Electronic speckle-shearing pattern interferometry is applied to yield whole-field phase maps corresponding to the curvature and twist distributions of a deformed specimen.
© 1996 Optical Society of America
Original Manuscript: December 11, 1995
Published: June 15, 1996
Pramod K. Rastogi, "Measurement of curvature and twist of a deformed object by electronic speckle-shearing pattern interferometry," Opt. Lett. 21, 905-907 (1996)