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Microscope imaging through highly scattering media

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Abstract

Microscopic images of a test chart hidden behind a slab of a highly scattering medium were significantly improved by incorporation of a spatial filter located at the back Fourier-transform plane of the objective lens of a microscope. The image quality was shown to be improved further by detection of only the early-arriving photons through time-resolved detection in combination with spatial filtering.

© 1994 Optical Society of America

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