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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 21, Iss. 20 — Oct. 15, 1996
  • pp: 1682–1684

Ultrafast dark-field interferometric microscopic reflectometry

I. Zeylikovich and R. R. Alfano  »View Author Affiliations


Optics Letters, Vol. 21, Issue 20, pp. 1682-1684 (1996)
http://dx.doi.org/10.1364/OL.21.001682


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Abstract

A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <−50 dB, and a resolution of 15 μm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 μm.

© 1996 Optical Society of America

History
Original Manuscript: April 30, 1996
Published: October 15, 1996

Citation
I. Zeylikovich and R. R. Alfano, "Ultrafast dark-field interferometric microscopic reflectometry," Opt. Lett. 21, 1682-1684 (1996)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-21-20-1682

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