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Optics Letters

Optics Letters


  • Vol. 23, Iss. 5 — Mar. 1, 1998
  • pp: 388–390

Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales

H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong  »View Author Affiliations

Optics Letters, Vol. 23, Issue 5, pp. 388-390 (1998)

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Three sorts of probe laser, which have pulse durations of 200 fs, 35 ps, and 70 ps, were employed in the measurement of the third-order nonlinear optical susceptibility x(3) in Au:SiO2 composite films in a degenerate four-wave mixing scheme. We found that the composite films at their absorption peak (~550 nm) had a maximum x(3) , which depends strongly on the pulse width of the probe laser. The value of x(3) measured with a 70-ps laser was ~30 times larger than that measured with a 200-fs laser. The time-resolved measurements revealed that the optical nonlinearity on the femtosecond time scale is attributable mainly to contributions from the interband electric–dipole transition (especially at low concentrations) and partly to those from hot electrons rather than being dominated by hot-electron excitation in the picosecond regime.

© 1998 Optical Society of America

OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(190.4380) Nonlinear optics : Nonlinear optics, four-wave mixing
(310.6860) Thin films : Thin films, optical properties
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.5390) Ultrafast optics : Picosecond phenomena
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong, "Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales," Opt. Lett. 23, 388-390 (1998)

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