Phase and frequency resolution of picosecond optical Kerr nonlinearities
Optics Letters, Vol. 16, Issue 24, pp. 1987-1989 (1991)
http://dx.doi.org/10.1364/OL.16.001987
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Abstract
We report on a method aimed at measuring both the real and imaginary parts of the third-order Kerr-type nonlinear-optical susceptibility of isotropic materials. It is based on Kerr ellipsometry in which analysis of the polarization state of transmitted light between a nearly crossed polarizer and an analyzer allows separation of pump-induced dichroism and birefringence. The method provides a natural measurement of nonlinear phase retardations in angle units, without any calibration procedure. By using a white-light continuum as a probe, this property is used to get a simultaneous measurement of the nonlinear dispersion in the whole visible spectrum. It is illustrated in tetramethylsilane, where stimulated Stokes and anti-Stokes Raman contributions to the nonlinearity are observed.
© 1991 Optical Society of America
Citation
Nicola Pfeffer, Fabrice Charra, and Jean Michel Nunzi, "Phase and frequency resolution of picosecond optical Kerr nonlinearities," Opt. Lett. 16, 1987-1989 (1991)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-16-24-1987
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