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  • Vol. 21, Iss. 19 — Oct. 1, 1996
  • pp: 1529–1531

Waveguide study and refractive indices of GaN:Mg epitaxial film

H. Y. Zhang, X. H. He, Y. H. Shih, M. Schurman, Z. C. Feng, and R. A. Stall  »View Author Affiliations


Optics Letters, Vol. 21, Issue 19, pp. 1529-1531 (1996)
http://dx.doi.org/10.1364/OL.21.001529


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Abstract

Waveguide TE and TM modes in a GaN:Mg epitaxial crystalline film were studied in a wide spectral range (457.9–1053 nm). The refractive indices ne and no were accurately determined by TM and TE mode measurements at six different wavelengths (457.9, 514.5, 632.8, 724.3, 855.1, and 1053 nm). Dispersive curves of ne versus λ and no versus λ were obtained. It was found that bireferingence slightly increases (neno = 0.033–0.038) from 1053 to 457.9 nm.

© 1996 Optical Society of America

History
Original Manuscript: April 23, 1996
Published: October 1, 1996

Citation
H. Y. Zhang, M. Schurman, Z. C. Feng, X. H. He, Y. H. Shih, and R. A. Stall, "Waveguide study and refractive indices of GaN:Mg epitaxial film," Opt. Lett. 21, 1529-1531 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-19-1529


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