A soft-x-ray Mach–Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
© 1996 Optical Society of America
Original Manuscript: January 23, 1996
Published: July 1, 1996
Juan L. A. Chilla, Oscar E. Martinez, Mario C. Marconi, and Jorge J. Rocca, "Soft-x-ray interferometer for single-shot laser linewidth measurements," Opt. Lett. 21, 955-957 (1996)