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Optics Letters

Optics Letters


  • Vol. 23, Iss. 1 — Jan. 1, 1998
  • pp: 67–69

Detection of freely propagating terahertz radiation by use of optical second-harmonic generation

Ajay Nahata and Tony F. Heinz  »View Author Affiliations

Optics Letters, Vol. 23, Issue 1, pp. 67-69 (1998)

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We report the application of electric-field-induced optical second-harmonic generation as a new technique for measuring the field of freely propagating terahertz radiation. Using silicon as the nonlinear medium, we demonstrate subpicosecond time resolution and a sampling signal that varies linearly with the terahertz electric field. This approach, which is attractive for centrosymmetric media, permits a significantly broadened class of materials to be exploited for free-space sampling measurements.

© 1998 Optical Society of America

OCIS Codes
(190.2620) Nonlinear optics : Harmonic generation and mixing
(240.4350) Optics at surfaces : Nonlinear optics at surfaces
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
(350.5610) Other areas of optics : Radiation

Ajay Nahata and Tony F. Heinz, "Detection of freely propagating terahertz radiation by use of optical second-harmonic generation," Opt. Lett. 23, 67-69 (1998)

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