irvine
Ping-kong Alexander Wai    The Hong Kong Polytechnic University
Roland Winston    University of California - Merced
Maciej Wojtkowski    Nicolaus Copernicus University
Yoshiaki Yasuno    University of Tsukuba
Anatoly Zayats    Queen's University of Belfast
Jie Zhang    Institute of Physics, Chinese Academy of Sciences
Xiang Zhou    AT&T Corporation
 
Advisory Editors
Charles Matson    Air Force Research Laboratory
Shu Namiki    Nat'l Inst. of Adv. Industrial Science & Technology
 
OSA Staff
Meghan Cook
Peer Review Coordinator
 
M. Scott Dineen
Deputy Senior Director, Publications
 
Bravetta Hassell
Peer Review Assistant
 
Sharon Jeffress
Managing Editor
 
Jennifer Mayfield
Electronic Publishing Director
 
Theresa Miller
Electronic Production Editor
 
Elizabeth Nolan
Chief Publishing Officer
 
Joseph Richardson
Peer Review Manager
 
Lynne Sturtz
Electronic Production Editor
 
Victoria Tesfamariam
Electronic Production Editor